Showing results: 76 - 90 of 117 items found.
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Teledyne e2v
Teledyne e2v offers high-performance, high-reliability semiconductor solutions, which address the critical functions of the complete signal chain. With a range of products and package solutions, we cater to civil aerospace, industrial, medical, military, scientific and space applications.Many of Teledyne e2v’s products are developed through strategic partnerships with companies such as NXP, Everspin, Micron and others. In addition, Teledyne e2v provides a range of specially qualified versions of many standardized products. We also develop customized solutions to meet specific qualifications or environmental requirements.
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Endeavour -
Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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The Specialty Lab, Inc.
Serving the Testing and Consulting needs for the Aerospace, Automotive, Bio-Medical, Military, Electrical and Electronics Product Industries since 1995 with technical excellence and exemplary customer service. Failure Analysis, Electronics Qualification, Screening, Environmental Test, Shock, Vibration, Package Test, and Transportation Simulation. Our customers come from a diverse group of manufacturers, from start-ups to Fortune 500 companies.
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Echo -
Acoustic Engineering
The Echo Speech Source Type 4720 is a small active loudspeaker box providing calibrated acoustic signals for speech intelligibility measurements using the Dirac room acoustics software. The Echo Speech Source is typically placed at a human speaker position. The received signal at the listener position is then picked up by a microphone and analyzed in Dirac to arrive at an accurate qualification of the speech intelligibility through parameters such as the Speech Transmission Index (STI). The Echo Speech Source operates from 4 AA batteries or an external mains power supply, and can be mounted on a standard tripod.
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Evans Analytical Group®
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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FS2352B -
FuturePlus Systems
The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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MASER Engineering B.V.
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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MEB -
The Eastern Specialty Company
Perform qualification, disconnect, communication, and advanced functional tests with TESCO’s new Meter Engineering Board. With basic metrology (0.1% accuracy) TESCO’s new MEB can also be used as a demand board or a time-run board, as part of meter certification, or to meet regulatory testing requirements. A new socket design provides automated operation to make loading easier. All new TESCO boards include our new electronically actuated sockets.
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Dayton T. Brown, Inc.
Dayton T. Brown, Inc. can help ensure that your payload is delivered accurately and reliably every time. Our team is responsible for first article, production lot, qualification, and associated testing and engineering support for mechanical and electrical armament and missile launching systems. DTB can help you develop a customized test plan that combines testing across many specifications – environmental, dynamics, EMI/EMC, structural, and non-destructive. Some of the standards that we follow include:
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DiCon Fiberoptics, Inc.
This latest technology platform presents the best value in terms of size, form factor, durability, and cost. The design of our MEMS optical switch centers on DiCon's proprietary dual-axes tilting MEMS mirror and is expandable up to a 1x36 switch configuration. Large fan-out 1xN optical switches and non-blocking fan-out/fan-in NxM matrix optical switches are built by cascading multiple of these 1xN switches. The MEMS 1xN fiber optic switch passes the stringent Telcordia GR-1221 qualification and is vastly deployed in today’s optical communication networks. With a lifetime of over a billion cycles, the durability of this MEMS device makes it a perfect choice for optical network monitoring applications that require frequent switching.
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Pulse Electronics
Round wire coil (RWC) inductors come in six platform sizes and enable the highest efficiency of any SMT inductor through the use of a low loss ferrite core material which minimizes AC losses and also eliminates thermal ageing. The use of round magnetic wire instead of rectangular flat coils enables a lower cost while still maintaining a low DCR and small footprint. The platforms have passed the AEC-Q200 stress test qualification proving the designs robustness and suitability to difficult environments but the parts are not IATF certified. The platform range from 7.6×7.4×6.4mm to 26x26x15mm and are suitable for a wide range of applications and markets including communications, computing and industrial.
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LPDDR5 -
FuturePlus Systems
Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 512M of captured States at up to 6400+ MT/sContinuous, real time analysis, not post-processing2D (voltage & time) Eye Detector guarantees valid data acquisition on each signalExtensive Triggering and Storage Qualification allows precise insightIndustry Leading Protocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specifications, NOT post processing. No other tool can provide this!Mode Register Listing provided
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ION Corporation
*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
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LXinstruments GmbH
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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SANBlaze Technology, Inc.
SANBlaze VirtuaLUN NVMe Initiator is the key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.
