STIL
IC digital vector test representation standard. Also known as: Standard Test Interface Language
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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File Import Tool For Importing And Converting STIL, WGL, VCD/EVCD Vectors
DIOEasy-FIT
Marvin Test Solutions' DIOEasy-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD files to a Marvin Test Solutions' digital instrument file format. DIOEasy-FIT works in conjunction with Marvin Test Solutions' DIOEasy waveform display and editor software which provides an efficient tool set for developing, debugging, and executing digital test vectors for all MTS dynamic digital instruments.
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Chromapoint Large Slope Angle Optical Heads
EVEREST
Sciences et Techniques Industrielles de la Lumière
Born from the last STIL innovation, EVEREST chromatic confocal sensor head contains the best of research and development in terms of sensors.EVEREST series offers an extended measurement range with the highest performances.
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VectorPro - Simulation Cyclizer for VCD to WGL/STIL
VectorPro
VectorPro is a low-cost, intuitive test development tool used to translate VCD/EVCD simulations into cyclized ATE Test Vectors in either WGL or STIL formats. This highly versatile tool reads in both VCD and EVCD formatted design simulations, and through the use of its flexible GUI, users are able to view and modify the simulation to fit the needs of their Test Environment.
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chromatic Confocal Sensor Heads
ENDO
Sciences et Techniques Industrielles de la Lumière
STIL introduces ENDO series, a new range of chromatic confocal sensor heads with an exceptionally small size.With a mechanical diameter from 4 to 8 millimeters and a straight or radial beam of 90°, ENDO series is ideal for non-contact measurement applications in reduced space environments.
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Measurement Systems
MicroMeasure3D
Sciences et Techniques Industrielles de la Lumière
STIL MicroMeasure3D, PORTICO3D and MAESTRO3D are measurement systems designed to achieve true 3D metrology of each point for the most demanding applications adapted to Industry 4.0 standards.
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ChromaPoint Detectors
E50
Sciences et Techniques Industrielles de la Lumière
E50 series is part of the STIL ChromaPoint detectors.All the optical fibers are passive components, graduated index silica fibers with a 50µm core, an E2000/APC connector for the connection with STIL controller and an FC/APC connector for the connection with STIL optical sensor head.
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Conversion Tools
Tester Data Link
VCD/eVCD to tester conversion (via STIL)WGL/TDL to tester conversion (via STIL)Most flexibility to handle complex devices functionality Support protocol definitionUtilize advanced tester features (Such as Xmode, concurrent test etc’… )High Performance Fast run time
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File Import Tool For Importing And Converting STIL, WGL, VCD/EVCD, ATP Vectors
GtDio6x-FIT
Marvin Test Solutions' GtDio6x-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD and ATP files to a Marvin Test Solutions' digital instrument file format. GtDio6x-FIT works in conjunction with Marvin Test Solutions' GtDio6x function library software which provides an efficient tool set for developing, debugging, and executing digital test vectors for MTS' GX5296 digital instrument.
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Chromatic Confocal Modular Sensor
CL-MG
Sciences et Techniques Industrielles de la Lumière
STIL chromatic confocal modular sensor head series represents the perfect balance between technology and precision.Industrial, compact and robust sensor heads, CL-MG models are available in a dozen of models, each one adaptable to specific environments (e.g. vacuum, heat, water, dust...).
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Direct conversion from cycle driven simulation data
Test program generator
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
