Direct conversion from cycle driven simulation data

Direct conversion from cycle driven simulation data

Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester.

TDL/WGL/STIL to tester conversion
Supports STIL ext 0,1,2 constructs
Easy to use and cost effective conversion solution
Optimize tester resources usage
Supports advanced tester features (Such as Xmode, Multi-port etc’)
Compress and minimize vectors count
Allow direct tester binary patterns creation

Get Help