Mixed-Signal Test
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed Signal Testers, MIxed Signal Test Systems
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Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Mixed-Signal Active Load Pull System
MT1000 And MT2000 Series
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The MT1000 and MT2000 mixed-signal active load pull systems are the best commercially proven solutions capable of performing load pull at high speeds of up to 1000 impedance/power states per minute with no limitation on Smith Chart coverage, under the following conditions:Single-tone CW and pulsed-CW RF signalDC and pulsed-DC biasTime-domain NVNA voltage and current waveforms and load linesFrequencies between 1 MHz and 40 GH
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Disk Drive Test System
Saturn
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The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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In-Circuit Testing and Test Engineering
Teradyne Z1890
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2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Testing
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Underwriters Laboratories Inc.
Our independent, rigorous testing process helps ensure that your products align with applicable requirements and expectations. We deliver innovative, customized options that aim to streamline testing processes, reduce costs and help speed products to market around the world. And our global team’s knowledge helps you stay ahead of the curve on evolving requirements, materials and technologies.
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Test Software
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With many years of experience solving real world applications, Circuit Check has acquired extensive software expertise. Our attention to code quality and optimization, as well as our internal code review process, ensures our customers receive efficient and readable code.
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Qualification Testing
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Qualification, functional, and operational testing are important steps in evaluating how well spacecraft, launch vehicles, and other mechanical/electrical systems perform under severe loading conditions that occur during launch and operation.
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Test SIP
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VoIP, Video, and IPTV products must withstand and continue to function when facing all the conditions that occur on the Internet. These include attacks from hackers exploiting vulnerabilities in security and protocols as well as the common phenomenon of congestion, delay, jitter, drops, and so on. VoIP, Video, and IPTV products must demonstrate robustness and resiliency in the face of unusual and/or illegal conditions.
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Conformance Tests
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According to german Duden conformance means ‘in agreement, accordant’ (from Late Latin conformitas – similarity). Any check on compliance of a test object with its specification can therefore be regarded as a conformance test. A conformance test has become established in the field of networked systems.
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Product
Loudspeaker Testing
TTC
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The weakest link in your measurement chain is your chamber, the new TTC chambers solve these problems...*Anechoic chambers have massive footprints:The TTC gives you equal or better results with a compact footprint*Achieving repeatable measurements is difficult in an anechoic chamber:The TTC guarantees the microphone and loudspeaker positions*Anechoic chamber accuracy suffers at low frequencies:The TTC is capable of measuring below 20 Hz*Results are not transferable between most test chambers:The TTC meets international standards IEC 60268-21:2018 & IEC 60268-22:2020*Most chambers are difficult to calibrate and awkward to use:The TTC is calibrated and is ready to interface to your microphone and analyzer
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Test System
Tessy
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TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
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Test Automation
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Test automation can be the solution to releasing new features and functionality with reduced time to market and uncompromising quality. There will, however, always be times when manual testing is the most appropriate approach.
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Test System
DA-1 ATS
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The DA-1 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Test Accessories
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For in-house designed ATE systemsFor any customer’s existing systemProviding complete electrically- and mechanically-designed units from the customer’s own specificationsUtilize our build-to-print services to duplicate your existing design
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Test Sets For Diagnostic Testing
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Test Sets For Diagnostic Testing are designed to test Oil Resistivity, Tan Delta, High Voltage Surge Comparison, etc. These test sets are automated instruments used to measure electrical features to insulate transformer oil, liquids and varied other insulating materials. They are ideal for revealing different localized problems and varied weak spots in the insulation. These modern testing sets are designed to provide high accuracy in results. In addition to this, they are easy to maintain testing sets available to ensure accurate readings.
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Test Receiver
NTR GNSS
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Our primary objective is to provide a high performance and fully flexible test receiver for all types of GNSS systems. Thus, the NTR fully supports all existing navigation systems. The signal processing is fully flexible. The high performance correlation engine with up to 80 channels is implemented in a powerful set of FPGAs. Signal acquisition and tracking are realized on a high performance embedded ARM Cortex A8.Supporting up to 4 L-band frequencies in parallel, the NTR GNSS test receiver supports all current GNSS transmission frequencies. Due to its plug-in design, the RF front-end can easily be customized for special filtering and other frequencies.
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In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Safety Testing
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Whitelegg has over 80 years of experience in the design manufacture of market-leading electrical safety test equipment. Our unrivalled range of electrical test equipment serves a wide variety of safety testing and precision measurement applications for use in a variety of industries including manufacturing, construction, education, utilities, aerospace, calibration and anywhere else where there is a requirement for electrical safety testing or precision resistance measurement.Test equipment is cost effective, helps you to minimise expense, improve efficiency and increase profit. Whether you need electrical test equipment, environmental test, power analysers or HV Test Equipment, we stock the products to meet your demands, all backed by our first-class technical support if you have any problems using the equipment.
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Microwave Testing
40A
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The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
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Memory Testing
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C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Packaging Test
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Underwriters Laboratories Inc.
UL offers ISTA packaging tests to assess the security of goods during transport, so retailers and manufacturers can feel confident that packaging is up to the job, thus reducing product loss and customer complaints.
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Test Adapter
RAMCHECK® SIMM
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The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
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Attribute Testing
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Critical attribute testing during manual or automated processing is essential to any manufacturing success. Tech Group has developed many testing solutions both standard and custom-made for mainly electronics and mechanical industry. Our modular designs give the advantage to offer short lead-time, cost efficient solutions according to your exact needs.
