Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Optical Loss Testing
Is to inject a known level of light in one end and measure the level of light at the other end, using an OLTS. The difference between source and receive power levels is the loss.
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Thermal Shock Testing
DATASYST Engineering & Testing Services, Inc.
Thermal shot testing is a accomplished through the use of two-zone temperature chambers where the unit under test is shuttled between chambers.
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HIRF Testing
High Intensity Radiated Fields (HIRF) testing simulates high RF peak pulsed and average fields typical of radar environments and is integral to the certification of flight essential avionics systems. L3 Cincinnati Electronics (L3 CE) can perform HIRF testing from 400 MHz to 18 GHz (with traditional average field testing from 10 kHz to 40 GHz).
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Software Test Tool
testIDEA
The basic premise behind the development of testIDEA was simple: if our development tools have access to the source code and binary code of an embedded application, and our debug hardware can access all of the internal workings of the microcontroller, surely we can simply test embedded software on the target microcontroller.
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Performance Testing
We do performance testing of applications across domains and technologies, including web-based n-tier applications, client-server applications, SOA based solutions or COTS solutions. We have experience with all industry-leading performance testing and monitoring tools, along with expertise in end-to-end application performance including network, database, hardware, etc. We publish a detailed performance testing report for the application with response times, break-point, peak load, memory leaks, resource utilization, uptime, etc. We provide clear and actionable application tuning recommendations and help you implement those working closely with various IT teams in your enterprise.
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32-CH 80 MB/s High-Speed Digital I/O Card
PCIe-7300A
ADLINK PCIe-7300A is an ultra-high-speed digital I/O card. It consists of 32 digital input/output channels. High performance designs and state-of-the-art technology make this card ideal for a wide range of applications, such as high-speed data transfer, digital pattern generation and digital pattern capture applications, and logic analyzer applications. Trigger signals are available to start the data acquisition of pattern generation.
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Electric Testing
Our Capabilities*Dielectric Withstand*Hi-Potential Testing*Voltage Drop*Contact Resistance*Gate Leakage*Insulation Integrity*Dielectric Integrity
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Remote Testing For Communities
imc WEBDEVICES
imc WEBDEVICES provides the means for remote-controlled, unmanned, fully-automatic monitoring, data acquisition and testing of technical systems over long distances, such as with vehicles, machinery, plants or structures.
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RF/Microwave Test Capability
Teledyne Labtech have extensive microwave alignment and microwave testing facilities. This includes the ability to test noise figure, S-parameters and harmonics. This ensures that Teledyne Labtech can supply a fully compliant product and provide a complete turnkey microwave assembly and test solution.
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3U VPX DSP Processor Card
VPX3-453
Curtiss-Wright Defense Solutions
Many FPGA processor modules require a separate processor card to control the FPGA module. The VPX3-453 module combines a Xilinx Virtex-6 FPGA and a PowerPC processor on a single module along with a flexible XMC site for bringing different types of IO directly into the FPGA. Therefore, in a single slot, a hybrid solution can be provided.
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PCI Precision Resistor Card 3-Channel, 3Ω To 5.82MΩ
50-297-152
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Electrical Testing
Innovative Testing Solutions, Inc.
Our specialty is Direct Current automotive components. We perform product validation and design verification testing on both electrical components and systems. Also, we perform warranty investigation testing and failure analysis. We have voltage capabilities to 300 volts and current capabilities to 1000 amperes. Both two-wire and four-wire resistance measurements are supported from NanoOhms to GigaOhms.
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Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Motorized Test Stands
Imada offers basic and advanced motorized test stands that are available in Standard, High, and Low speeds.Use ZTS or ZTA force gauges with MX, MX2 or EMX Series test stands to enable force control and non destructive testing.
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Rockwell Hardness Testing
Materials Evaluation and Engineering
Rockwell hardness testing is a general method for measuring the bulk hardness of metallic and polymer materials.
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VPX GPGPU Processor Card
VPX3-4924
Curtiss-Wright Defense Solutions
The rugged VPX3-4924 NVIDIA Tesla Pascal GPU processor board is designed and manufactured by Wolf Advanced Technology. This board is part of a family of GPGPU modules available from Curtiss-Wright Defense Solutions to enable development of High Performance Embedded Computing (HPEC) systems.
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MEDTEQ Testing Services
The MEDTEQ facility has a medium range of test equipment as detailed below for testing to various standards. MEDTEQ reports have the equivalent status of a manufacturer's report, which is acceptable under medical device regulations for many regions, such as US, Europe, Canada and Australia. The reports contain a cover page, general description, sample identification (including photos), clause list (core evaluation), and test data. Unlike CB scheme reports, the test data section is a self contained record for all items inspected, measured or tested, with full details such as test engineer, sample identification, testing dates, environment, test equipment and methods used. This detail provides confidence for regulatory auditors.
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PMC/XMC Expansion Card
EXP238
The EXP238 is a 6U VMEbus form factor expansion card offering three XMC/PMC expansion sites. When ordered as an option for the XVB603 VMEbus single board computer, the 3-slot solution greatly expands system flexibility.
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Bump Test Machine
Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
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Pressure Testing
All metal, plastic, and composite parts intended to contain liquids or gases under pressure are required to undergo stringent pressure testing procedures to meet qualification standards.
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Test & Measurement Cables
Our test & measurement cables provide customers with a competitive edge over ordinary cable designs by addressing three important criteria for testing electronic components and systems: phase stability, insertion loss stability and repeatable measurements for the cable’s useful life.
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BMS Test System
6020
High Extensibility: for multi-string battery cell, 4 cells per channel, expandable from 1 to 16 cells per strings
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Commodity Classification Testing
Underwriters Laboratories Inc.
As a global expert in fire safety science, UL provides an independent assessment of the fire risks associated with various types of stored commodities protected by sprinklers. As a part of commodity classification testing, UL examines many factors including sprinkler activation temperature, sprinkler response time index (RTI), the radial distance from the sprinkler to the center of the fire, the distance between the ceiling and the top of the commodity, and the number of storage tiers.
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VCORE Power Test
To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Qualification Testing
Teledyne Storm Microwave ensures your design specifications are met by conducting in-house testing at all production phases. This comprehensive qualification process guarantees high-quality performance and reliability in every cable assembly, meeting the stringent requirements of your application.
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Power Transformer Testing
Weshine Electric Manufacturing Co., Ltd
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime.
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Eight and Four Channel Quadrature Encoder Input Cards
mPCIe-QUAD
The mPCIe-QUAD-8 consists of a type F1 PCI Express Mini Card (mPCIe) interface board that connects to two DB-37F Modules via included 9” cables. The mPCIe-QUAD-4 consists of a type F1 PCI Express Mini Card (mPCIe) interface board that connects to one DB-37F Module via an included 9” cable. The modules are designed to be easily panel-mounted in any application environment, and have convenient mounting holes for non-panel-mount applications. Up to eight differential (or single-ended) encoders (each with A, B, and Index) can be monitored simultaneously.
