RF Probes
Coaxial Probes are said to offer repeatable performance up to 3 GHz in custom or standard configurations.
See Also: Test Probes
- Pickering Interfaces Inc.
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PXI/PXIe RF Switch, 8xSP4T + 4xSP4T, 1.3 GHz, 50 Ω, Multiway Connectors
42-755A-902
The 40-755A-902 (PXI) and 42-755A-902 (PXIe) are high density RF switch modules configured as 8xSP4T and 4xSPDT. The range of modules is available in 50 Ω and 75 Ω variants with mixed SP4T & SPDT switches in a single PXI module. They are available with two connector options; SMB that provides a frequency range of 1.8 GHz (50 Ω) / 1.3 GHz (75 Ω), or multiway which limits the bandwidth to 1.3 GHz but offers a high density solution occupying one PXI slot. The connectors used are fully supported by the range of Pickering Interfaces connection solutions.
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SMART III RF Probe
Finna Sensors’ Smart III RF Moisture Probe is appropriate in those situations where NIR use on conveying systems/web applications or RF flat plate sensor use on board type products are not sufficient. Examples include tanks, bins, barrels, drums, Super Sacks™, silos, etc. These applications require a probe type moisture meter where the probe is inserted into, and is surrounded by product. Since the probe generates a 3 inch diameter radio frequency field around the length of the probe, a signific...show more -
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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LISN & Voltage Probes
All commercial LISNs include an artificial hand connection and a transient limiter. This adds a 30dB insertion loss. A 30dB pre-amplifier is included which can be connected in the RF output feed to return the insertion loss to 0dB. The Voltage Probe requirement is covered by our PLIP (Power LIne Interference Probe). This fully meets the requirements of CISPR16, but has additional features:*Fully galvanic isolation between input and output (>1kV), for the safety of operator and analyser!*Shrouded safety clips for attachment to the line to be measured.*Filtered frequency response matched to Band A and B.*Current limiting on the output.*Visual indication of high voltage input.
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MultiStandard Advanced Monitoring Probe
EdgeProbe Advanced MultiStandard
The ideal tool for accurate & cost-effective monitoring probe for:DTV terrestrial transmission (DVB-T/T2, ISDB-T/Tb)DTV cable transmission (DVB-C/C2)DTV distribution over satellite (DVB-S/S2, T2-MI, OneBeam, MPTS)DTH uplink and reception (DVB-S/S2, MPTS)Digital Radio transmission (DAB/DAB+/T-DMB)Combine any two RF standards in one single 1RU device.Combined with a Network Monitoring System or not, the EdgeProbe Advanced provides a powerful broadcast network alert & diagnosis tool allowin...show more -
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Digital RF Power Monitor
3024
The COMM-connect 3024 RF Power Monitor from LBA Technology can control up to 8 external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. The Power conversion algorithms handles multi carrier, multi mode, peak, average and RMS signals. The power readout is auto scaled and VSWR can be calculated between any probes. Also the measured and calculated results along with alarms can be shown in the local LCD. The instrument has SNMP support t...show more -
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MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Microwave Probes
S-Probe
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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RF Volt Meters
The latest addition to Boonton’s popular 9200 series of RF voltmeters. It combines accuracy, smart probes, and operator features that have never before been available in its price range.
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Fixed Aperture RF Current Monitoring Probe
TBCP1-200
The TBCP1-200 is a fixed aperture RF current monitoring probe.The probe has a 3dB bandwidth of approximately 200 MHz. The aperture of the RF current monitoring probe is 25 mm. Its transfer impedance is > 14 dB Ohm in the range from 40 kHz to 200 MHz.
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MPI PCB Probe Systems
MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Active Differential Probe, 100 kHz to 7 GHz
U1818A
The Keysight U1818A 100 kHz to 7 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818A allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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Mini Probe Station
C-2
The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.
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Active Differential Probe, 100 kHz to 12 GHz
U1818B
The Keysight U1818B 100 kHz to 12 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818B allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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RF Power Generators
MKS RF Power Generators provide reliable solid state power for thin films processing equipment. They are vital components of semiconductor fabrication systems, which produce the integrated circuits (ICs) or chips required by modern computers and electronic equipment. MKS RF Generators, combined with our Impedance Matching Network and our V/I Probe form a complete RF Delivery System.
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Probe Cards
Ceramic Blades
SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
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Deep Access RF Probes
GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Current Probes
Com-Power's Current Injection Probes are used for RF conducted immunity testing per IEC 61000-4-6, CISPR 16-1-2, RTCA DO-160 and MIL-STD 461. Current injection Probes are to be used only when there is no commercially available CDN for the type of port(s) to be tested.
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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4-Channel Broadcast Monitor
The COMM-connect Entry Level Broadcast Power Monitor type 3025 can control two external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. Equipped with the RMS Probes the Power conversion algorithms handles multi carrier, multi mode signals. With the 3026 Diode base probe the power readout gives good repeatable results. The power readout is auto scaled and VSWR will be calculated between the two probes. The COMM-connect Entry Level Power Monitor gives a number of application to monitor and control the last part of your RF network installation from transmitters to the antenna.
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RF Test Probes
With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have t...show more -
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At fi...show more -
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Precision Picoprobe™ Micropositioner Probe Holder Kit
PHD-3001A
High Power Pulse Instruments GmbH
*Pulse force and pulse sense fixed pitch and flexible pitch RF probing solution for TLP/VF-TLP/HMM on-wafer measurements using Picoprobe™ Model 10*High peak current capability 80 A (100 ns)*DC – typ. 7 GHz bandwidth*Isolated probe-head ground shield for high pulse sense common mode signal rejection*Including fixed pitch replacement probe tip 50 Ω, right, 100 µm pad pitch*Including fixed pitch replacement probe tip 5 kΩ, left, 100 µm pad pitch*Including flexible pitch clamps plus 10-5k(0502)-125-W-1 and 10-50/30-125-W-1 replacement probe tips*True coaxial high-resolution 80:1 rotary probe-head for accurate probe tip adjustment
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Enhanced Probe Station
EB Series
Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.
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Compact Monitoring Probe
ISDB-T/Tb
Network operators:automate the tests of new transmittertemporary monitoring/investigation toolrebroadcasting receiver: RF to ASI or IPBroadcasters: off-air monitoring probe to validate the on-air contentTV/STB producers: automated tests against a professional receiverLabs: easy & simple access to live DTV sources via RF
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Probe Head
cViper
cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can mo...show more -
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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High-Frequency Probe, 300 kHz to 3 GHz
85024A
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
