Surge Test
-
Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
-
Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
-
Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
-
Product
Die Test Handler
3112
Test Handler
Chroma 3112 is a productive pick & place handler for high volume single- or multi-site bare die testing.
-
Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
-
Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
-
Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
-
Product
ESS Performance Test System
Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
-
Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
-
Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
-
Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
-
Product
SMD Test Fixture
16034G
Test Fixture
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
-
Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
-
Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
-
Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
-
Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
-
Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
-
Product
Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
Test Module
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
-
Product
PXI Integration Platform
ATS-3100
Test Platform
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
-
Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
-
Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
-
Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
Test Port Cable
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
-
Product
Safety Compliance Test System
EN 60601
Test System
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
-
Product
Digital Functional Test
CTS100i
Functional Test
Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
-
Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
-
Product
Liquid Test Fixture
16452A
Test Fixture
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
-
Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
-
Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
