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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Distribution Network Analysis
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Distribution system analysis and optimization tools used for network planning, simulation, and prediction of system response using schematic or geospatial views.
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Product
Stress Analysis Strain Gages
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Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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Product
Dynamic Imaging Particle Analysis Technology
FlowCam® Macro
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Yokogawa Fluid Imaging Technologies, Inc.
Based on proven FlowCam dynamic imaging particle analysis technology, and optimized for larger particles (50μm to 5mm), FlowCam Macro provides rapid particle characterization that goes beyond just particle size. Direct, image-based measurements of particle size and shape enable differentiation of particle types in a heterogeneous mixture.
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Product
Processing and Analysis Software
DATAVIEW
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The DataView® software is an essential tool for configuring and performing measurements, viewing data in real time, recovering recorded data and creating standard or customized measurement reports.
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Product
Measurement/Analysis Software O-Solution
DS-5000
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•Compare/ analyze the data with wide sampling frequency from 10 μHz to 100 GHz•Flexibly layout to compare the data in different formats or sampling frequency•Support various file formats including other company's loggers•Perform multiple data analysis (up to 1,000) simultaneously•Further analysis on specified area with the marker function
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Product
Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Product
Data Logger Configuration Tool With Integrated Data Analysis.
DiaLog
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DiaLog is an advanced Rebel Data Logger configuration tool with all the features you require to setup the Rebel family of data loggers. Acquire recorded data for analysis or export through the modern interface with built-in support for industry-standard files, integrated graphical data analysis and included batch processing for handling very large amounts of data files.
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Product
Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
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Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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Product
MultiGas™ TFS™ Gas Monitor For Multi-Compound Gas Analysis
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The MultiGas™ TFS™ Monitor is an online, multi-compound, trace gas monitoring system in a stand-alone 19-inch rack enclosure. It uses an innovative tunable filter spectroscopy technology enabling high selectivity and stability measurement. Low detection limit (sub-ppm levels for most gases) is achieved through the use of high throughput optics coupled with a long-path gas cell and a high sensitivity detector.
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Product
High Performance Polyphase Energy Metering AFE w/ Power Quality Analysis
ADE9000
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The ADE9000 is a highly accurate, fully integrated energy-metering device. Interfacing with both current transformer (CT) and Rogowski coil sensors, the ADE9000 enables users to develop a three-phase metrology platform, which achieves high performance for Class 1 through Class 0.2 meters. Power quality features enable advanced meter designs with fast rms measurements and power quality level monitoring for EN50160 compliance. The ADE9000 integrates seven high performances ADC’s, a flexible DSP core. An integrated high-end reference ensures low drift over temperature with a combined drift of less than ±25 ppm/°C max for the whole channel including PGA and ADC.
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Product
Multiphysics Computational Fluid Dynamics (CFD) Simulation & Analysis
STAR-CCM+
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Siemens Digital Industries Software
STAR-CCM+ is a stand-alone simulation solution for computational fluid dynamics (CFD), computational solid mechanics (CSM), heat transfer, particle dynamics, reacting flow, electrochemistry, electromagnetics, acoustics and rheology. STAR-CCM+ delivers accurate and efficient simulation technologies through a single integrated user interface and automated workflows. This facilitates the analysis and exploration of complex real-world problems.
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Product
Universal Analysis Tool
CANalyzer
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CANalyzer is the universal analysis tool for ECU networks and distributed systems. CANalyzer makes it easy to observe, analyze, and supplement data traffic in CAN, LIN, MOST, or FlexRay systems. With powerful functions and user-programmability, all needs are covered from simple network analysis to advanced troubleshooting of complex problems.
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Product
PCIE GEN5 Analysis System
KODIAK
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PCIe Analysis Platform with Embedded Hardware, Calibration-Free SI-Fi™ Probing and Automatic Equalization, Internal SSD Storage, Touchscreen LCD, and Standard PCIe Cabling.
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Product
Residual Gas Analysis
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Systems for the examination of components present in a vessel or evolved from a process.Measures the concentration of gases and vapours in real time.
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Product
The Leading Measurement System for the Analysis of Porous Materials
ELWIS
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ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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Product
Liquid Analysis
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Sensors for conductivity measurements and detection of air and gas bubbles.
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Product
Time Domain Analysis
S96010B
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The S96010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on the E5080B.
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Product
Complete Power Analysis System
PK3564-PRO+
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PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
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Product
Spectrum Analysis For E5081A Up To 44 GHz
S960907B
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The Keysight S960907B spectrum analyzer (SA) software application adds high-performance microwave spectrum analysis capabilities to the Keysight ENA-X up to 44 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Conduct simultaneous spectrum measurements using test and reference receivers. For efficient measurements of spurious signals emanating from mixers and frequency converters, combine the multi-channel SA with the internal swept-signal generators. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Image Analysis & Management System
IA44
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The IA44 Image Analysis/Management System easily transforms raw data into valuable information that can be communicated with professional results. The combination of powerful image management capabilities and point-and-click simplicity provides a comprehensive solution for users with various levels of expertise.
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Product
Stack Analysis Tool
GNATstack
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GNATstack is a software analysis tool that enables Ada/C/C++ software development teams to accurately predict the maximum size of the memory stack required to host an embedded software application. GNAT Pro add-on.
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Product
Phased Array Acquisition and Analysis Software
Prelude
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Prelude is a powerful and flexible software package. At TPAC, we understand our customers have a heavy investment in scanning equipment. With this in mind, we have developed a software suite that is adaptable and complimentary to your existing devices.
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Product
Data Acquistion & Analysis Software
NextView 4
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One software for everything. NextView®4 covers the entire world of PC measurement data acquisition: displaying live data, recording measured values, analyzing your measurement applications - and much more.
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Product
Analysis Software
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The Waveform Processing Software AS-70 reads data from WAVE files and offers a wide range of functions, including graph display, level processing, frequency analysis(FFT analysis and octave band analysis), file output, and playback.
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Product
Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Gas Analysis
HPR-20 TMS
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The Hiden HPR-20 TMS Transient MS is configured for fast event gas analysis of gases and vapours at pressures near atmosphere. Ideal for fast gas switching experiments the MS features the Hiden QIC quartz-lined 0.9 m sampling interface.
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Product
RF and Vector Signal Analysis Software
SignalVu-PC
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SignalVu-PC is the foundation of RF and vector signal analysis software that helps you easily validate RF designs. Whether your design validation needs include EMI/EMC pre-compliance testing, wideband radar, wireless LAN or frequency-hopping communications, the SignalVu-PC comprehensive suite of tools and application software can speed your time-to-insight by showing you the time-variant behavior of these signals.
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Product
Software For Data Analysis
Imc FAMOS
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Data source managementVisualization of measurement data at your fingertipsFull range of analysis functionsReport generation with direct PDF outputQuickly analyze large data sets with 64 bitMulti-layer macro creationProject managementLink data with dynamic maps or video
