PC Test
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
21.5" Fanless Panel PC With Intel® Celeron® J6412 Processor
PPC-321W EHL
Panel PC
Industrial-grade 21.5" Full HD TFT LCD with 50K backlight lifetimeDurable true-flat touchscreen with projected capacitive touch controlIntel® Celeron® J6412 quad-core, 2.0 GHz, processorUp to 32 GB DDR4 SDRAM1 x RS-232, 1 x RS-232/422/485, 2 x USB 2.0, and 2 x USB 3.1Compact, fanless design with solid aluminum alloy enclosure and IP66-rated front panelSupports E-key for wireless moduleSupports expansion via M.2 slotSupports Windows Embedded Linux and Android OS
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Safety Compliance Test System
EN 60601
Test System
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Industrial PC
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Get the dependability and precision you need for process control, data acquisition and more with Omron's advanced industrial PC offering.
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Product
PC Software
DawnEdit™
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DawnEdit™ is a database editor that customizes data acquisition for vehicles. DawnEdit determines the available parameters and builds a database for each vehicle model, so you only need to select the parameters of interest from a table. DawnEdit configures the DAWN Mini Loggers for OBD, J1939, and analog data.
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Product
PC Card
MAXPXIe 500
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The MAXPXIe 500 carrier board is a high performance, modular multi-protocol PXI-Express solution to your tests and simulation requirements, supporting one or two MAX Technologies mezzanine I/O modules. It is powered by a 800MHz RISC processor and 16MB of shared memory, permitting it to buffer and process communication with the host computer.
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
PC Oscilloscope
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PeakTech Prüf- und Messtechnik GmbH
This small and powerful PC oscilloscope is ideal for mobile use on laptops or permanent installation in control cabinets. To quickly display each incoming waveform, the scaling of the time base can be adjusted in a user-friendly manner. The data is transferred to the PC via an isolated LAN connection or the USB interface, whereby the device is supplied with the necessary voltage directly via USB.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
Intel Atom N3350 DC Barebone Embedded SBC Fanless Slim System
EPC-S201
Embedded PC
Intel® Atom N3350 Dual Core SoC.Semi-Industry Fanless slim systen, Din Rail or Wall mount design.VGA display, COM port, 2 USB3.0, 1 LAN at Front.1 DIO port, 1 COM port at Side.Supports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite.No RED certification.
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Product
PXI Integration Platform
ATS-3100
Test Platform
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Terminal Test Kit (19 PCS)
3604
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Peaceful Thriving Enterprise Co Ltd
1. Checks voltage on 6, 12 and 24V systems.2. 12-feet flexible rubber wire with spring relief.3. Tough plastics handle lights up if circuit is good.4. 4mm connection for banana plugs.5. Facilities the measurement on connectors and components without destroying the insulation or the plug connection.
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Product
PC Based Comprehensive Test Setup for Luminaires
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Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Rugged PC Compatible
SYS-ITX-N-6425E
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WINSYSTEMS’ SYS-ITX-N-6425E is an industrial embedded computer based on the Intel® Atom™ x6425E Elkhart Lake processor family. It uses less than 12 watts for fanless applications and performs reliably in industrial operating temperatures ranging from -20º to +60ºC. The unit includes a SODIMM socket supporting up to 32 GB of DDR4 system memory and internal mounting support for one 2.5” SATA HDD/SSD. Additional storage is available through MiniPCIe, mSATA, and microSD.
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Product
PC Analysis Software
TekScope
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Get the analysis capability of an award-winning oscilloscope on your PC. Analyze waveforms anywhere, anytime. The basic license lets you view and analyze waveforms, perform many types of measurements and decode the most common serial buses - all while remotely accessing your oscilloscope. Advanced license options add capabilities such as multi-scope analysis, more serial bus decoding options, jitter analysis and power measurements.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
Test Port Adapter
The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
