X-ray Inspection Systems
See Also: Inspection Systems, Automated Fiber Optical inspection Systems
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Power System Simulator
F6150e
This power system simulator performs the simplest through the most complex tests. Meeting all your protective relay testing needs, the F6150e is available in different configurations.
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Gas-insulated AC Test System
Yangzhou Power Electric Co., Ltd
The test system is used to do AC voltage withstand test and PD measurement for high voltage insulation products, combined electrical equipment, instrument transformers, etc.
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Telemetry Systems
For Automotive, Aerospace, Marine, Motor & Generator Health, Energy, Power Plant, and Industrial Applications.
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Portable Calibration System
HD9120
HD9120 is an acoustic calibrator that, in accordance with the Circular Prot. RU 34143 of 02 December 2011, allows qualified technicians to perform calibrations of sound level meters for comparison with a reference sound level meter.
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Advanced Metrology System
NGS 3500L
This top performance system is designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. It is well suited for use as a dedicated production tool or as a versatile processdevelopment system. It features a powerful set of automated as well as semi-automatic optical/ video tools optimized for high accuracy, production throughput, and ease of use.
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X-Ray Detectors
With the need to always reduce the inspection time to the strict minimum, the NDT world is slowly reducing its dependency on films and jumping straight into the Digital Radiography (DR) revolution. While saving tremendous amount of time and money not developing films, digital radiography also enables you to edit, record and send your inspections to whomever, whenever and wherever you want.
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S-Parameter Measurement System
DPS08
KEYCOM provides S-parameter method measurement systems in two modes, the reflection mode and the transmission mode, to address the individual purposes. Both modes measure the complex permittivity (εr) and complex permeability (μr) at the same time, and the proper usage is as follows.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Automated Handling System
AHS Series
A provider of automation solutions, as well as specialized material handling equipment such as enclosed conveyor systems.
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Pressure Comparator (System F)
Type T
AMETEK Sensors, Test & Calibration
Type T hydraulic comparator (System F) is a self-contained high volume pressure source capable of producing pressure up to 15 000 psi. It is ideal for testing gauges and setting hydraulic relief valves and pressure switches. Multiple models are available for hydraulic oil, water, or both.
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Edge AI Inference Systems
Powered by NVIDIA Jetson family and RTX, AIR series provides scalable AI inference performance or efficient retraining on a large scale at the edge.
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Satellite Trunk Interception System
Satellite trunks in the X, C, Ka, Ku bands carry enormous information, the interception of which can assist LEAs with real-time analysis of data transmitted over these links. Our solutions are customizable and scalable (Bands and protocols) based on the customer's needs.
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Glare Measurement System
GMS-1000
Hangzhou Hopoo Optoelectronics Technology Co., Ltd
Glare is one of the main factors affecting the health of the light environment. At present, there are many different models for glare evaluation, and different evaluation models are used according to the specific lighting application environment. According to the glare evaluation model, glare evaluation needs to be based on a number of key physical parameters. In actual field measurement and analysis, due to the influence of many factors such as the environment, there are higher requirements for the performance of measuring instruments.
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Positioning Systems
Whether high-precision, particularly robust or cost-efficient: the requirements for positioning systems are varied. In order to fulfill these perfectly, Pepperl+Fuchs offers various solutions and combines the advantages of optical , camera-based and inductive positioning systems in one portfolio.
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Wafer and Cells PL System
HS-PL
Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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Avionics System Power
58WS1-03
- 3Ø AC input per MIL-STD-704A- 1,500 Watts continuous, 3,000 Watts peak power- Environmentally sealed ATR style case- Continuous Background Built-In-Test (BIT) and ETI- EMI compliance
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Sola-Check System
Flexible and technically superior solution for measuring UV lamps output with spectroradiometer readings. The Sola Scope accurately measures UV light in the range 240nm to 470nm with clear data on both the intensity and wavelength of the UV source. It can be used as a single key operation radiometer or as a high-powered analysis tool supporting graphical analysis.
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Transducer Test System
TTS-030
For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Small Drop Test System
KRD41 series
KRD41 series small drop tester is suitable for free-fall test of small consumer electronics and components such as mobile phones, walkie-talkies, electronic dictionaries, CD / MD / MP3 and so on, applicable standards JISC 0044 and IEC 60068-2-32. Through standard tests on electronic products (surface drop, corner drop, edge drop, etc.) and collecting data, it simulates the vertical drop impact of electronic products during transportation and handling. It provides a basis for the design of the product's buffer and vibration damping and the selection of structural materials.
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Modular Test System
DMT
The DMT Tester is a modular test system that allows rapid measurement of electrical and non-electrical parameters of functional units. The system also allows basic ICT measurement with optional accessories. It is conceived as modular, with the possibility of integrating a wide range of own and external instruments. The DMT tester is controlled by its own SCADUS software.
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Development System
FE-W7
* Emulates Winbond W77xxx or W78xxx Microcontrollers * 125K Code Memory * Real-Time Emulation * Frequency up to fmax at 1.8V to 5.5V * Wide Supply Voltage Support * MS-Windows Debugger For C And Assembler * Emulation Headers for PLCC, QFP and DIP * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Dilution-Extractive System
ML675
The Teledyne ML®675 dilution-extractive system can be used in 40CFR75, 40CFR60, 40CFR63, and process control applications. In this system, sample is prepared for analysis by diluting stack gas with clean, dry instrument air at the probe location. Since no moisture is removed with dilution, measurements for SO2, NOx, CO, THC and CO2 are made on a wet basis.
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Portable Emissions Measurement Systems
PEMS
SEMTECH® ECOSTAR Plus is a modular suite of ruggedized measurement systems built for the extremes of heavy-duty testing. The system consists of individual, self-contained modules, each with a specific functionality, designed to measure the full range of gaseous and particulate emissions.
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High Voltage System
HV-2
International Electro-Magnetics, Inc.
*Tests Power Transformers for Continuity, Ratio and Phase. Applied and Induced Potential and No-load Losses.*14 Conductor Switching Matrix will test 7 individual windings, 13 taps of one common winding or some combination thereof. (10 Amp current limit)*The System Control is Windows/Visual Basic based. Menu screens allow full selection of test parameters and sequence. Low voltage tests can be performed first, allowing defective parts to be rejected without proceeding to time consuming induced Potential dwell routines. Test data labeling and data acquisition software can be easily added to the system.
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Thermal Chuck Systems
A-Series
Advanced Temperature Test Systems GmbH
The A-Series represents a productline of air cooled thermal chuck systems for a temperature range between -30C up to +400C. The basic product offers an active cooled chuck system without an external chiller for a temperature range between +25C up to +200C at a very competitive price to common Hot Chucks.
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(25kN/100Nm) Axial-Torsion Systems
8874
The 8874 is a bi-axial tabletop servohydraulic testing system providing a combined axial and torsion dynamic actuator in the upper crosshead. With a precision aligned twin-column frame and a lower t-slot table, the 8874 meets the challenging demands of a varied range of both static and dynamic testing requirements.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.





























