Current Transformer Test Set
See Also: Transformer Test, Transformer Testers, Current Transformer Test
-
Product
Godzilla High Current Probe, 100 Amp
HC375
-
Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99
-
Product
In-Circuit Test System Rentals
-
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
-
Product
Test Fixture, Axial And Radial
16047A
-
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
-
Product
VLSI Test System
3380P
-
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
Product
In-Line RF Test Station
AP770
-
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
-
Product
Universal Function Test System for Industrial Electronics
-
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
-
Product
Memory Test Systems
T5503HS2
-
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
-
Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
-
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
-
Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
-
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
-
Product
SSD Test Systems
MPT3000ES / MPT3000ES2
-
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
-
Product
NI-9203, 200 kS/s, ±20 mA, 8-Channel C Series Current Input Module
779516-01
-
200 kS/s, ±20 mA, 8-Channel C Series Current Input Module - The NI‑9203 is intended for high-performance control and monitoring applications. It features programmable input ranges and variable connectivity options. To protect against signal transients, the NI‑9203 includes a channel‑to‑earth ground double‑isolation barrier (250 Vrms isolation) for safety and noise immunity.
-
Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
-
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
-
Product
NI-9207, 500 S/s, 16-Channel C Series Voltage and Current Input Module
781068-02
-
500 S/s, 16-Channel C Series Voltage and Current Input Module - The NI‑9207 is a combination voltage and current input module designed with industrial systems in mind. It features eight current and eight voltage input channels, with built-in noise rejection.
-
Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
-
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
-
Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
-
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
-
Product
Functional Test Fixtures
-
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
-
Product
Test System
BMS HIL
-
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
-
Product
Scienlab Battery Test System - Cell Level
SL1007A
-
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
-
Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
-
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
-
Product
Terotest iTest
iTest
-
iTest is primarily a Functional Test platform which is easily configured to test PCB's, complete assemblies or individual devices. In addition, iTest's MDA capability offers the user the opportunity to perform low cost In- Circuit (MDA) testing as well as Combinational testing. Easy integration of 3U & 6U PXI modules, LXI, USB, GPIB and more.
-
Product
Standard- 27.20 (771.00) - 64.00 (1814.00) Godzilla High Current Probe
HC375F-4
-
Current Rating (Amps): 100Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 360Full Travel (mm): 9.14Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,110Overall Length (mm): 78.99
-
Product
Compact EMS/EMI Test Platform
CEMS100
-
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
-
Product
Conformance Test System
TS-RRM
-
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
-
Product
Bottom Electrode SMD Test Fixture
16198A
-
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
-
Product
Test Management Software
ActivATE™
-
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
-
Product
Positioning Test System
TS-LBS
-
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
-
Product
Test Handler
M4872
-
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
-
Product
Massively Parallel Parametric Test System
P9001A
-
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
-
Product
SoC Test Systems
-
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
Product
Test Platforms
-
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
