Sensor Test
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Product
10 MHz to 40 GHz USB Wide Dynamic Range Peak and Average Power Sensor
U2064XA
Power Sensor
The Keysight U2064XA is a fast, accurate and wide dynamic range 10 MHz – 40 GHz USB peak and average power sensor.
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Product
USB Power Sensor, 50 MHz to 24 GHz
U2002H
Power Sensor
Measure average power over the frequency range 50 MHz to 24 GHz and power range -50 dBm to +30 dBm.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
PXIe Optical Test Modules
Test Module
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
10 MHz To 54 GHz LAN Thermal Vacuum Compliance Power Sensor
L2066XT
Power Sensor
Accurately measure any modulated signal with the Keysight Technologies, Inc. U/L2050/60 X-Series wide dynamic range power sensors. The USB/LAN connectivity models come with a wide dynamic range, covering -70 to +26 dBm. This sensor offers very accurate and repeatable power measurements for any modulated signal and comes with a super-fast measurement speed of 50,000 readings/sec, which enables higher manufacturing throughput. Users can also save time and reduce measurement uncertainty with the internal zero and calibration function. The U/L2050/60 X-Series is supported by the Keysight BenchVue software. BenchVue makes it easy to control your power meter to log data and visualize measurements in a wide array of display options without any programming. Simply connect the sensor to your PC installed BenchVue BV0007B Power Meter/Sensor Control and Analysis app to perform average power measurement and analysis.
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Product
10 MHz To 67 GHz LAN Wide Dynamic Range Average Power Sensor
L2057XA
Power Sensor
Accurately measure any modulated signal with the Keysight Technologies, Inc. U/L2050/60 X-Series wide dynamic range power sensors. The USB/LAN connectivity models come with a wide dynamic range, covering -70 to +26 dBm. This sensor offers very accurate and repeatable power measurements for any modulated signal and comes with a super-fast measurement speed of 50,000 readings/sec, which enables higher manufacturing throughput. Users can also save time and reduce measurement uncertainty with the internal zero and calibration function. The U/L2050/60 X-Series is supported by the Keysight BenchVue software. BenchVue makes it easy to control your power meter to log data and visualize measurements in a wide array of display options without any programming. Simply connect the sensor to your PC installed BenchVue BV0007B Power Meter/Sensor Control and Analysis app to perform average power measurement and analysis.
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
E-Series Average Power Sensor
E9301A
Power Sensor
Measure the average power of all modulation formats Wide dynamic range (-60 dBm to +20 dBm) and frequency range 10 MHz to 6 GHzHigh maximum power specification Low SWR for reducing mismatch uncertainty Calibration factors linearity and temperative compensation data stored in EEPROM Fast measurement speeds (up to 400 readings per second with the Keysight E4416A)Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Air Sensor
E1738A
Environmental Sensor
The Keysight E1738A environmental sensor measures air pressure, temperature and humidity. The sensor detects and automatically compensates for operating environment changes when used with the 5530 Laser Calibration System. The result is improved overall system accuracy.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Wideband Power Sensor, 50 MHz To 18 GHz
N1923A
Power Sensor
The Keysight N1923A peak power sensor provides peak, peak-to-average ratio, average power, rise time, fall time, maximum power, minimum power and statistical data of peak signals.
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Product
DC/10 MHz – 18 GHz USB Thermocouple Power Sensor
U8481A
Power Sensor
The U8480 series is the fastest USB thermocouple sensor in the world without compromising the best in class linearity of the legacy 8480/N8480 series thermocouple sensors, all in a compact USB based form factor
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Test Fixture
Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
T-Type Thermocouple, 32°F to 500°F Temperature Sensor
745690-T002
Temperature Sensor
T-Type Thermocouple, 32°F to 500°F Temperature Sensor - The T-Type Thermocouple works with NI measurement devices and software to help you acquire temperature data within a measurement system. You can use LabVIEW or FlexLogger software and NI-DAQmx driver software to configure … measurements and predefined scaling coefficients for the T-Type Thermocouple and acquire synchronized temperature data in units of degrees. The T-Type Thermocouple is available in various lengths and configurations including field-cuttable, ready-made sensors, and thermocouple wire extensions with a -20°F to 221°F temperature range.
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Product
Automated Test Systems
Test System
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
6U VME COTS System, Sensor Interface Unit
SIU6
Sensor Interface Unit
NAI's SIU6 is a highly configurable rugged COTS system or subsystem ideally suited for military, industrial, and commercial applications that require high-density I/O, communication, Ethernet switching, and processing. The SIU6 leverages NAI field-proven, 6U VME boards to deliver off-the-shelf, SWaP-optimized COTS solutions that "Accelerate Your-Time-to-Mission."
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
Waveguide Power Sensor
Q8486D
Power Sensor
Excellent SWR for reducing mismatch uncertainty50 MHz calibration port Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 33 GHz to 50 GHz Diode power sensing element
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
P-Series Wideband Power Sensor, 50 MHz to 40 GHz
N1922A
Power Sensor
Peak, peak-to-average ratio, average power, rise time, fall time, maximum power, minimum power, and statistical data of wideband signals.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
