Capacitor Test
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Product
Electrolytic Capacitor Test & Scanning System
DU-9001
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Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Product
Capacitor Test
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Delta United Instrument Co., Ltd.
Specialized, high-efficiency automatic testing systems for electrolytic capacitors.
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Product
DC Hipot Testers
DPW Series
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UDEYRAJ ELECTRICALS PRIVATE LIMITED
These portable testers have been designed to be used in testing high voltage equipment in power engineering. Routine testing of the insulation and leakage is a necessary requirement for surge arresters, cable breakdown testing, capacitor charging and other laboratory use.
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Product
Rail Traction Inverter Test System
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The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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Product
Insulation Resistance Meter
SME1202
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Scientific Mes-Technik Private Ltd
General purpose insulation resistance meterAnalog indicator, High measurement speedTest voltage range: 10 V to 1000 VSuitable for Testing capacitor insulation testEasy operation
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Product
Cable Tracer and Phone Tester (2 in 1)
183 CB
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Standard Electric Works Co., Ltd
Cable Tracer: Trace wires or cables. Volume control. Tip & Ring identification. 2 bi-colored LEDs ( Line 1 & Line 2). Tone speed selection : Fast & Slow. A phone jack is designed for headset or handset. (Amplifier probe)Phone Tester: Continuity and resistance testing for voltage-free objects. Check direct and alternating voltages. Testing capacitors. Testing diodes. Power ON/OFF switch. The indication of the LED lamp and the sound of the buzzer can occur at the same time. The LED indication for Power ON status.
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Product
Capacitance Meter
E4981A
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The E4981A capacitance meter offers a high-speed with reliable measurements for ceramic capacitor testing in the production lines. The E4981A realizes the measurement capabilities of capacitance from small to large values with accurate measurements. The E4981A capacitance meter contributes improvements of the test throughput, while attaining excellent component quality for ceramic capacitor testing.
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Product
High Voltage DC Lab Power Supplies 300V-5000V Output for Research Labs / Capacitor Testing – 300, 600, 1000, 3000, 5000V
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- 19” Rack Adaptable- Laboratory Bench Unit- Digital Output Metering- Constant Voltage Current Limit Type Character- Micro Switch Provided for Protection against Shock- 3U High (133 mm)- Power Saving Thyristor Preregulator Technique
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Product
DC Hipot Testers
DPC series
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UDEYRAJ ELECTRICALS PRIVATE LIMITED
DPC series hipots are used for proof testing of high voltage equipment in power engineering. Routine testing of the insulation and leakage is a necessary requirement for electrical equipments. Other areas include: Cable breakdown testing, capacitor charging and general laboratory use.
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Product
Insulation Resistance Meters
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Scientific Mes-Technik Private Ltd
General purpose insulation resistance meterAnalog indicator, High measurement speedTest voltage range: 10 V to 500 VSuitable for Test capacitor insulation testEasy operation
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Product
Air Core Test Lab Reactors
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Test Laboratory Reactors are designed for high voltage and high power test laboratories. They are designed to withstand the most extreme electrical service conditions during test periods. Design techniques are implemented in accordance with the most demanding service conditions. These reactors are used for various purposes in test laboratories such as current limiting and synthetic testing of circuit breakers, capacitor testing, artificial line simulation etc.
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Product
Capacitance Meter, 120 Hz / 1 KHz / 1 MHz
E4981B
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The E4981B capacitance meter offers a high speed with reliable measurements for ceramic capacitor testing in the production lines
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Product
Digital Insulation Mult-Meter
8010 IN
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Standard Electric Works Co., Ltd
● Microprocessor controlled.● Four insulation test voltages (DC) : 125V, 250V, 500V, 1000V● The maximum insulation measurement range is 200G ohm @1000V.● 1mA test current on insulation test at nominal voltage.● With a hand strap for easier holding.● Large LCD (78 × 67mm)● Auto-ranging.● Bar-graph indication.● Backlight function.● REL(Auto-null) function.● Auto AC/DC voltmeter.● Capacitor test.● Auto-test stop & smart hold.● Supplied with high quality test leads.● Safety standard : EN 61010-1 CAT III 600V IEC 61557-1 IEC 61557-2 EN 61326-1
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Product
Transformer/Capacitor Test Sets
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*Quick and easy check for opens or shorts on transformers or capacitors before energizing*Provides clear indications of open circuits, short connections and confirmation that the test results are OK*Tests overhead, pad-mount and other distribution transformers as well as capacitors and capacitor banks*Tests the primary and secondary sides of de-energized transformers and capacitors without disconnecting*Helps prevent line workers from installing a fuse on a shorted transformer or capacitor*Automatic self-test featureMagnet holds the tester in place while testing
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Product
Capacitor Leakage Current/IR Meter
Chroma 11200
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Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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Product
Digital Insulation Mult-Meter
8005 IN
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Standard Electric Works Co., Ltd
● Microprocessor controlled.● Four insulation test voltages (DC) : 50V, 100V, 250V, 500V● The maximum insulation measurement range is 200G ohm @500V.● Large LCD (78 × 67mm)● Auto-ranging.● Bar-graph indication.● Backlight function.● REL(Auto-null) function.● Auto AC/DC voltmeter.● Capacitor test.● Auto-test stop & smart hold.● Supplied with high quality test leads.● Safety standard : EN 61010-1 CAT III
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
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The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Seno-Con Test System
PANTHER 2K QST
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Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
