Capacitor Test
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Product
Transformer/Capacitor Test Sets
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*Quick and easy check for opens or shorts on transformers or capacitors before energizing*Provides clear indications of open circuits, short connections and confirmation that the test results are OK*Tests overhead, pad-mount and other distribution transformers as well as capacitors and capacitor banks*Tests the primary and secondary sides of de-energized transformers and capacitors without disconnecting*Helps prevent line workers from installing a fuse on a shorted transformer or capacitor*Automatic self-test featureMagnet holds the tester in place while testing
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Product
Air Core Test Lab Reactors
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Test Laboratory Reactors are designed for high voltage and high power test laboratories. They are designed to withstand the most extreme electrical service conditions during test periods. Design techniques are implemented in accordance with the most demanding service conditions. These reactors are used for various purposes in test laboratories such as current limiting and synthetic testing of circuit breakers, capacitor testing, artificial line simulation etc.
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Product
Insulation Resistance Meters
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Scientific Mes-Technik Private Ltd
General purpose insulation resistance meterAnalog indicator, High measurement speedTest voltage range: 10 V to 500 VSuitable for Test capacitor insulation testEasy operation
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Product
Capacitor Test
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Delta United Instrument Co., Ltd.
Specialized, high-efficiency automatic testing systems for electrolytic capacitors.
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Product
Rail Traction Inverter Test System
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The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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Product
DC Hipot Testers
DPC series
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UDEYRAJ ELECTRICALS PRIVATE LIMITED
DPC series hipots are used for proof testing of high voltage equipment in power engineering. Routine testing of the insulation and leakage is a necessary requirement for electrical equipments. Other areas include: Cable breakdown testing, capacitor charging and general laboratory use.
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Product
Capacitance Meter, 120 Hz / 1 KHz / 1 MHz
E4981B
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The E4981B capacitance meter offers a high speed with reliable measurements for ceramic capacitor testing in the production lines
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Product
Electrolytic Capacitor Test & Scanning System
DU-9001
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Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Product
DC Hipot Testers
DPW Series
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UDEYRAJ ELECTRICALS PRIVATE LIMITED
These portable testers have been designed to be used in testing high voltage equipment in power engineering. Routine testing of the insulation and leakage is a necessary requirement for surge arresters, cable breakdown testing, capacitor charging and other laboratory use.
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Product
Insulation Resistance Meter
SME1202
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Scientific Mes-Technik Private Ltd
General purpose insulation resistance meter Analog indicator, High measurement speed Test voltage range: 10 V to 1000 V Suitable for Testing capacitor insulation test Easy operation
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Product
Capacitor Leakage Current/IR Meter
Chroma 11200
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Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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Product
Capacitance Meter
E4981A
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The E4981A capacitance meter offers a high-speed with reliable measurements for ceramic capacitor testing in the production lines. The E4981A realizes the measurement capabilities of capacitance from small to large values with accurate measurements. The E4981A capacitance meter contributes improvements of the test throughput, while attaining excellent component quality for ceramic capacitor testing.
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Product
High Voltage DC Lab Power Supplies 300V-5000V Output for Research Labs / Capacitor Testing – 300, 600, 1000, 3000, 5000V
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- 19” Rack Adaptable- Laboratory Bench Unit- Digital Output Metering- Constant Voltage Current Limit Type Character- Micro Switch Provided for Protection against Shock- 3U High (133 mm)- Power Saving Thyristor Preregulator Technique
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Automatic Test System
Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
