Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
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Portable Hardness Tester
Magnetic Type QualiMag Series
The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell test head fixes to the surface of iron and steel parts to test the hardness by applying magnetic force. Meant to replace Leeb hardness testers which are not as accurate nor reliable. Use the Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester on steel parts, steel plates, steel pipes, forgings, large to medium sized heat treated parts(if surface available), welding joints, pressure vessels, etc. The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell complies with Standards ISO 6508 and ASTM E18.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Portable Analyzers
The key to the operation of Alpha Moisture Systems' Portable Analysers is the unique Desiccant Dry-Down Chamber. By keeping the sensor dry between tests, the special assembly of the head ensures that the instrument is always ready for immediate use. The head assembly consists of two chambers which have a telescopic action. When the head assembly is in the 'closed' or 'Dry-Down' position, the sensor is completely surrounded by desiccant, which absorbs the remaining water moisture from the sensor and hence it is dry and ready for use. The small space at the bottom of the test chamber enables the sample pipe to be purged before the test commences without wetting the sensor. By placing a finger over the outlet of the head, the sample pressure is able to open the test chamber automatically, exposing the sensor to the gas being tested and enabling accurate reading of moisture content in the sample gas. After each test the head assembly is closed by depressing the inner section so that the sensor will again be dried by the desiccant, leaving the sensor ready for use time and time again. The desiccant is kept in the inner chamber and is not exposed to ambient room air or the sample gas, therefore there is no need for frequent regeneration or replacement of the desiccant.
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Final Test Manipulators
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Power device test system
This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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Mechanical Test Head Housing
a result of more than 10 years' experienceavailable with integrated manipulatorfully integrated docking and board lockingtest housing mechanics design as per customer specificationssuitable for individual and high-volume productionstandard and customized dimensionsno limitation in size and electrical power capacitiesquick and easy locking and unlocking process for board changelarge application space load boardoptional number of channel boards as per customer specificationsfamily/DUT board connection achieved by high-end double-ended spring probes - 50 Ohmhigh-end cooling fansfacilitated adaptation with all available manipulator solutionsdocking design in compliance with customer internal docking standards/dimensionsdocking force as per customer specificationscenter of gravity fully compensated
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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AMIDA 3KS Tester
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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Spinstand Automation For Media Testing With XY-Positioning
V2002
Guzik V2002 XY-positioning spinstand uses the X and Y coarse positioning stages actuated by linear motors and the micro-positioning stage actuated by the piezo element aligned with X coordinate axis to place the tested head on the specified track. WITE32 software converts the requested track number and skew angle into X and Y coordinates.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Remote Radio Head Test, Reference Solution
The Remote Radio Head Test, Reference Solution provides the physical interfaces together with the vector signal analysis and vector signal generation you need to carry out comprehensive functional and performance testing of your RRH). Fully characterize the uplink and downlink, RF air-interface to and from the digital "front-haul".
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Test Head Manipulators
Cobal 250
The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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Colorimeter Measurement
DRK8620
Shandong Drick Instruments Co., Ltd.
WSC-S Colorimeter measurement is a superior performance, versatile and convenient operation colorimeter,suitable for the determination of various objects reflection color, whiteness test, chromaticity and color object with two objects. It is equipped with a geometry test head, that the provisions of CIE 0 / d. WSC-S Colorimeter measurement with two portable desktop, digital display, and available for print. The instrument can be widely used in textiles, dyes, printing and dyeing, paper, building materials, ceramics, food, printing, metrology and other departments.
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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Rockwell Hardness Tester
Versitron® Series
Newage Testing Instruments, Inc.
The Versitron Rockwell hardness testing system is the industry workhorse of hardness testing - designed to meet the toughest challenges: clamp large parts, operate in poor environments, and test high volumes - all with less service problems and less operator skill requirements. Available with 2 different test stands types (in a range of sizes) and 2 test heads and also a wide range of other options.
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Taber® Rotary Abrasers
5135 & 5155
The Taber® Rotary Abraser is an industry standard used in wear and durability testing and is available with either a single test head or dual testing heads, which allows the user to test two different or identical materials simultaneously.
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Hydrostatic Head Tester
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester is used for measures the resistance of a fabric to the penetration of water under hydrostatic pressure. Hydrostatic Head Tester complies with AATCC 127, EN 20811, ISO 1420A, etc. Please contact us for Hydrostatic head test procedure.
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Van der Hoofden Test Head
The "Van der Hoofden“ test head allows to determine the exposure of humans to radiation caused byluminaries.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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DDR4 Pro 288-Pin DIMM Adapter
INN-8686-18-PRO
Your best option if you need to test a large volume of memory! The RAMCHECK LX DDR4 Pro 288-pin DIMM Adapter (p/n INN-8686-18-PRO) gives RAMCHECK LX users the power to test 288-pin DDR4 modules, including unbuffered (UDIMM), load-reduced (LR-DIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. It includes the DDR4 Series adapter and DDR4 Pro DIMM test head.
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Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Manual Test Adapter
linear pin compressionhinged carrier for probe cardfacilitated probe tower positioningmounted onto test head stiffener
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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Human Exposure Measurements to Luminaries
Through different ways of coupling between luminaries and humans, a level of exposure of a person to electromagnetic fields can be derived. One part of the exposure is based on capacitive coupling between lighting equipment and person. This creates induced internal electric field that must be evaluated using an EMI receiver and a Van Der Hoofden test head.
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Pod/Nest Fixtures
Nest and Pod Fixtures are used to test components and sub-assemblies. They typically are built in an array and the devices under test are subjected to tests that simulate operating conditions or life-cycle testing. Test Head Engineering is experienced in providing nest and pod testers that meet the connectivity, ergonomic and mechanical requirements of component testing.
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Functional Test Fixtures
Test Head Engineering's Custom Functional Test Fixtures range from simple to extremely complex. Typically, our customers do their own wiring and programming, but we will complete the job right up to the customer's requirements, including offering turn-key control and test programming through our partners.
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Welding Resistance Tester
WRT
The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
