In-circuit Probes
Contact test pads on completed PCBs.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Product
Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25I-2
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4B-1
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Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Standard 2.00 (57.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
F-S-R
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 66Recommended Travel (mm): 1.68Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Product
Passive Probe, 10:1, 500 MHz, 1.2 M
N2843A
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The Keysight N2843A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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Product
LTP-25 High Performance Long Travel Probe
LTP-25
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 400Full Travel (mm): 10.16Recommended Travel (mil): 317Recommended Travel (mm): 8.05Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Full Travel for LRP-25TJ: 340 (8.6) and Full Travel for all Ultra High springs: 350 (8.9)
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Product
Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72T20-7
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Test Probes
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Safety right angle insulated alligator test probe, safety right angle insulated alligator test probe with insulated jaws, test probe, minitest probe, micro test probe.
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Product
BP-1 PROBE
BP-1
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Rugged ConstructionWater ResistantUnaffected by Surface CoverEasy to InstallZinc Plated Clamp (included in kit)
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Product
Light 0.48 (14.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-62H-2
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3E
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1V-2
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
STP-25 Replaceable Step Probe
STP-25
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 135Full Travel (mm): 3.43Full Travel Remark: Varies with tip (min. 135 mil / 3,43 mm)Recommended Travel (mil): 120Recommended Travel (mm): 3.05Overall Length (mil): 1300Overall Length (mm): 33.02
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Product
Accessibility Probes
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Educated Design & Development, Inc.
FOR TESTING THE PROTECTION AGAINST ACCESS TO HAZARDOUS PARTS Our complete line of accessibility probes will allow you to determine compliance with all IEC, EN, UL, CE, CSA and other international safety Standards. ED&D offers the highest quality test probes available in the world. These probes are used to determine if accessibility exists with fingers, tools, and foreign objects to hazardous areas [involving shock hazards (voltage), energy hazards (VA) and injury hazards (i.e. moving parts)]. If you can’t tell which probe is right for your products, send us a copy of the specifications from the safety standard you are using. We can provide custom probes to meet your needs. All probe bodies are machined from high quality Delrin® (extremely resistant to deformation). ISO/IEC 17025 Accredited and NIST-traceable Certificates of Calibration available! Measurement and Uncertainty data available. All ED&D Probes are Made in the USA.
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Product
Semiconductor Probe
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Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Product
InfiniiMax Probe, 7 GHz
1134B
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Use for high-speed differential or single-ended probing in embedded designs
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74A
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
Isolation Probe
SE-6000/6010
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Performs waveform measurements with high resolutions and in safe manner under high voltage environment in systems that isolate Input/output terminals through optical insulation
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1I40-10
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Temperature Probe Adapter
U1184A
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Adapts thermocouple and temperature probes mini connector to dual banana inputs.
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Product
Coaxial Probes
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Smiths Interconnect offers the industry's most extensive line of high reliability coaxial probes. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.
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Product
High 4.00 (113.00) - 6.70 (190.00) General Purpose Probe
P2550-8-8
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25L36-6.5
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
CPU3xx Incircuit Debugger
ICD32Z
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P&E's ICD32 for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1L-6-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-J100-3
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Differential Probe
DP-35
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*High Sensitivity, High Voltage Model .*35MHz/1600 Vp-p Max.*Input Impedance 8MΩ//2.5PF*x10, x100 Attenuator, Easy to Convert.*Separating Design(Standard No.114205) Convenient & Durable.
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Product
Differential Probe
DP-60HS
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*High Sensitivity Model: x 1, x 5, x 10 Attenuation*1 MΩ // 10PF Input Impedance*High Frequency Operation: x 1(30 MHZ), x 5(60 MHZ), x 10(60 MHz)*Especially For Low Voltage: x 1(7 Vp-p), x 5(35 Vp-p), x 10(70 Vp-p)





























