In-circuit Probes
Contact test pads on completed PCBs.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1L24-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1L-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1B
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Oscilloscope Probe
Oscilloscope
Oscilloscope Probes can conduct signals up to 2.5 GHz, 300 V, or 500 Arms, even in extreme environments. They offer fixed attenuation of 10X or 100X or switchable attenuation between 1X and 10X. Oscilloscope Probes are offered in several types, including single-ended and differential, active and passive, voltage and current.
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Product
Probes
70 Series
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American Probe & Technologies, Inc.
The series is for all probes that are non-standard in shank diameter (other than 10 or 20 mil).
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Product
Probes
72 Series
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American Probe & Technologies, Inc.
20 mil (0.020") shank sizesAvailable in straight and bent shapes to fit most industry standard analytical probe holders
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Product
Alternate 2.50 (71.00) - 5.80 (164.00) General Purpose Probe
P2665G-1R2S
General Purpose Probe
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1B-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Absorption Probe
ASD12-N
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The ASD12-N absorption probe has a durable LED light source for direct installation into laboratory bioreactors and disposable bioreactors for measuring cell growth and optical density. The probe is available in three different lengths to fit any vessel and is suited for sterilization / autoclaving procedures.
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Product
Analog In-Circuit Tester
406C
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The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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Product
N2782B AC / DC Current Probe, 50 MHz, 30 Arms
N2782B
High Current Probe
The N2782B current probe is an accurate and reliable solution for measuring AC and DC currents. Using a hybrid technology that includes a Hall effect sensor and an AC current transformer, the probe provides accurate measurement of DC or AC currents up to 30 Arms continuous.
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Product
Reflection Probes
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Reflection probes are used to obtain spectral information of diffuse or specular materials. The light from a light source is sent through six illumination fibers to the sample, and the reflection is measured by a 7th fiber in the center of the reflection probe tip. Discover our reflection probes below.
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Product
Radius, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0D-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
Oscilloscope Probe
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Product
TSP138 Switch Probes
Switch Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Product
SIP-90-2 Test System Interface Probe
SIP-90-2
ICT/FCT Probe
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Product
Coaxial Probes
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Smiths Interconnect offers the industry's most extensive line of high reliability coaxial probes. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.
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Product
Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-9
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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Product
Acoustic Probe
AA-Ultrasonic
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The AA Ultrasonic acoustic probe is designed for use on air insulated terminations where a clear sound path between the electrically stressed insulation and the probe is present.
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Product
HPC High Current Probes, 100 – 187 mil (2.54 – 4.75 mm)
HPC
High Current Probe
100 – 187 mil (2.54 – 4.75 mm)
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Product
SIP-90-5 Test System Interface Probe
SIP-90-5
ICT/FCT Probe
Overall Length (mil): 1,000Overall Length (mm): 25.40Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Raman Probes
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As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
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Product
Topside Probing In-Circuit Test Fixtures
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Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.
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Product
Conductivity Probe
ACS60-35
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Knowing the conductivity of liquid samples is a key parameter to control product quality throughout the production process. The optek ACF60 conductivity probe fulfils technical requirements of international regulations for reliable measurements ensuring quality and consistency.
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Product
Alternate 6.00 (17.00) - 2.50 (71.00) General Purpose Probe
P2262AG-1C2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Probe Card
T90™ Series
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The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Product
Current Probes
XQ13
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Beijing GFUVE Electronics Co.,Ltd.
The model XQ13 ac micro amp clamp on current probe is suitable for 10A-100A cable online measurement, it belongs to high performance current sensor field.
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Product
Probe Card
T40™ Series
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Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
