Showing results: 1726 - 1740 of 2046 items found.
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Photometric Solutions International Pty Ltd
These are Type C/gamma goniophotometers with wide-ranging applications including luminaires, floodlights, streetlights, LED clusters, emergency lighting, flat panel displays and others. These goniophotometers typically have an angular accuracy of better than 0.1°, which is perfect for LED and luminaire goniophotometry. The control software that comes with each system has advanced functions that make testing easy – even for inexperienced users. Additionally, the report generator and other software utilities that are also supplied make these systems powerful and advanced research and development tools.
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Megger Group Ltd.
Diagnostic insulation testing today represents over a hundred years of constant development. When Sydney Evershed pioneered the first insulation tests in the late 19th century, the only measurable values were insulation at 500 volts and a basic continuity check. However, measurement techniques have continuously evolved to keep pace with new insulation technologies. From electronic design and household wiring to generators and power transmission systems, all different kinds of insulation must operate at a safe minimum value.
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Model 71891 -
Pentek, Inc.
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Accepts RF signals from 925 MHz to 2175 MHz- Programmable LNA handles L-Band input signal levels from -50 dBm to + 10 dBm- Programmable analog downconverter provides IF or I+Q baseband signals at frequencies up to 123 MHz- Two 400 MHz 12-bit A/Ds digitize IF or I+Q signals synchronously- Two FPGA-based multiband DDCs (digital downconverters)- Xilinx® Kintex® UltraScale™ FPGA- Five GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- PCI Express interface (Gen. 1, 2 & 3) up to x8- Clock/sync bus for multimodule synchronization- Optional LVDS and gigabit serial connections for FPGA for custom I/O- Navigator BSP® for software development- Navigator FDK® for custom IP development- Free lifetime applications support- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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ERAVANT
Automotive radar sensors play a vital role in the current development of autonomous driving. Their ability to detect objects even under adverse conditions makes them indispensable for environment-sensing tasks in autonomous vehicles. As their functional operation must be validated in-place, a fully integrated test system is required. Radar Target Simulators (RTS) are capable of executing end-of-line, over-the-air validation tests by looping back a received and afterward modified radar signal and have been incorporated into existing Vehicle-in-the-Loop (ViL) test beds before. However, the currently available ViL test beds and the RTS systems that they consist of lack the ability to generate authentic radar echoes with respect to their complexity. The paper at hand reviews the current development stage of the research as well as commercial ViL and RTS systems. Furthermore, the concept and implementation of a new test setup for the rapid prototyping and validation of ADAS functions is presented. This represents the first-ever integrated radar validation test system to comprise multiple angle-resolved radar target channels, each capable of generating multiple radar echoes. A measurement campaign that supports this claim has been conducted.
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Soft Hearts LLC
1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)
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Model 6001 -
Pentek, Inc.
- Now available in RFSoC Gen 3 with the Model 6003- Unique QuartzXM eXpress Module enables deployment in custom form factors- Supports Xilinx Zynq UltraScale+ RFSoC FPGAs- 16 GB of DDR4 SDRAM- Measuring only 2.5 by 4 inches- LVDS connections to the Zynq UltraScale+ FPGA for custom I/O- GTY connections for gigabit serial communication- Ruggedized and conduction-cooled versions available- Includes a complete suite of IP functions and example applications- Model 8257 1-Slot 3U VPX Development Chassis for Quartz Products
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Dynas3 -
HORIBA, Ltd.
Dynas3 Machines are specially suited for use in engine test stands. The AC machine, variable frequency drive with test stand controller and safety module are tuned to one another to form a system that has proven itself many times over. It can be used in any type of development and function test stand. The applications range from simple test stands for steady state operation up to sophisticated test stands for dynamic test cycles. Nearly every application in the field of engine testing can be performed on a test stand with DYNAS3.
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XEPOS -
SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
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Interpower Corp.
The Interpower® International Power Source (IPS) provides a low-cost, convenient source of AC power at various operating voltages and frequencies found around the world (typically 110-240VAC/50-60Hz) which is important for testing any products that are exported. Output power is delivered through one of two ranges: Low range (10-138VAC) through a standard NEMA 5-20 socket and High range (10-276VAC) through any of the six standard international sockets so that products can be conveniently powered during development or just prior to shipment.
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National Technical Systems
NTS’ Fuel Systems & Component Testing site at Santa Clarita is used for the development and qualification of fuel line parts and subsystems. Any individual device or subsystem that is part of an engine or fuel system – such as fuel pumps, hydro-mechanical fuel controls and shutoff valves – requires qualification testing to the RTCA DO-160 environmental standards for airborne equipment or the Mil-STD 810G environmental standards for a broad range of military equipment. The fuel testing site installed at NTS Santa Clarita is a state-of-the-art facility for simulating the most stringent environmental conditions.
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National Technical Systems
The physical and mechanical testing of a product comprises a critical part of the product and development process. Applied physical force such as vibration, shock stresses, and strain can reveal the inelastic behavior of the material. Mechanical testing allows the product developers to understand the product better, identify vulnerabilities, and establish stronger quality control. Mechanical testing employs a variety of strength tests that can determine the suitability of a material or component for the intended application. It measures characteristics such as elasticity, tensile strength, elongation, hardness, facture toughness, impact resistance, stress fracture, and the fatigue limit.
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ImpactQA
By testing the flaws in software, our security testing services seek to remove vulnerabilities before the software is deployed or purchased. By focusing on the different layers of an information system across the database, infrastructure, network, and access channels such as mobile, security testing looks at making the applications free from vulnerabilities. We assist online service providers, website owners, and independent software vendors to manage application security risks. We offer a comprehensive range of white, grey, or black-box model security testing based on your stage in the development cycle.
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The Test Connection, Inc.
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Q-400 TCT -
Dantec Dynamics A/S
The Q-400 TCT system is designed for complete three-dimensional and highly sensitive warpage, thermal expansion measurement and strain analysis of materials and components in the heating and cooling phase. Areas from 50 mm x 70 mm down to 2 mm x 3 mm can be investigated. Measurements can be done from room temperature up to 300°C and down to -40°C. The system is specially suited for thermal expansion measurement of electronic components and is frequently used in the development and testing of complex anisotropic materials, components, and structures in electronic applications.
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KLA-Tencor Corp
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
