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Showing results: 1936 - 1950 of 2035 items found.

  • cRIO-9039, 1.91 GHz Quad-Core CPU, 2 GB DRAM, 16 GB Storage, and Kintex-7 325T FPGA, 8-Slot CompactRIO Controller

    784775-01 - NI

    1.91 GHz Quad-Core CPU, 2 GB DRAM, 16 GB Storage, and Kintex-7 325T FPGA, 8-Slot CompactRIO Controller - The cRIO-9039 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. Additionally, the cRIO-9039 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.

  • cRIO-9035, 1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller

    783848-01 - NI

    1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller - The cRIO-9035 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. Additionally, the cRIO-9035 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.

  • cRIO-9035, 1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller

    784774-01 - NI

    1.33 GHz Dual-Core CPU, 1 GB DRAM, 4 GB Storage, and Kintex-7 70T FPGA, 8-Slot CompactRIO Controller - The cRIO-9035 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. You also can use the Mini DisplayPort to add a local human machine interface (HMI) for application development. Additionally, the cRIO-9035 features an SDHC slot and a variety of connectivity ports, including two tri-speed RJ-45 Gigabit Ethernet, two USB host, one USB device, and two RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.

  • Virtex UltraScale+ HBM FPGA Processor - SOSA Aligned 3U VPX

    Model 5586 - Pentek, Inc.

    - Jade 5585 and 5586 FAQ- Co-processor for distributed FPGA processing tasks- High-Bandwidth Memory (HBM) delivers 20x more memory bandwidth than traditional DDR4 solutions- Board interfaces: 1 GigE, 10 GigE, 40 GigE, dual 100 GigE and PCIe- High-bandwidth memory, FPGA logic and DSP density make this board a single-slot 3U VPX proessing powerhouse- Features Xilinx Virtex UltraScale+ HBM FPGAs- 10 GigE Interface and 40 GigE Interface- Optional VITA 67.3C optical interface for backplane gigabit serial communication- Dual 100 GigE UDP interface- Compatible with several VITA standards including: VITA 46, VITA 48.11, VITA 67.3C and VITA 65 (OpenVPX™ System Specification)- Ruggedized and conduction-cooled- Navigation Design Suite for software and custom IP development

  • Substrate Manufacturing

    KLA-Tencor Corp

    KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.

  • MIL-STD-1553 Test & Simulation Instrument for PXI

    PXI-C1553 - Avionics Interface Technologies

    Dual redundant, single, dual or quad stream configurationsSoftware selectable Transformer, Direct, and Bus Stub Coupling Modes - Concurrent Bus Controller, 31 Remote Terminals, & Bus monitor operation - Full error injection and detection - Multi-level triggers for capture and filtering - Ten high voltage (up from 30V) programmable DIO lines - IRIG-B time code encoder/decoder with free-wheeling mode - Time Synchronization to PXI 10MHz reference clock - Real-Time recording and physical bus replay - PXI trigger generation on 1553 bus events - Initiate BC, RT Simulation and BM Capture on PXI Triggers - Application interface supporting C, C++, C#, and .NET development - Device driver support: Windows, Linux, LabVIEW Real-Time (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software

  • Cryogenic Applications

    Celadon

    Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.

  • Cryogenic 4K Probe Cards

    Celadon

    Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.

  • IP Performance Testing Tools

    Omnicor

    Ethernet switches, routers and gateways have their distinct purposes and it is important to test their performance well. During R&D and DVT products are usually tested on L2/L7 while in production basic L2/L3 tests are usually sufficient. For those who follow testing methodology RFC 2544 and RFC 2889 are also available.IP traffic packet generators/analyzers for 10/100/1000 Mbps, gigabit and 10 gigabit with PoE options are the most important test instruments to ensure Ethernet switch or router product quality is verified. Gigabit TAP analyzers, media convertors, production test software suites and Ethernet cable emulators are additional tools used in conjunction with stream generators to help ensure fast development cycle and high quality. Our IP performance test systems are economic and known worldwide for excellence in quality and service support.

  • Electromagnetic Compatibility (EMC) Testing Capabilities

    Eurofins E&E

    Electromagnetic Compatibility testing analyzes the ability of electronic devices to operate as anticipated when in proximity to other electronic devices or in the presence of electromagnetic disturbances that interfere with their intended operation.We help you ensure EMC compliance and attain the needed EMC certifications by assisting you in maximizing accuracy, reducing testing cycles, and getting your products to market faster — from design conception to end-product completion even against the most demanding electromagnetic regulations.We understand that time to market is everything which is why our global testing capabilities and custom testing solutions utilize the latest technology and automation software, helping you meet demanding time-to-market needs. Our streamlined testing process brings your product from development to end use efficiently in accordance with government, regulatory, military, or industry standards based on your compliance needs.

  • Diagnostic Engineering Software

    eXpress - Spherea Technology Ltd.

    eXpress is a software suite of diagnostic engineering tools that encompass diagnostics, testability, prognostics and systems engineering and represents the result of over 30 years of software development. It provides enormous short and long-term cost-savings, realized throughout the entire life cycle.eXpress provides the capability to capture design information from a systems perspective and may be used to seamlessly combine disparate sources of data. eXpress couples the Systems Engineering, Reliability, Testability, Maintainability and Diagnostic/Testability disciplines. This provides a true end-to-end solution, which can begin as early as concept exploration, and carries through run-time deployment and beyond.eXpress' approach handles system-level design capture and analysis across large engineering teams. By providing the most in-depth Testability and Diagnostics assessment capabilities on the market today, eXpress can tackle tasks ranging from the smallest embedded component to entire aircraft systems.

  • Test And Measurement

    Spectris plc

    Test and Measurement supplies test, measurement, and analysis equipment and software for product design optimisation, manufacturing control, and environmental monitoring systems. Markets are principally the aerospace, automotive, consumer electronics and oil and gas industries. For customers in the automotive and aerospace industries, our products and applications help them to design and test new products whilst reducing time to market. In consumer electronics, our equipment and software enable customers to refine the performance and accuracy of their products and to test them in the production process. In the environmental monitoring market, the desire for higher standards of community comfort is creating additional demand. In the oil and gas industries, our products and solutions optimise the recovery rates of oil and gas reservoirs and support the development of cost-efficient extraction processes in a safe manner that minimises the impact on the local environment. The operating companies in this segment are Brüel & Kjær Sound & Vibration, ESG Solutions, HBM and Millbrook.

  • Near-Field Probes 100 kHz up to 50 MHz

    LF1 set - Langer EMV-Technik GmbH

    The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.

  • Magnetic Hall Sensor

    SystematIC

    On basis of extensive experience in Hall Sensor readout and related intellectual property SystematIC has developed several customer-specific and application-specific Hall IC products.For isolated current sensing at DC and low frequencies the Hall sensing technique is a valuable technique. It allows full integration of the sensor elements (Hall plates) and the readout electronics in standard CMOS technology. SystematIC succeeded in combining the full integration with good accuracy parameters and high bandwidth. With a compact die containing magnetic field sensors and programmable readout amplifiers SystematIC contributed to the customers fully integrated current sensor product.SystematIC did the full integrated circuit development and supported in wafer and final test programming. As a result of cooperation with our customer a current-sensor-IC with low offset, high gain accuracy, low TC's and excellent isolation properties has been released for production.

  • Tribometers/Abrasion Testers

    AEP Technology

    AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.

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