Development
See Also: Software Development, Developers, Development Boards, Test Development, Beta Testing, Bug
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Digital Signal Processor Card for PCI Bus
SI-C6713DSP
The SI-C6713DSP from Sheldon Instruments is a family of powerful Digital Signal Processor (DSP) cards for your PC equipped with a 32 bit PCI bus. It is based on Texas Instruments’ 300Mhz TMS320C6713, 32 bit DSP, and can transform your system into an ultra high performance development platform and DSP accelerator.
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Static Analysis Tool
CodeSonar
Automated static analysis designed for zero-tolerance defect environments. CodeSonar, GrammaTech''s flagship static analysis software, identifies programming bugs that can result in system crashes, memory corruption, leaks, data races, and security vulnerabilities. By analyzing both source code and binaries, CodeSonar empowers developers to eliminate the most costly and hard-to-find defects early in the application development lifecycle.
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Nanostructuring
AMO offers a highly flexible process-platform for the fabrication of nanostructures. We have a broad range of lithography techniques that can be flexibly combined with each other – including interference lithography. Each lithography technique is tailored to a specific pattern-transfer process and can be used on a wide range of substrates. In addition, we have developed an advanced nanoimprint lithography process that can transfer e-beam-defined patterns to large areas in a cost-effective manner.
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Streak Cameras
Streak camera technology was developed for measuring ultra-fast optical phenomena. OptoScope streak cameras provide temporal resolution down to the Picosecond regime. Additionally, OptoScope systems have high sensitivity allowing single photon detection. Streak cameras are the only instruments that can capture the behavior over time of multiple optical signals. Combined with a spectrometer this allows their application in the field of time resolved spectroscopy.
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Capacitance & Tan Δ Power Factor Meter 12kV
CAPO-12
The CAPO 12 is a fully automatic Capacitance, Insulation Power Factor / tan δ measuring instrument developed by Raytech Engineers. The self-contained instrument performs measurements of Insulation Power Factor (cos ᵠ), Dissipation Factor (tan δ), Capacitance, Inductance, Excitation, Quality Factor and Power Loss (watts). Measurements can be made up to 12kVAC at variable frequency (from 10Hz to 400Hz).
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Two And Three Axis Gyroscopes
TAG
The Inertial Labs Axis Gyroscopes are developed for Electro-Optical Systems, Gimbals, Line-of-Sight, and Pan and Tilt Platforms for inertial stabilization and pointing applications. These devices utilize advanced, tactical-grade MEMS sensitivity whose size, power consumption, reliability, and performance are ideal for accomplishing complex tasks requiring accurately stabilizing assorted platforms.
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Custom Test Fixtures
Intrinsic Quality is proud to offer a variety of Test Fixture Development Services that include fixture building, tester interface building, harness building, troubleshooting, maintenance, design, and engineering. IQ’s fixtures are built to exacting specifications and configured to deliver quality production testing. Our global customers have trusted us for over 35 years to provide custom solutions applying leading edge technology. IQ consistently delivers cost-effective solutions with our client’s recognition and gratitude.
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
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PCI-8516, 2-Port, PCI, LIN Interface Device
781365-01
2-Port, PCI, LIN Interface Device—The PXI‑8516 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The PXI‑8516 excels in applications requiring real-time, high-speed manipulation of hundreds of LIN frames and signals, such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move LIN frames and signals between the interface and the user program without CPU interrupts, minimize message latency, and free host processor time for processing complex models and applications.
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Powerful AC/DC Power Supply For Testing Circuit Breakers
POB35AD
POB35AD is a power supply unit employing the latest power electronics technology. POB35AD generates ripple free DC-voltage and it is developed for regular maintenance tests of power circuit breakers. It eliminates use of stationary batteries during testing. Output voltage is selectable from 10 to 250V AC/300VDC. The test set is a powerful and versatile unit with possibility to generate up to 30A.
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Optoelectronics and Photonics
SemiProbe has developed probe stations for a wide variety of optoelectronic and photonic device applications, including light emitting diodes (LEDs), vertical cavity surface emitting lasers (VCSEL) and photo diodes. Testing and handling small, fragile, thin wafers with thousands of die on them poses unique challenges that require innovative solutions.
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3U OpenVPX SOSA™-Aligned MFIO-Intensive Processing Board
68G6
The 68G6 is a SOSA™-Aligned 3U OpenVPX board that can be configured with up to three NAI smart I/O and communication function modules. In addition to the standard expansion plane (EP) PCIe and control plane (CP) Ethernet control interfaces, the 68G6 facilitates convenient external access to supported NAI PCIe function modules through its 1 x1 PCIe interface, enabling seamless expansion of host SBC functions for enhanced project solutions, while also offering external access to supported NAI FMx modules via a SATA II interface. The 68G6 is on NAI’s certifiable product development roadmap supporting DO-178C and DO-254 design assurance guidelines for safety-critical applications. Ideally suited for rugged Mil-Aero applications, the 68G6 delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Instrument Systems LED And Display Measurement
Konica Minolta Sensing Americas, Inc
Instrument Systems is a frontrunner in developing state-of-the-art light measurement equipment, software, and accessories, taking great pride in constructing products that provide fast, accurate readings to ensure precise data for laboratory, production and quality assurance testing. All Instrument Systems products have stringent quality and performance requirements to ensure that customers get the highest quality equipment. As a leading supplier world-wide, they provide cost-sensitive support to a diverse clientele to help them measure luminance, flux, intensity, illuminance, and chromaticity of LEDS, lamps and displays throughout all aspects of product development and production.
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Material Compatibility Test System (MCTS)
Automotive squeaks occur when materials in contact rub against one another causing annoying noises from friction-induced stick-slips. Automotive itches are a special category of squeaks that can develop when rubber or plastic rubs against glass or paint. The MB Dynamics Material Compatibility Squeak & Itch Test System (MCTS) is designed and manufactured to subject contacting pairs of materials and actual vehicle parts to precisely controlled interference & motion under in-vehicle environmental conditions in order to acquire, monitor, analyze and report friction and acoustic characteristics with the objective to:
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3U OpenVPX 2-Slot Backplane With 1 VPX Power And Ground Plus 1 VITA 62 Power Supply Slot
101VPX302-xxxx
This 3U Open VPX backplane offers one VITA 46 Power and Ground slot and one VITA 62 power supply slot to support the development and deployment of systems requiring a VITA 62 power supply. The rear power studs can be used to connect to an adjacent backplane to feed it power.
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cRIO-9040, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -20 °C to 55 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller
785624-01
1.30 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -20 °C to 55 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller - The cRIO-9040 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for … data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Impulse Winding Tester
TH2883S8-5
Changzhou Tonghui Electronic Co., Ltd.
TH2883 series products are newly developed impulse winding testers by Tonghui. This product line makes Tonghui as the first provider of impulse winding tester from low voltage of 30V to high voltage of 10kV, single channel to multichannel (Max.:8 channels) in this industry. The instrument adopts popular 32 bit CPU and high density SMD technology, 65k color 7-inch TFT wide display screen, bringing ease for your eyes and convenience to your operation. The impulse voltage of100V~5000V, maximum 8 channel sweep test, maximum 20 test procedures, sampling rate of 200Msps, memory depth of 6k bytes makes your test accurately.The usage of standard sample average, application of demagnetized impulse, high bandwidth analog acquisition circuit, technology of high-fidelity corona extraction as well as the opening of non-destructive test reflect the design philosophy “customer-oriented, share the future technology with you” of Tonghui.
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*OEM Power Sensors
The OEM “standard” sensors are actually families of existing OEM sensors with typical specifications shown. They can be tailored as needed to fit your specific requirements. In addition to the products described, Ophir has developed hundreds of other OEM solutions. These compact laser power sensors have built-in amplifiers and are easy to install. They contain all the electronics needed including algorithms to increase the sensor's speed of response. Connections to the sensors are simple, with the host providing DC power and the sensor providing a voltage or digital output. Outputs Available: DB15 smart sensor output; Calibrated analog output; RS232; USB; Ehthernet. Simply fill out the Sensor Customization form so we can provide just the right solution for your needs.
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Cable Tester
The Cable Test System is a perfect example of a special solution built on existing DapTechnology building blocks. The system, which was developed with the cooperation of a key A&D cable harness supplier, replaces a cable test system with proven FireSpy Technology.
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Ultimate Performance Gaming Platform Based on 7th Generation Intel® Core™ Processors Supports up to 11x Independent Displays Including 4K UHD
ADi-SA1X-SL
- Ultimate " all-in-one" gaming platform- The best-in-class graphics capabilities in games with high levels of detail- Up to 11x independent HD monitors supporting 4K UHD- Advanced security feature set and software solutions- Intelligent middleware shortens development time- Various power supply options- Low-power consumption
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Advanced Serial Protocol Analyzer
Most data networks are complicated, not just the hardware and network issues, but also the high-level protocols that devices use to communicate; and to make things even more complicated, many manufacturers have incorporated proprietary protocols for their devices. Integrating different devices and protocols within a data network is always the most challenging task for system integrators, firmware / software developers, and site engineers. From the simplest loopback test to complicated checksum calculation and sophisticated firmware and GUI software development, the 232Analyzer is designed to tackle all these challenges.
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Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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FTIR Motor Exhaust Gas Analyzer
MEXA-ONE-FT
The MEXA-ONE-FT Series simultaneously measures concentrations of multiple components, including NH3, N2O, CH4, CO and CO2, in undiluted exhaust gas using the Fourier transform infrared (FTIR) method in combination with a multivariate analysis algorithm. It incorporates HORIBA's proprietary compact interferometer which yields superior performance and high accuracy.The system complies with NH3 testing requirements of Euro VI, the EU regulation for heavy duty emissions testing.The MEXA-ONE-FT can be calibrated according to customer requirements with up to 6 component sets to cover a wide range of applications.FTIR spectroscopy allows the direct measurement of NO2 emissions and the independent quantification of individual hydrocarbon species. This makes the MEXA-ONE-FT system an ideal solution for detailed research and development tasks.Due to the measurement principle, the time-consuming daily span gas calibration is omitted.In addition, usability and flexibility are realized by “HORIBA ONE PLATFORM” which enables to extend the system with other ONE analyzers to a complete solution suitable for both certification and R&D purposes.
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3U VPX 1 Slot Power & Ground 25G Pass Through
101VPX301P-9X13
Power for 3.3V, 5V and 12V are included, rear connectors are all fully loaded, use with Elma’s slot to slot or slot to I/O bulkhead cable products during system development.
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Services
Our extensive in-house know-how allows us to develop customer-specific projects, starting with the selection of the cell-internal components through to the manufacture of complex overall systems. We always focus on considering renewable energies.
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PXIe Frequency Reference: 10 MHz And 100 MHz
M9300A
The M9300A PXIe frequency reference is a PXIe-compatible, compact, modular instrument that can be used with the Keysight M9301A synthesizer, M9310A source output, and M9311A modulator to create the world’s fastest vector signal generator, the M9381A. Create a CW source, the M9380A, by combining the M9300A with the M9301A and M9310A or use it as the 10-MHz or 100-MHz reference with other PXI solutions. Control the instrument through a soft front panel and programmatic interfaces tuned to your application development environment of choice.
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PXI-7953, Virtex-5 LX50 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module
780340-01
Virtex-5 LX50 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7852 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7852 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Structural Health Monitoring System
SHM
Automated stationary structural health monitoring system (SHM) is a subsystem of buildings and structures control system which has been developed in accordance with the applicable requirements of the corresponding standards. It is used to detect a transition of the building state from operational into the state of failure, that may eventually lead to fatal accidents.





























