Automatic Test Systems
execute test program sets automatically. Also known as: ATS
See Also: Automatic Test Equipment, ATE Integrators
-
product
Microhardness Tester
MT91 Series
Newage Testing Instruments, Inc.
The Newage MT91 System is an automatic microhardness testing system that uses the Rockwell method for the hardness result. Hardness is measured based on the depth of penetration rather than using an optical system to determine hardness based on the impression diameter.
-
product
Fully Automatic Tensile Testing System
This is a fully automatic tensile testing system for metals. The system is fully automated from supply of specimens, measurement of specimens, tensile testing, recovery of specimens, and data processing, and is capable of continuous nighttime testing.
-
-
product
Precision LCR Meter
TH2816A
Changzhou Tonghui Electronic Co., Ltd.
TH2816A is a new precision LCR meter combined with years of technical experience and newest measurement technology of instrument industry. With powerful measurement functions, high performance and low cost, TH2816A/TH2816B/TH2817A have been one of the world advanced instruments, and it provides users a super value measurement resolution and experience. The meter offers stable 6 digit resolution, wide frequency range (200kHz for TH2816A), programmable signal level (0.01V to 2.0V), up to 30 meas/sec measurement rate, 9 measurement ranges, 30Ω or 100Ω constant output impedance and friendly operation interface. TH2816Acan be used for incoming inspection of components, quality control of product line and high accuracy laboratory use. The HANDLER, GPIB, RS232C interfaces make it easy to build an automatic component test system,
-
product
Magneto-inductive Testing
MAGNATEST D-HZP
Foerster Instruments, Incorporated
The MAGNATEST D-HZP by FOERSTER is the ultimate magneto-inductive test instrument: the fully automatic system tests materials for their properties. It operates in single coil absolute mode, making a comparator coil unnecessary. The combination of high excitation currents and complex evaluation electronic equipment detects even very small structural discrepancies. The MAGNATEST D-HZP also provides comprehensive options for documenting test results, such as test piece statistics, histogram, and test data export, which are displayed clearly on the large color display.
-
product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
-
product
USB PD Power Supply/Module ATS
8000 Series
The USB 3.1 specifications has three major features which are 10Gbit/s transmission speed, USB PD (Power Delivery) with support for 100 watt charging power, and the standard Type-C connector/cable that can be inserted with either side. It is expected to meet all kinds of data / video transfer applications. The advent of USB PD may consolidate the specifications of various power converters and the laptop, monitor, printer or Hub that implements USB PD is no longer a simple power-consuming device but able to supply power to other devices. The USB PD DRP (Dual role port) function allows the built-in USB PD module to deliver a maximum of 100 watts of power through the Type-C interface. To make sure the USB PD Type-C output power does not supply invalid voltage or poor power output characteristics with excessive noise that can damage the power consuming device and cause unsuccessful startup, each USB PD power supply or module has to be fully tested during production to ensure the product features meet the design specifications. This ensures high-quality products are provided to the market to gain acceptance.
-
product
Test Solutions for Networked Vehicle Components/Connected Cars
Infotainment & Telematics
Developing automatic test systems for the automotive industry is one of our core areas. This industry in particular is characterized by rapid technological progress and ever faster time-to-market requirements.In the vehicle, multimedia devices are used for pure entertainment, but also as vehicle information, which are intended to cover security and navigation services.Infotainment and telematics devices such as eCall modules, connected gateways, instrument clusters or the HMI (Human Machine Interface) are networked with each other and with the most important vehicle functions. All of this is made possible - in addition to GNSS (Global Navigation Satellite System) - by wireless and new communication standards such as A 2 B, BLE, C-V2X, Wi-Fi 6 and 5G.The complex networking is a very attractive factor for drivers and passengers, but this complex communication can become a major challenge for developers.High-speed interfaces and high-frequency modules used in combination must send and receive signals between the different devices absolutely error-free.With our individual and sensitive test and inspection systems, we also simulate vehicle components or emulate the vehicle environment and thus ensure the functionality of your devices. We take your pioneering developments to the next level.
-
product
Multiport Coaxial Switch, DC to 20 GHz, SP4T
87104B
The Keysight 87104B multiport switch improves insertion loss repeatability and isolation, which is necessary for higher performance test systems. The repeatability and reliability of this switch is vital to ATS measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. The Keysight 87104B terminated multiport switch provides the long life and reliability required for automated test and measurement, signal monitoring, and routing applications. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications. Low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy.
-
product
CPCI
Modules in compact PCI from Data Patterns are available for Data Acquisition and Control, Simulation, Communication Automatic test equipment, Rugged systems, Fail-safe systems, Computer controlled logic controls, Plant automation and similar requirements. Other I/O functions available from our IP and Mezzanine Module families can be directly integrated into our cPCI systems.Data Patterns has also pioneered cPCI derivatives such as 9U High Voltage systems, Multiple backplane support with Hot Standby Switchover capabilities. Continuous innovation enables MMI options such as CRT & LCD displays, Keyboards, Pointing devices, Finger print security devices and so on.
-
-
-
product
EMS Test System
TS9982
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
-
product
Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
-
product
Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
-
product
SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
-
product
HTOL Test Systems
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
-
product
Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
product
NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
-
product
Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
-
product
Configurable Functional Test System
ATS-5000
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
-
product
Scienlab Battery Test System - Cell Level
SL1007A
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
-
product
Other Test Systems
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
-
product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
-
product
Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
-
product
In-Circuit Test
TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
-
product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
-
product
Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
-
product
VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
product
Eagle Test Systems
ETS-200T
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
