Automatic Test Systems
execute test program sets automatically. Also known as: ATS
See Also: Automatic Test Equipment, ATE Integrators
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Product
Handset Noise Under RF Test System
BK8021
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If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
START-1000 Start/run Up Time Test System
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Hangzhou Everfine Photo-E-Info Co., LTD
Start-1000 can be used to record the start rise time and waveform of the light source in real time, and according to the design requirements of the EU directive 1194/2012, Energy Star and the international standard IEC60969, etc., it is specially used for LED lights, lamps and energy-saving lamps. And it can also be used to measure the photometry parameters of stable light sources.
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Product
Electronic Ballast Automatic Test Equipment
ATE-1
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Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
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Product
Discrete Devices High-speed Testing System
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QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Product
Spectrophotometer & Integrating Sphere Test System
LPCE-1
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This Test System is suitable for photometric and colorimetric measurement of luminaries such as Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps), CCFL and LED. The measured data meets the requirements of CIE and IES LM-79 for the measurement of photometry and colorimetry.
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Product
Automatic testing with National Instruments TestStand
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TestStand from National Instruments is standard software for automated testing. Complex, variable test systems can be built here by integrating various hardware and software modules (e.g. LabVIEW VIs, C # modules). We can easily integrate created LabVIEW VIs into TestStand for a product-specific test sequence. All functions that are required for an automatic test sequence are available. Parameters can be changed in the TestStand environment. The user interface can be adapted to your needs.
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Product
Basic Unit - Medical Equipment Functional Test Module System
GS-X
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The GS-X Testing System consists of a Basic Unit and various plug-in test modules which the user can purchase as required. The range of functions of these Module-Box is being continuously expanded, and presently includes functions for testing the following devices: - Infusion pumps, Cardiac pacemakers, Defibrillators, High-frequency Surgical equipment, electrical safety ECG Simulation, Equipment for electro-stimulation.
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Product
Test System
4003 TLP+™
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The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Product
Ionic Contamination Test Systems
CM+ Series
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The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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Product
Cable Sheath Testing and Fault Location System
Shirla
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Cable fault location with the BAUR shirla. Shirla the fault location system is used for cable and cable sheath testing as well as for pre-location and pinpointing of cable faults. The pre-location based on the measuring bridge principle according to Murray and Glaser that is designed especially for power cables, also enables pre-location for control and lighting cables. Null balance and evaluation take place automatically.* Cable and cable sheath testing up to 10 kVC* Resistance measurement* Cable and cable sheath fault pre-location with precision measuring bridge* Adjustable cable sections that can be defined with length, conductor cross-section and material respectively and can be considered in the distance calculation
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Product
Battery and DC System Testing
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HAOMAI Electric Test Equipment Co., Ltd.
Testing for battery and DC power systems.
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Product
Meter Test System
MTS-50
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Kongter Test & Measurement Co., Limited
This meter test equipment features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 50A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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Product
Automatic Voltage Transformer Comparator
KATC-V2
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Knopp’s KATC-V2 is a highly accurate state-of-the-art voltage transformer comparator that is compatible with all older generation Knopp comparators, and is designed to be a direct, plug-in replacement with additional test set cables to fit in the existing Knopp Voltage Transformer Test Systems.
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Product
Solar Test Systems
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AMETEK Scientific Instruments manufactures a range of application specific XM (Xtreme Measurement) products focused on solar cell / photovoltaic research (developed in collaboration with Professor Laurie Peter of the University of Bath, UK). These products are so versatile that they can also be used for photoelectrochemical (PEC) water splitting applications; and make use of Solartron’s unique high performance XM specified potentiostats and frequency response analyzers to provide a full complement of techniques for research into energy, corrosion and analytical electrochemistry.
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Product
Flying Probe Test System
A8a
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The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Product
High Voltage AC Test Systems
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Our range of high voltage AC test systems cover from 5kVac to 100kVac. All units have a variable trip range setting and key lock operation to prevent unauthorised use. Applications include testing of insulation systems and measurement of break down voltage of electrical plant and components.
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
EV Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
5V cell equipment adopts Sinexcel innovative circuit design + high-speed DSP complex algorithm, the detection process supports multi-gear switching; The equipment integrates voltage, temperature, pressure and other auxiliary channels, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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Product
SF6 Gas Online Monitor Test System
KVXJ
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KV Hipot Power Test Equipment Co.,Ltd
KVXJ SF6 Gas Online Monitor Test System is mainly applied on 35KV SF6 500KV, 220KV, 110KV GIS in the substation to monitor the SF6 gas leakage in the SF6 combined electrical equipment room environment and the oxygen content in the air in real time.
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Product
Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
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*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Product
Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Product
Cell, Battery, And Module Test Systems
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Maximize your testing capabilities with Maccor's hardware and software. Our comprehensive turn-key systems come bundled with all the essentials to jumpstart your testing process. Select from multiple options and configurations to match your requirements.
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Product
Embedded System Test Automation Software
ECU-TEST
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ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
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Product
Multi-Function Test & Measurement System
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Optoplex’s Multifunction Test and Measurement System (TM100 Series) is designed to provide a flexible and cost effective optical test and measurement solution, particularly for manufacturing lines. The mainframe can be mounted in 19” rack or stationed on desk-top for ease of use. There are many selections of the pluggable modules, from tunable laser, optical spectrum analyzer, EDFA, power meter, ASE light source, optical tunable filter, optical performance monitor, …, etc.
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Product
Physical Testing Test
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Physical Testing by Aero Nav: mechanical, weathering, environmental, immersion, electrical, luminance, thermal analysis, thermal conductivity, water exposure, saltwater exposure, etc.
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Product
Dual-Vision Camera for Automatic Incident Detection
ITS-Series Dual AID
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FLIR ITS-Series Dual AID cameras combine best-in-class thermal and visual imaging technology with advanced video analytics to provide a complete solution for automatic incident detection, data collection and early fire detection. FLIR’s traffic video analytics have proven their effectiveness worldwide along highways and in tunnels and are now combined with the power of thermal imaging that allows traffic operators to see clearly in total darkness, in bad weather and over a long range.
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Product
Airbag Test System
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Dongguan City Simplewell Technology Co. Ltd.
Airbag Test System by Simplewell
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Product
VFTLP+ Test System
4012
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The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
