Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
- Pickering Interfaces Inc.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Integrated Development Environment for the Creation and Execution of IEEE1641 Test Programs
SigBase
SigBase is an Integrated Development Environment for the creation and execution of IEEE 1641 test programs. It supports the development of tests using flow-charting techniques and the graphical design of signals using newWaveX. It includes fully integrated compilation and signal path allocation software that determines the appropriate instrument and switch path for each signal and test. The run-time system, which is also available as a separate product for use on multiple test stations, controls the operation of the ATS and can provide test results in ATML format.
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Counterfeit Defect Coverage Tool
The SAE Counterfeit Defect Coverage Tool is a dynamic, web-based application that supplements SAE Standard AS6171 authored by the SAE G-19A Test Laboratory Standards Development Committee. It provides potential test sequences for the identification of counterfeit electrical, electronic, and electromechanical (EEE) parts along a range of risk levels and EEE part types. Allowing users to compare alternative test sequences as a function of resources needed to implement those tests, the SAE CDC Tool is appropriate for those ordering counterfeit detection tests as well as those performing the tests.
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Copper Diffusion TestSystems
Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites...show more -
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Validation And Verification
Development tools from Keil are quality assurance testedusing a number of commercial and in-house test suites.
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Adapter/Stainless Steel
WADP-SFSF-01
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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EtherCAT Conformance Test Tool (CTT)
ET9400
The Conformance Test Tool (CTT) enables in-house testing of EtherCAT slave devices. The use of the CTT supports EtherCAT device development, helps to ensure conformance prior to device release and to prepare the device for the official, independent Conformance Test in an EtherCAT Test Center (ETC) accredited by the EtherCAT Technology Group.
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Test Automation Platform Developer's System
KS8400A
The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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Adapter/Stainless Steel
WADP-29F29F
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Custom Test Fixtures
Intrinsic Quality is proud to offer a variety of Test Fixture Development Services that include fixture building, tester interface building, harness building, troubleshooting, maintenance, design, and engineering. IQ’s fixtures are built to exacting specifications and configured to deliver quality production testing. Our global customers have trusted us for over 35 years to provide custom solutions applying leading edge technology. IQ consistently delivers cost-effective solutions with our client’s recognition and gratitude.
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SQL Test
If you want to do test-driven development for databases, SQL Test is the place to start. It lets you write database unit tests in T-SQL and run them in SQL Server Management Studio. It's simple to set up, you don't need extra tools, and you don't need to learn new technologies.
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Adapter/Nickel
WADP-NFSF
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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AUTOMATED TEST STAND DESIGN
Automated test systems may be as simple as a laptop with a DAQ module or a stand-alone controller, but they typically require a mix of off-the-shelf and custom hardware. All that hardware is integrated and wired into a test stand. Portable or mobile test stands are ideal for in-the-field research and development and servicing of multiple laboratories or manufacturing lines. Test stand access to the front panels of hardware and subcomponents allows manual configuration of non-automated settings. ...show more -
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Embed functional-test
ScanWorks Embedded Diagnostics
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.
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Adapter/Gold
WADP-SFSF
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Software Test Tool
testIDEA
The basic premise behind the development of testIDEA was simple: if our development tools have access to the source code and binary code of an embedded application, and our debug hardware can access all of the internal workings of the microcontroller, surely we can simply test embedded software on the target microcontroller.
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MEMS-Scanner Evaluation-Kit
The "QSDrive Scan Kit" evaluation kit enables small and medium-sized companies in particular to operate ResoLin components from the Fraunhofer IPMS in accordance with the specifications without the time-consuming in-house development of control electronics. The evaluation kit consists of a ResoLin component – a cardanic MEMS scanner with a linear axis and an optional, orthogonally oriented resonant axis – and control electronics that enable the components to be operated with an optimized traje...show more -
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PowerTrain Simulators
NMEA 2000
The Au NMEA 2000 PowerTrain simulators V1.00A release can generate majority of NMEA 2000 PowerTrain Controller Area Network (CAN) signals on a NMEA 2000 network. Au NMEA 2000 PowerTrain simulators are designed very easy to use. All editions run independently (without personal computer). It is widely used as valuable tools for any situation from product-line test, incoming inspection, business demonstration to product development and product validation.
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Ultra-Compact Immunity Tester
AXOS5
The AXOS5 is an ultra-compact immunity tester that performs all the most commonly used transient immunity tests, including Surge, EFT, Dips/Interrupts and AC/Surge Magnetic Field. The simplified user interface provides quick selection of tests and test levels, and even lets you change test parameters “on the fly” while running a test.The actual EUT power mains voltage and current are indicated in the display. Using the Electronic-Fuse function, the user can set an upper limit for EUT power mains...show more -
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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High Current Calibrator
MC151
MC151 Current calibrator is an accurate current source capable of 120 A. Typical uses include calibration of current sensors, current probes, current transformers, shunts, ammeters, DMMs or as stable current source for test and development applications. The calibrator is equipped with a built-in multimeter that can be used for simulation of programmable transconductance or current amplifier.
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Adapter/Stainless Steel
WADP-24M24F
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Electrolyzer Test Systems
Advanced Test System for Research & Development of PEM Electrolyzers
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Drop Weight Tear Tester
DWTT
Since the introduction of the Drop Weight Tear Tester - DWTT, materials have moved on. In particular, demands for high operating pressures of line-pipes and larger diameters have driven the development of higher strength steels. Forty years ago the work that led to the drop weight tear test was done on X52 steel (360MPa yield strength). Improvements in thermo-mechanical processing has yielded improvements of approximately 10,000psi per decade, to the point where the state of the art is now X100 steels, and the use of X120 steels is being considered.
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Function / Arbitrary Waveform Generators
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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HBR3 Video Analyzer / Generator for DisplayPort Testing
M41d
The Teledyne LeCroy quantumdata M41d HBR3 Video Analyzer/Generator for DisplayPort Testing is a compact versatile test instrument offering entry level functional testing that can be extended through software licenses to a full compliance tester with sophisticated analysis and diagnostic capabilities. The M41d enables design and test engineers to validate their products for interoperability and reliability for the DisplayPort 1.4 video interface. The M41d is a flexible test instrument that can be...show more -
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Test Program Development
Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Multi Channel Optical Fibre Verification
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
