- CAMI Research Inc.
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Connector Board for Cable and Harness Tester
CB49
Populated with solder pads to accept a suite of TE-Connectivity Micro-MaTch connectors, this board addresses markets plagued by vibration and fretting corrosion, and requiring "miniaturized connectivity". Rated to 500Vdc/350Vac, the CB49 may be used on all CableEye models. The CB49, sold without connectors, contains nine sets of 20 solder pads accommodating numerous configurations of Micro-MaTch connectors.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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MIT Folding Tester
DRK111A
Shandong Drick Instruments Co., Ltd.
DRK111A MIT folding tester is designed according to relevant standards and adopts modern mechanical philosophy and computer processing technology. It has LCD display function, various parameters setting function, conversion, adjust, memory, printing and other functions.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell...show more -
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Application Level Tester
The application tester tests the memory devices such as graphic memory and HDD buffer memory in a specially designed condition made similar to actual PC and Server environments. In fact the graphic memory has releatively higher speed, test expense and quality standard compared to main memory, stressing the importance and the need of the application tester.
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Memory Burn-in Tester
B6700 Series
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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SNAPSHOT
PH-200
The Snapshot cable checker gives professionals and layman the ability to check cables instantly upon plug-in, with no buttons pressed or displays read. With its built-in memory, the Snapshot simply checks each cable plugged in against a correctly-configured cable pre-set by the user, and indicates the cable’s status with a sound. For pin-by-pin cable checking, the 〝standard check〞mode offers a plain LED-displayed check of the cable’s pins, checked automatically or manually. The...show more -
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Audio Cable Testers
AudioJog Pro 3
Audio cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection .
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CT Ratio/Burden Tester
1047
TESCO’s new CT Ratio/Burden Tester (Catalog No. 1047) is a lightweight, portable and highly accurate in-service test set to assist in finding lost revenue by testing the accuracy of your meter circuits. The Tester can help determine if there are installations errors, loose connections, incorrect ratios, resistance buildup, open CT’s, or manufacturers defects. The CT Ratio/Burden Tester measures and displays the primary and secondary current of the CT under test, and the ratio of the currents. All test data is stored in the internal memory and easily uploaded to a PC.
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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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0-5KV Digital Hi-pot Tester 0-5KV
7110
Shenzhen Chuangxin Instruments Co., Ltd.
Programmable AC/DC withstand voltage tester Feature: Small volume, light weight Easy to operate, has keyboard lock function Provide 5 groups memory setting, each group has four kinds of work mode
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Memory Tester
RAMCHECK LX DDR3
Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Protective Bonding Testers
RMO-E Series
The RMO-E instruments are designed and ideal for testing protective bonding (grounding) of equipment following the standard IEC 61010-1. Also, they can measure the resistance of high, middle and low voltage circuit breakers, high-current bus bar joints, cable splices, and welding joints. The instruments accurately measure not only in factory environments but also in high-induction fields and substations.Both models generate a true DC ripple-free (less than 1 %) current with automatically regulat...show more -
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SD Host Tester / SD / EMMC Analyzer / SD Card Tester
SGDK320A (SD Host Tester)
SGDK320A (SD Host Tester) is a product that has the functions of SD emulator (SD Emulator), host tester (Host Tester), SD analyzer (SD Analyzer), and eMMC analyzer (eMMC Analyzer). Supports SD Memory Card Physical Layer Specification Version 3.01. It covers the test contents of Test Specification Ver3.00 and Supplement Note. Supports SDR104 and eMMC ver4.41 (analyzer).
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USB TESTER, 3-9V, 3A, WHITE
72-13540
*USB tester inspects USB charger & portable power source*Lightweight and portable*LCD backlight*High/low output voltage warning*10 sets of data memory
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Handheld Metal Hardness Tester
TIME®5330
Beijing TIME High Technology Ltd.
Handheld Metal Hardness Tester TIME®5330 is loaded with 4.3 inch LCD screen and a large memory of 2000 groups of data. Built-in conversion table enables you to read HB value directly if D/DC impact devices are installed.
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Optical Power Meter & VFL
TM263
◇ Self Calibration◇ Set the Auto Off◇ Wavelength Memory function after turn off the tester◇ High Accuracy, high ,High sensitivity, high linearity◇ Stable VFL Output◇ USB Charge port◇ FC,SC Connector◇ 18650Li-ion Battery◇ Lower power consumption design, long standby time◇ Rubber Out shell, increased the protective properties for field work
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization pro...show more -
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Test Adapter
Ramcheck 100
This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Network Cable Tester
LightingJoG Rack 8
Sensational 19 inch 2U rack mount Lighting/Network cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection.
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Crush Tester 350
DRK113
Shandong Drick Instruments Co., Ltd.
DRK113 Crush Tester 350 is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance. The instrument have parameter testing, adjusting, LCD digital display, memory, printing function.
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Digital/Pattern/PE Card
QSPI
The QSPI represents a multi-function of performanceand capabilities for PXI-based digital instrumentation.The QSPI offers high performance pin electronics and 4I2C masters and 4 32bit counter 4 clock generator in acompact, 3U PXI form factor. Each card can function asa quad sites I2C/SPI device tester, multiple cards can beinterconnected, supporting up to 64 sites. The QSPI alsosupports deep pattern memory by offering 32M of onboard vector memory with dynamic per pin directioncontrol and with test rates up to 10 MHz.
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Portable Force/Displacement Tester
The FSA-MSL Mini Material Tester is a portable force/displacment tester. The FSA-MSL is ideal for tests requiring very small movement, like switch tests. The tester also features a reversible base plate, allowing the tester to be used on uneven or obstructed surfaces. The highly visible EL display and plain language menus in eight languages make programming fast and easy. Both force and displacement values are displayed plus user-selectable data; high/low setpoints, peak, memory data, etc.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Optical Power Meter & VFL & RJ45 Network Test
TM263N
◇ Added Network Cable Test ◇ Accurately test whether a single network cable transmits signals normally ◇ Self Calibration ◇ Set the Auto Off ◇ Wavelength Memory function after turn off the tester ◇ High Accuracy, high ,High sensitivity, high linearity ◇ Stable VFL Output ◇ USB Charge port ◇ FC,SC Connector ◇ 18650Li-ion Battery ◇ Lower power consumption design, long standby time ◇ Rubber Out shell, increased the protective properties for field work
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Memory Tester for DDR4 DIMMS
RAMCHECK LX
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Downloading Multifunction Tester
ET4500
The new ET4500 tester carries out all the tests needed to verify the safety of electrical installations in domestic, commercial and industrial wiring installations in accordance with the latest regulations.
can be used to carry out 3 wire earth testing and has on board memory to store and download all installation test results for documentation.
Everything about the new ET Series has been designed to save time and make testing easier.Fast, reliable high current and non-trip loop testing comes as standard together with a high level of input protection and a CAT IV safety rating .Supplied with a full range of accessories.
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Folding Tester
DRK111B
Shandong Drick Instruments Co., Ltd.
DRK111B Folding Tester is designed according to relevant standards and adopts modern mechanical philosophy and computer processing technology. It has LCD display function, various parameters setting function, conversion, adjust, memory, printing, and other functions.
