Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Product
Beam Directional Power Supply Mains 60 To 180 kV
SiteX D1802
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Our SITEX and SITEXS are capable of the direct and accurate measurement of high voltage. This essential information enables the control system to guarantee the stability and reproducibility of the radiological parameters based on true high voltage, ensuring extremely precise measurements-based utilization.
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