System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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PCI High Density Potentiometer Card 1-Channel, 24-Bit, 0 To 16M Ohm
50-296A-021-1/24
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Connector Test
A connector test system which provides expansion of up to 160 Kelvin pair connections. The system incorporates high voltage AC and DC power supplies with a maximum output of +/- 2100 Volts peak for Hi Pot, Insulation resistance measurement. LCR bridge control is provided with 4 terminal multiplexing in order to add precision capacitance, inductance and resistance measurement capability. An integral H.V. capacitor bias option permits capacitance measurement to be made at up to 2.1kV.
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Test Finger Apparatus
SCR ELEKTRONIKS focuses on designing a solution around the end use at her customer. Instead of offering a standard instrument for a specific task, we have an approach of customizing the test bench to target the specific goals of the process or test procedure. Our measurement instruments, test modules, electrical power systems & software libraries are developed with this vision, thereby reducing the test system’s time-to-deploy.
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Development Software Suite
JTAG ProVision
The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.
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Complete Transformer Test Bench
Weshine Electric Manufacturing Co., Ltd
Our multifunction Transformer Test Bench (VS-ZHSY Series) is intuitive with all of the ease of working with individual, dedicated instruments. We deliver this experience through our design philosophy. Rather than producing a single, complex system with afterthought towards rendering it friendly, we uniquely combine several intelligent instruments packaged as a single system.
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FET Solid State Switch, 300 kHz to 8 GHz, SPDT
U9397A
The Keysight U9397A solid state switch maximizes your frequency range from 300 kHz up to 8 GHz, offering excellent performance with high isolation, low SWR and fast switching speed. Applications include instrumentation, communications, radar, and many other test systems that require high speed RF and microwave SPDT switching.
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Engine Test Systems
Dynas3
Dynas3 Machines are specially suited for use in engine test stands. The AC machine, variable frequency drive with test stand controller and safety module are tuned to one another to form a system that has proven itself many times over. It can be used in any type of development and function test stand. The applications range from simple test stands for steady state operation up to sophisticated test stands for dynamic test cycles. Nearly every application in the field of engine testing can be performed on a test stand with DYNAS3.
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Standard IR Target Projectors
Santa Barbara Infrared’s 14000Zi Series reflective infrared target projectors are turnkey test systems for electro-optical (E-O) testing of FLIRs and other infrared (IR) imaging systems. The standard target projectors are assembled from SBIR’s STC Series Collimators, Infinity Blackbodies and 300 Series Target Wheels. SBIR also offers a standard athermal target projector with a 5.7° field of view (FOV).
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 31.5Ω
40-251-110
The 40-251-110 is a programmable resistor module with 4 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Generator Insulation Resistance Tester
WA2670
Wuhan Sangao Electrical Test Installations Limit Co.
WA2670 series insulation resistance testing instrument is special use for internal water cooling generator's measurement test. Meanwhile, can also be used in laboratory or field insulation test.20mA.5000V. The output current is greater than 20mA,Maximum output voltage is 5000V.With high precision micro current measurement system, digital boost system.Only need a high-voltage line and a signal line connecting the sample can be measured.Only need a high-voltage line and a signal line connecting the sample can be measured.Automatic measurement, the results from the large screen liquid crystal display, and the results are stored.
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PXI 5W Programmable Resistor Module, 2-Channel, 2Ω to 13.6Ω
40-252-031
The 40-252-031 is a programmable resistor module with 2 channels which can be set between 2Ω and 13,6kΩ with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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Obsolete ATE, Replacement Systems
No one likes saying goodbye to a faithful old friend but now that the economy is on the up, has the time finally come to replace your ageing Automatic Test Equipment (ATE) or Special to Type test system?
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PXI 5W Programmable Resistor Module, 2-Channel, 1.5Ω to 3.55kΩ
40-252-023
The 40-252-023 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 3.55kΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Analyzers
BA500 Series
The BA500 analyzers are high performance battery analyzers with charge and discharge capabilities. The analyzers connect to your computer via USB and the BA500WIN software program is used to control the analyzer and battery under test. This system has a fast data collection system allowing you to collect and view as much data as required. Once you collect this data you can graph, analyze & save it.
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ACCUplace Position Grid
AP-P Series
The AP-P is a unique calibration target that is designed to test the position and/or recognition ability of a vision system. The matrix of small scales, precisely positioned in a grid matrix format, makes testing for subject recognition and system positioning simple.The overall target is comprised of a matrix consisting of 6.0mm x 6.0mm square individual components each having a 5.0mm x 5.0mm X & Y Scale with 0.100 divisions. The scale has pitch accuracy of 1μm. The AP-P is available on two standard materials; Chrome on Glass (CG) and Chrome on Opal (OP).
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Test Adapters / Aeroflex Test System
52xx / 5300
We develop and manufacture test adapters for your existing interface including documentation and test program
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PCI Programmable Resistor Card 2-Channel 2.5 Ohm To 1.02k Ohm - SPST
50-294-121
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI Expandable 16x16 RF Matrix 75Ohm Type 43
45-720A-711
The 45-720A module is a 6U 16x16 RF Matrix suitable for switching frequencies to beyond 250MHz. The 45- 720A module is available in 50 and 75 Ohm versions with a choice of coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximises isolation and RF performance.
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200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PV-IV Solutions
We offer a broad range of PV IV Measurement systems for measuring solar cells from 3 mm to 300 x 300 mm. The wide range of solar simulators, vacuum chuck test stations, and electronic loads make it impossible to list “standard solutions” Most systems are put together for individual customer needs based on cell type and contact geometry of the devices being tested. Over the last several years we have designed and manufactured a wide range test solutions for many different types of cells and contact geometries. In most cases a customized solution is no more than a slight customization of a standard platform that has been previously designed.
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Test Benches DC
Combined with a power source system e.g. MTS750 this test bench is used as a DC meter test system with 40 test positions.
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JIS/ASTM Standard-Compliant Plastic Bending Test System
Testing of Plastic in Accordance with JIS, ISO and ASTM Standards Can Be Performed
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module
784192-01
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
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1x4 Optical Switch Module
81595B
The plug-in module for Keysight's Lightwave Solution Platform 8163B, 8164B, 8166B is ideal for flexible system configuration in applications such as transceiver/receiver test with small foot-print or multiple passive component test with complex cascade.
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Dust Chamber Manufacturer
Wewon Environmental Chambers Co, Ltd.
Wewon Environmental Chambers Co., Ltd. is a good dust chamber manufacturer and made a 3380 liters blowing sand and dust test chamber for a Vietnam customer last week. The controller system of this 3380 liters dust test chamber can be connected to the computer.
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EMI and EMC Test System
EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
