System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
Midirack - 120 x 60 x 80 cm
OTP2-Modul-Nr002
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The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 120 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Product
PXI/PXIe MEMS RF Multiplexer, Dual 4-Channel, 4GHz, 50Ω, MCX
42-878-222
Multiplexer Module
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Product
Resistors
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A passive two-terminal electrical component that implements electrical resistance as a circuit element. In electronic circuits, resistors are used to reduce current flow, adjust signal levels, to divide voltages, bias active elements, and terminate transmission lines, among other uses. High-power resistors that can dissipate many watts of electrical power as heat may be used as part of motor controls, in power distribution systems, or as test loads for generators. Fixed resistors have resistances that only change slightly with temperature, time or operating voltage. Variable resistors can be used to adjust circuit elements (such as a volume control or a lamp dimmer), or as sensing devices for heat, light, humidity, force, or chemical activity.
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Product
Test for Pacemakers
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VXI-based functional test system for testing implantable medical electronic products. The system is equipped with a Virginia Panel Series 90 adapter interface and can be operated standalone as well as on handling systems. Based on the previously developed matrix-based standard architecture, a large number of systems were supplied. The system function can be verified at any time via an automated self-test.
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Product
Fixed Laser Source Module
Laser Source
Keysight offers a broad choice of fixed laser sources, which are available as single-wavelength and dual-wavelength modules as part of the Keysight Lightwave Solution Platform. The Keysight 8165xA Fabry-Perot laser sources can be used in conjunction with optical power meter modules for insertion loss, optical return loss and PDL measurement of broadband components and fiber. The Keysight 81663A Distributed Feedback Laser Sources are best suited for amplifier test and WDM system test applications. Keysight covers PON and common WDM wavelengths with its 81663A Distributed Feedback (DFB) laser source modules. The precise tunability around ITU-grid center wavelength gives you the flexibility to match test setups to the latest requirements of the DWDM-system. The fine-tuning allows to shift the center wavelength from one DWDM transmission channel to the adjacent channel in dense WDM systems. The built-in isolator ensures highest laser stability, even when reflections are present in the optical path.
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Product
COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
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CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Product
PXI Precision Resistor Module 9-Channel, 1 to 239
40-297-113
Programmable Resistor Module
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
High Efficiency, Low-Cost Test for Less Complex Signal Devices
J750Ex-HD Family
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Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them. With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.
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Product
Semiconductor Test Platform
Diamondx DxV
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The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:
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Product
Mini Rack 60*60*60cm
OTP2 module no.001
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The rack serves as the basic structure for your individually designed test system. Various OTP² modules can be installed in the 60 x 60 x 60 cm rack in order to implement a wide variety of test requirements.
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Product
Electronic Loads
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Chroma Systems Solutions, Inc.
Power conversion testing for automated test systems, LED drivers, power supply testing, battery testing, and much more.
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Product
PXI Precision Resistor Module 6-Channel, 3 to 5.82M
40-297-052
Programmable Resistor Module
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PXI 2.5W Programmable Resistor Module, 2-Channel, 2.5Ω to 201kΩ
40-251-041
Programmable Resistor Module
The 40-251-041 is a programmable resistor module with 2 channels which can be set between 2.5Ω and 201kΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Battery Checker
SK-8551
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Total condition check for 12V (24V) batteries. (Truck, Marine, Industry etc.)Battery check, Engine start performance, Charging system tests.
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Product
Battery Cycle Test Systems
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Chroma Systems Solutions, Inc.
High precision, integrated battery charge / discharge cycle test systems designed for lithium ion and other chemistries and applications including EV batteries and energy storage systems. Chroma’s battery test equipment provides advanced features including regenerative discharge systems that recycles energy from the battery back into the channels in the system or to the grid. Systems are configurable and flexible with multiple channel capabilities that can be upgraded as testing requirements change.
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Product
PXI Programmable Resistor Card 4-Channel 2 Ohm to 63.7 Ohm
40-294-011
Programmable Resistor Module
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
PXI Resistor Module 2-Channel 2R to 131k with SPDT
40-293-134
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
Modular Laser Diode Test System (PXI/PXIe)
LTS8620
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The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Product
High Voltage Test Station
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High-voltage test stations place high demands on the safety aspect. We design these test stations in cooperation with our manufacturers as self-sufficient test systems.
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 470Ω
40-251-114
Programmable Resistor Module
The 40-251-114 is a programmable resistor module with 4 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
AMIDA 3KS Tester
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The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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Product
Air Data Test Set System
B511
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The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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Product
9050TR - 50 Module, 2-Tier Solution with Platform
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The rack mountable 9050TR receiver is designed to accept 9025 and 9050 ITAs and is essential to support advanced mass interconnect requirements. This 50-module solution can be adapted to accommodate vacuum or mechanical fixturing. Connector modules can also be intermixed to establish custom interfaces which are ideal for functional and system testing applications.
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Product
PXI Precision Resistor Module 4-Channel, 1.5 to 3.55k
40-297-123
Programmable Resistor Module
.This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 5.82MΩ
50-298-152
Programmable Resistor Module
The 50-298-152 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 5.82MΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Test Engines
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Verified Systems International GMBH
The test system cluster architecture is based on dual CPU or 4-CPU PCs acting as cluster nodes. The nodes communicate and synchronise over a high-speed network (Myrinet or InfiniBand). A modification of the Linux operating system allows to run the test execution and evaluation algorithms in hard real-time on reserved CPUs, where scheduling is non-preemptive and controlled by the test system itself. The interrupts caused by interfaces to the system under test may be relayed to CPUs designated explicitly for their handling. This approach offers the opportunity to utilise high-performance standard hardware and the services provided by the widely accepted Linux operating system in combination with all mechanisms required for hard real-time computing. The cluster architecture presents an opportunity to distribute interfaces with high data throughput on different nodes, so that PCI bus overload can be avoided. In addition, the CPU load can be balanced by allocating test data generators, environment simulations and checkers for the behaviour of the system under test ("test oracles") on dedicated CPUs.
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Product
PCIe 3.0 and 4.0 Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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High Voltage Surge Testers
HVST
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The most important features of the surge tester are its ability to test the entire winding insulation system. A high voltage surge generates turn to turn, coil to coil, and phase to phase voltage stress, as well as ground insulation stress. When used as a dielectric test, accurate voltage readings are essential. The HV Surge Tester monitors the voltage directly across the winding under test. This voltage is displayed on an oscilloscope and recorded on the Pass/ Fail LED latch monitor. This voltage will be accurate despite the impedance of the winding being tested. The insulation system can be tested way above the operating voltage because of the brief duration of the applied voltage test pulse. This allows faults to be detected long before they become apparent at operating conditions.
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Product
PXI RF Analog Signal Generator
Signal Generator
PXI RF Analog Signal Generators deliver the functionality of RF signal generators to the modular, compact PXI form factor. These modules support frequency ranges from 250 kHz to 20 GHz. You can combine PXI RF Analog Signal Generators with other PXI modular instrumentation to design automated test systems for radar, RF integrated circuits (RFICs), and automotive test applications.
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Product
Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
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Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
