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Analog Test Solutions
ATX series
The ATX series of instruments are designed for applications that require an analog performance that is not achievable with industry standard platforms like PXI(e).
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Digital and Mixed-Signal Test Solutions
A digital device processes electronic signals that represent either a one (on) or a zero (off). The ‘ones’ and ‘zeros’ represent data. Each one or zero is referred to as a bit and a group of 8 bits equals a byte
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Three-Phase Relay Test Equipment
AK-10
The new AK-10 three-phase relay test equipment from Amperis features AC and DC Voltage Source ; AC Current Source ; AC/DC Auxiliary Power Source ; 8 possible configurations.
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Functional Test Service
Testing House provides all Software and Hardware needed to implement a complete Functional Test.
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EMC Test Chamber
Imagine being able to test whatever you want, whenever you want. No more delays or travelling to external parties. Owning an in-house test chamber lets you control every aspect of testing while meeting all relevant EMC test standards and criteria.Fast. Reliable. Worry-free.
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Ozone Aging Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
Sanwood , a 23 years of professional Ozone aging Chamber,Ozone aging Test Chamber, Ozone resistance test chamber, Ozone chamber,Ozone test chamber, manufacturersOzone Aging Test Chamber simulates and enhance the condition of ozone in the atmosphere to study the effects of ozone on rubber, and then identify and evaluate the method to resist ozone and aging for rubber, adopt effective anti-aging measures to enhance the life of rubber products.
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Mechanical Test Fixtures
MMI series man-machine interface
Designed to meet the needs of the most discerning customers and the latest market demands, our MMI series guarantees a natural posture for both the operator and the sitting position when performing the test on the adapter. The newly developed lever mechanism, which has been registered as a utility model, is specially adapted to the hand movement of its employee and ensures a heart-loving strain on the operator.
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High-Voltage Test Device
PGK 150 / 5 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK H. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing...show more -
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Special Test Equipment
Complex products require demanding and versatile test systems capable of complex test cycles. The final objective is to ensure the validation of the final product during the different stages of the production process.
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Signal Integrity Test Products
RoBAT SCARA-TDR-M
*Fully automatic TDR tester for bare and assembled PCBs*2 – 24 Port Ultra-compact TDR units*Full range of TDR tests and measurements available*100% test in a production environment*Custom modules with automatic tool changer
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Test Module
MSM
The MSM measures and stimulates precise voltages and currents through the six bus lines or interface pins.
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Multi-Tone Test Systems
AR RF/Microwave Instrumentation
AR’s state-of-the-art multi-tone systems are designed to test RF Radiated and Conducted Immunity faster than ever before. Both the MT2IEC10V3M and MT4IEC10V3M fully comply with IEC 61000-4-3:2020 Edition 4, allowing for multiple tone testing, reducing test time by up to 74%. Commercial, aviation, and automotive industries, will perform RF radiated and conducted immunity testing faster, more accurately, more efficiently, and more closely to a real-world environment.
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Temperature Chambers For Thermal Tests
Before anything reaches out for market distribution, you would need to determine its exact quality and performance to that follows to the point with readings. Thermal and environment testing are some of the most positive aspects to get your materials tested for their underlying performance capacity and reliability in quality.
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Fine Pitch Test Probes
Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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High Parallel Test Handlers
High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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Electrodynamic Shock Test System
FS SERIES
The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
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Test Management Platform
Comprehensive suite of test management products fosters global project team collaboration, drives down costs, shortens release cycles, and provides real-time visibility into the status and quality of the software projects. Manage all aspects of software quality; integrate with JIRA and various test tools, all within the enterprise. Manage all aspects of software quality; add test management capabilities right inside JIRA.
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Manual Test Press Fixture
750/752 Series
RTI's manual test presses are compact, portable, all-inclusive, and easy to use. Single lever operation and 100% vertical compression makes the manual test press an ideal solution for PCB, hybrid module, and high pin count device-level testing when complex test requirements cannot be met with a test socket and breakout board alone.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Integration of Inline Test Systems
The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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Test Lead Set
34138A
The Keysight 34138A test lead set for digital multimeters contains fixed sheath banana plugs. The Keysight 34138A is compatible with the 34460A, 34461A, 34401A, 34405A, 34410A, 34411A, L4411A, and U2741A digital multimeters. 34138a is not compatible with 3458A instead use 34137A with 3458A.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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AVL Battery Test Systems
Supplied as either a free-standing test rig or as a containerized solution, the battery test system supports the evaluation and life-time investigation of electrochemical energy storage systems used in hybrid and electric vehicles.
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Digital Test Hammers
James Instruments? digital test hammers are an advanced, completely automated system for estimating concrete compressive strength. Its calculation, memory and recording functions allow for quick, easy and accurate test results.
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Universal Launcher Test Set
TS-217
The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Ad...show more -
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Digital Incircuit Test
PFL780/760
The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Low Pressure/Temperature Test Chamber
Dongguan City Simplewell Technology Co. Ltd.
Low Pressure/Temperature Test Chamber by Simplewell