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Scope of Testing
As of January 2018, the BACnet Testing Laboratories Working Group (BTL-WG) updated the BTL Testing Policies to state that all BACnet functionality in a product requires testing for BTL Certification of the product.
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Surface Insulation Resistance Testing
Following over 2 years of intense research and development, we are proud to introduce the next generation of equipment used to measure changes in Surface Insulation Resistance.
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Turret Kelvin Test Contactor
cHybrid
cHybrid™ Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multi-beam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.cHybrid Kelvin contactor with multi-beam contact spring architecture delivers improved yield and long life minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.
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Flight Test Instrumentation Software
TTCWare
Curtiss-Wright Defense Solutions
TTCWare is a data acquisition system configuration and programming application. Using TTCWare, you can customize the behavior of your hardware and create parameters to sample data. Parameters can be inserted into the PCM format at user specified locations in order to achieve desired sampling rates. After creating a PCM format, you can program your hardware with your customized configuration.
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Luggage Testing Machines
Dongguan Kejian Instrument Co., Ltd.
This machine, which is designed according to QB/T2918-2007, is applicable to the impact test of various plastic luggages.
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Stability Test Chambers
It provides outstanding stability testing performance for manufacturers of pharmaceuticals, cosmetics, food, and personal care products.
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EMI and EMC Compliance Testing
Compatible Electronics has evolved into one of the biggest and most experienced testing and consulting companies in California. All this experience has made us keenly aware of your EMC/EMI needs.
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Deoxynivalenol Testing Solutions
DON
Deoxynivalenol (DON) is also known as vomitoxin because of its impact on livestock through interference with animal growth and acceptance of feed. DON has been implicated in moldy corn toxicosis of swine. DON is often present with other mycotoxins and has been isolated from grains and feeds throughout the world at levels as high as 92 ppm. Because of concerns about DON, the United States FDA has instituted advisory levels of 1 ppm for wheat products for human consumption, 5 ppm for grain product...show more -
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Performance And Quality Testing
Underwriters Laboratories Inc.
Our endless pursuit of the truth helps you provide trustworthy answers to questions about products, processes, facilities and systems. Our testing, certification and verification services—and the UL Mark—provides regulators, purchasers and consumers with the information they rely on to confidently make the decisions that impact your business. Our quality assurance checks help to ensure that components and products meet your—and your stakeholders’—demands.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Telecom Test Systems
4301 Series
The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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BACnet Compliance & Certification Test Package
BACnet is the global standard for interoperable building automation solutions, and it works best when all products in a system are correctly implemented. Ensuring products are correctly implemented is the mission of The BACnet Testing Laboratories (BTL) Certification program.
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Function Test Systems & Equipment
Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.
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UDP Test Tool, Flood Generator, VoIP Readiness Test Tool
The Multiprotocol Network Tester is a freeware, open source tool which enables you to measure quality of your IP network. It can also be used to generate UDP flood or to simulate UDP DoS attack. SIP call is usually established using a SIP session with a bidirectional RTP stream. SIP and RTP protocols are based on UDP transport protocol. UDP uses a simple transmission model without implicit reliability, ordering and data integrity. Each single UDP packet is transferred independently. The quality of a SIP call depends on delays and loss of IP packets in a network. Long delays lead to large RTP jitter and bad sound quality of a SIP call.
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Electrical Test Calibrators
The electrical test calibrators from Time Electronics are designed for rapid calibration of various electrical test equipment. Portable calibrators include the InsCal models for insulation tester calibration and the PatCal for calibration of portable appliance testers.
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Power device test system
This system is suitable for DC testing of IGBT, IGBT module (1in1～7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current
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In-Line RF Test Station
AP770
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Inducitive Switch Transient Test Circuit
NSG 5071
The basic philosophy of this test circuit is better reproducibility of actual switching transients. The reproducibility of this test circuit comes not from the output characteristics as in traditional conducted automotive immunity tests, but from a fixed design of the generator using several pre-defined components. Many of these components are defined in the standard as "critical" with no substitutions allowed. These components are used as required in the standard.
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Injection Pump Test Bench
Nanyang NanTai Experimental Equipment Co.,ltd
It adopts advanced frequency conversion technology and digital technology with automatic and manualdouble control for the rotation speed, temperature and count.Equipped with displacement sensor, it can test different kinds of mechanical fuel
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Valves Testing Equipment
A PD or PHD Pinhole Detector is ideal as it has an audible alarm which sounds when a fault is found. Additionally, the test voltage can be set accurately, which is particularly important when testing thin linings. A DCCT mains-powered porosity tester can be used if the process needs to be incorporated into a production line
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Thermal Shock Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Thermal Shock Chamber provide the sudden temperature changes between extreme cold and extreme hot from -65℃ to 150℃ (customized available), specially for environmental stress screen test of the industries that rely on thermal testing, such as component, board electronic assemblies, defense, material stress, consumer products etc. The thermal shock test can cause faulting or cracking by the expansion and contraction on the products, indicates the hidden manufacturing defects. Bell’s Thermal Shock Chamber ensure you to launch qualified product to the market.
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Photovoltaic/Inverter Test & Automation Solutions
Chroma Photovoltaic/Inverter Test & Automation Solutions
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Test Automation
TetraMAX®
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
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Flammability Test Chamber
Shenzhen Bonad Instrument Co., Ltd.
BONAD’s flammability test chamber complies with IEC 60950, IEC 60695, IEC 60112, IEC 60332 and other standards. We not only provide standard wire and cable combustion test equipment and leakage tracking test equipment and other electrical test equipment as well as a variety of different combustion test equipment, but we also provide customization and can develop professional and high-quality test equipment according to test requirements. For more information, please contact us, BONAD will provide you with professional technical advice and high-quality testing equipment.
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EMI EMC test Solutions for Emission
Scientific Mes-Technik Private Ltd
EMI EMC test Solutions for Emission
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Chloride Ion Test Kit for Water
134W
The Elcometer 134W is used to monitor recycled water (after it has been applied) to establish effectiveness of salt removal, this test is ideal for testing the salt contamination in wash water and blast water.
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Functional Test
Functional test systems offer users the ability to test boards in a real world environment, checking that they function as designed by stimulating inputs and monitoring outputs. Often whole suites of boards have similar functions and this is where a generic functional tester offers large benefits over more bespoke solutions.
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Pump Testing in Repair and Maintenance
Test field for dry installed and submerged centrifugal pumps as acceptance test field in maintenance
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System Level Test
SLT
As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
