Showing results: 526 - 540 of 867 items found.
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MTS-209 -
Marvin Test Solutions, Inc.
The MTS-209 is a state-of-the-art portable test set for various armament systems used on the F-16, F-15, F-18, TA-50, FA-50 and additional aircraft. The MTS-209 supports a wide range of Alternate Mission Equipment (AME) including launchers, pylons, and racks. It combines the test capabilities of an I-Level test set in a compact, rugged, flight-line qualified enclosure. The MTS-209 performs parametric functional tests on AME components including Launchers (LAU-117, 16S210, LAU-127,, LAU-128, LAU-129, LAU-7,etc.), bomb racks (MAU-12, MAU-50, SUU-20, TER-9, etc.), Remote Interface Units (RIUs) and Pylons. The MTS-209 can also test MIL-STD-1760 aircraft stations and weapon systems.
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8019-1 -
VECTOR Electronics and Technology, Inc.
Single sided board, circuit pattern one side only, holes not plated thru.Ideal for common busses, signal line running longer distances, for hard wire of test circuits or discrete components. Tracks run close to board edges. 3U X 160mm Eurocard size will fit into 3U DIN Metric subrack.
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Trialon Corp.
Automobiles, electronics, heavy equipment, home appliances and more…consumers want dependability and manufacturers need to deliver quality. The need to comprehensively test components and systems for shock and vibration resistance can often be the key to long-term product success. Trialon’s experienced team will be your partner to provide complete satisfaction throughout the product validation process.
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Promptlink Communications, Inc.
Promptlink’s Set-Top Box Test Platform (STBTP) is a complete functional testing solution designed for the highest volume testing requirements. With only the highest-quality, highest-speed components, STBTP is the ultimate tool for accurate, high-demand testing of set top boxes. With support for satellite, DAC-based and DVB-based set-tops, STBTP is the solution that never leaves you unsatisfied.
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Megger Group Ltd.
The primary test methods used to assess the condition of the active insulation components in transformers and bushings, on site, include:1) power factor/tan δ,2) variable frequency power factor/tan δ (1 - 500 Hz)3) dielectric frequency response (DFR) [a dielectric response method], and4) moisture in oil measurements (for transformers).
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EDI Enterprises
EDI provides components and professional services to help in the development of TTCN-based or custom test systems. We can help in the definition, implementation, and automation of your testing needs and are able to define custom testing systems targeted directly for a particular system. EDI also develops and sells testing products based on internationally recognized testing standards.
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1100 -
Photon Kinetics
The 1100 Single Fiber Aligner uses patented fiber alignment concepts to produce virtually instantaneous temporary couplings for OTDR, dispersion, or any other optical fiber or component test that requires a fiber-to-fiber connection. It delivers low loss, low reflectance couplings on the first try virtually every time, without the need for test instrument feedback. As a result, temporary coupling times are minimized and manufacturing costs are reduced without compromising product quality.
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ETI Precision
The ETI adjustable test stab set may be used with your high-current circuit breaker testers to maximize efficiency and convenience for testing multiple breakers. Our stab system allows your technicians to test breakers in-place and avoid jacking breakers up or down for testing. By combining mobility and flexibility into one simple system, this stab set is a proven improvement over conventional designs. The components in the adjustable stab set are made of 120 pounds of 110 copper.
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Test Devices Inc.
Test Devices provides production spin testing and balancing services of production parts for customers with a repetitive need and who demand schedule predictability along with a quick turn-around time. Whether proof testing critical rotating components before shipment, pre-spinning to achieve required rotational growth prior to finish machining or simplifying the supply chain by consolidating pre-spin with rough machining and/or NDT inspection, Test Devices offers a full range of spin testing solutions.
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DP-201 -
King Design Industrial Co., Ltd.
Shock or bump test mainly simulate the impact effects of product and its components encountered in usage and transit process. Through standard and high-reproducibility instant energy exchange, you can analyze the product ability to tolerate the strong external stress and the degradation of structural weaknesses to quickly obtain the data of structure strength, anti-shock appearance and anti-drop. Shock tester is one of destructive experiments, and do destructive test on the product to evaluate the product reliability and monitor the consistency of production line.
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DP-1200 -
King Design Industrial Co., Ltd.
Shock or bump test mainly simulate the impact effects of product and its components encountered in usage and transit process. Through standard and high-reproducibility instant energy exchange, you can analyze the product ability to tolerate the strong external stress and the degradation of structural weaknesses to quickly obtain the data of structure strength, anti-shock appearance and anti-drop. Shock tester is one of destructive experiments, and do destructive test on the product to evaluate the product reliability and monitor the consistency of production line.
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783467-01 -
NI
51.2 kS/s/ch Simultaneous, 3 Vrms, 2-Channel C Series Voltage Output Module - The NI‑9260 is an instrument-grade dynamic signal generator for testing the audio components and capabilities of consumer electronic devices and providing excitation in structural test applications. Unlike sound card-based solutions, the NI‑9260 can be deployed quickly and recalibrated to guarantee long-term measurement repeatability and decreased test time. It also features ±30 V overvoltage protection and short circuit protection.
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783466-01 -
NI
51.2 kS/s/ch Simultaneous, 3 Vrms, 2-Channel C Series Voltage Output Module - The NI‑9260 is an instrument-grade dynamic signal generator for testing the audio components and capabilities of consumer electronic devices and providing excitation in structural test applications. Unlike sound card-based solutions, the NI‑9260 can be deployed quickly and recalibrated to guarantee long-term measurement repeatability and decreased test time. It also features ±30 V overvoltage protection and short circuit protection.
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NX Hipot -
Dynalab Test Systems, Inc.
* 50 to 1500VDC Hipot Testing* 50 to 1000VAC (optional) * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable
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Chroma 16502 -
Chroma Systems Solutions, Inc.
With a basic accuracy of 0.05%, Chroma 16502 offers a 0.001mΩ ~1.9999MΩ wide measurement range. It provides measurement range with 4 1/2 digits resolution. The fast measurement time is 65 ms. It suits component evaluation on production line. Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurement. DC test current output mode is used to fasten measurement speed for inductive DUT. Dry-circuit test current output mode is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 20mV.
