Audio Test Systems
See Also: Audio Test, Audio Testers, Speaker, Acoustic
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
FRP-25T Test System Interface Probe
FRP-25T
ICT/FCT Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 120Recommended Travel (mm): 3.05Overall Length (mil): 1,210Overall Length (mm): 30.73
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Product
Inclinometer Systems
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Columbia Research Laboratories
Columbia Research Labs offers our standard Inclinometer System and our Differential Inclinometer System. The standard system includes a temperature compensated force balance inclinometer in conjunction with a power module and convenient digital display. It is available with either AC or DC Power supply input. The Differential System allows the customer to match the slope of two remotely located surfaces. The readout can be set to indicate the absolute tilt of either sensor or the differential angle between them.
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Product
PLD Systems
Pulsed Laser Deposition
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Is a versatile thin film deposition technique. A pulsed laser (~20 ns pulse width) rapidly evaporates a target material forming a thin film that retains target composition. This unique ability of stoichiometeric transfer of target composition into the film was realized first by the research team led by Dr. Venkatesan at Bell Communications Research, NJ, USA, nearly 30 years ago while depositing high temperature superconducting (YBa2Cu3O7) thin films. Since then, PLD has become the preferred deposition technique where ever thin films of complex material compositions are considered. Another unique feature of PLD is its ability for rapid prototyping of materials. The energy source (pulsed laser) being outside the deposition chamber, facilitates a large dynamic range of operating pressures (10-10 Torr to 500 Torr) during material synthesis. By controlling the deposition pressure and substrate temperature and using relatively small target sizes, a variety of atomically controlled nano-structures and interfaces can be prepared with unique functionalities.
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Product
Wireless System For Test And Measurement
TM400 Compact
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The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Exposure Systems
Model 2000AF & 2000SM
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The OAI Model 2000 Exposure Systems may be configured as either an edge-bead exposure system (2000SM) or a flood exposure system (2000AF); both configurations are based on OAI’s proven, time-tested platform.
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Product
ESM/ELINT System
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Shoghi’s Electronic Support Measures (ESM) are designed for electronic warfare techniques involving actions to detect, intercept, identify, locate, record, and/or analyze sources of radiated electromagnetic energy for the purposes of immediate threat recognition.
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Product
Development System
FE-51MX
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* Emulates Philips P8xC51MA/B/C , P89C669 Microcontrollers * 1MByte Code Memory * Based on bond-out Technology * Frequency up to 24MHz 3V / 5V Operation * Huge Real Time Trace Memory * Windows Debugger for C/C++ and Assembler * Target Board Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
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Product
mAEStro Audio Digital to Analog Converter
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The mAEStro ADAC-100 receives AES/EBU (AES3) or S/PDIF digital audio and converts it to two channels of analog audio. It automatically detects sample rates up to 96kHz with low-jitter clock recovery. Two balanced line-level audio outputs are provided on XLR connectors on the rear panel. For convenient monitoring, a stereo headphone mini-jack and volume control are provided on the front panel.
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Product
Electrical Test System TY-CHECKER
Type P Series
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Manual press systems made to suit your purpose.
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Product
Automated Robot Test System
ATS-8000A
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High Power Pulse Instruments GmbH
The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.Future extension for CDM is optional.
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Product
Multi-channel Optical Power Meter For Swept Test System
MPM-210HMPM-211, 212, 213, 215
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Our MPM-210H is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings（AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210H allows the user to complete real-time high precision IL measurements.
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Product
CUSTOM SYSTEMS
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Tristan’s specialties include custom systems (magnetic, cryogenic, scanning, multichannel SQUID, variable temperature systems, magnetic fields, and microwave) based on a core technology of system building and expertise in cryogenics, refrigeration, software (upper level control and embedded) and electronics design.
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Product
Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Product
Development System
FE-SND2
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* Emulates Atmel AT89C51SND2 Microcontrollers * 62K Code Memory * Real-Time Emulation * Frequency up to fmax * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * USB or RS-232 Linked to PC * C Compiler and Assembler
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Product
Automated Test Systems
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Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Product
Vision System
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Axiomtek's vision system series is designed to focus on vision inspection, guidance, measurement and identification applications. The products have already gone through a complete set of compatibility experiments to eliminate potential integration problems, significantly helping users reduce development and staffing costs as well as accelerate system deployment in factory automation environment.
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Product
IQC Test Systems
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Signalysis has worked with many Tier I and Tier II Automotive sub-suppliers to provide production test systems. Below are some examples of our systems; we have also supplied systems for wiper motors, axles, door panels, window mechanisms, and many other interior components.
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Product
Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Vibration Testing System
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Torontech is now offering Vibration Test Systems, Shock Test Systems, Bump Test Systems, Drop Tester, and Packaging Transportation Simulators.
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Product
Analysis System
Trident (EDS-EBSD-WDS)
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The Trident Analysis System combines the latest advances in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Wavelength Dispersive Spectrometry (WDS) in a single analytical tool. With the Smart Features included in the easy to use EDAX analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, resulting in comprehensive data collection that can then be shared between the different techniques.
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Product
Test System
Griffin III
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The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Product
Autofocus System
CRISP
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Applied Scientific Instrumentation
The CRISP system is designed to maintain focus over time i.e. compensate for thermal & other factors that may cause the sample to drift out of focus over time. It also can be used to maintain a given focal point while scanning the sample in XY. If you are looking to find the optimal focal point while scanning through the sample in Z phase.
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Product
Compact Optical Environment Test Measurement System
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Durability test with temperature, humidity and "sunlight"●Espec SH-241 small environmental tester combined with a solar simulator for durability testing under temperature, humidity and light environments●Software is also available.●Please inquire about the system configuration individually.
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Product
Coating System
Precisioncoat V
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The redesigned SCS Precisioncoat V provides more than a dependable layer of protection, it is a total system solution that ensures accuracy, repeatability and high throughput for a wide range of automated material application, all in a smaller footprint to maximize valuable production floor space. It is the culmination of more than 40 years of experience in design and manufacturing high performance liquid coating systems. It incorporates both the engineering expertise and application experience that make SCS a leader in conformal coating technology.
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Product
HD Tester with VGA, Audio, Video, HD-TVI
M-HD-360A
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Fuzhou Metricu Technology Co Ltd
Analog camera testHD-TVI camera test, HD-CVI camera test, AHD camera testDC12V 1A power outputVGA input, support 1920 x 1200P 60FPSAuto HD, auto recognize HD coax camera type and resolutionUTP cable test, detect the near-end, mid-end and far-end fault point of the network cable crystal head
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Product
Engine Test Systems
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Today''s engines and components require testing in a repeatable manner over a wide variety of conditions, ensuring that the final manufactured product consistently meets customer demands for performance and durability. The need for engines to be both economical and - above all - environmentally friendly, places fresh challenges on developers.
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Product
Production Test System
G3 Hybrid
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The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
