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CT/VT Test System
Fully pre-wired comprehensive turn test system. *Suitable for CTs up to 6000A & VTs up to 132kV. * Precision to (0.005 class) internal multi-ratio standard CT. * Internal 4KA current source. * State-of-the-art Instrument Transformer Test Set AITTS-98 with computer & printer interfaces. * Electronic potential divider facilitates testing any VT ratio upto 132kV. * Current & potential burdens.
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PCI Express® 2.0 Protocol Test
The E2960B family is one of the best tools in the industry for PCI Express® 2.0 testing and debug. That’s not just from us, in fact the E2960B series wins the 2007 Best in Test Award – Honorable Mention.
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Other Test Equipments
Other AVENO Test Equipment, including mask & protective cloth testers, cooker & knife testers, battery testers, helmet testers, paper & carton testers, and consumables and tools testers.
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Surface Profile Test & Measurement Products
PCWI Surface Profile Test & Measurement Products
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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UV Penetration & Protection Test System
TF131
TESTEX Testing Equipment Systems Ltd.
UV Penetration & Protection Test System. Fabric Samples are measured in a double beam spectrophotometer with an integrated sphere. The sample is scanned over the UVA and UVB regions of the spectrum and transmitted radiation is efficiently collected by the detector within the integrating sphere. The software calculates UV penetration factors and sun protection factors from the scan data. It runs on a PC under Microsoft Windows and controls the spectrophotometer, automates the measurement process and generates a printed report. PC and printer are not included.
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Pump, Hydrostatic Test, 10,000 psi
9901-100L
Hydrostatic test pump may be utilized as a standalone unit or combined with any of our reservoirs, safety test chambers, test fittings or other optional equipment to achieve a complete hydrostatic test system. with integral safety test chamber.
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Software Update For Test Development, GTE 10.00p
K8224A
Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Test Automation System for Brake Testing
STARS Brake
STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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SM & MM Quad Optical Loss Test Set
KI2724-INGAAS-APC
A SM & MM Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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Automated Fibre Loss Test Set
LTS-1500
The LTS-1500 is a small, rugged automated fiber optic loss test set that characterises singlemode fiber links at wavelengths of 1310, 1490 and 1550 nm. It is comprised of a sensitive InGaAs based optical power meter calibrated at six wavelengths with better than -75 dBm noise level plus a stabilised laser light source with up to three selectable wavelengths.
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Battery Crush Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s battery crush test chamber is used to battery crush test. This battery testing equipment simulates the conditions of the battery crushing and display comminution result.
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AI-based Test Generation
Our AI-based test generator can automatically automate your tests. Using recheck-web, these tests not only detect functional differences, but also visual differences.
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Meter Test & Calibration
Kongter Test & Measurement Co., Limited
Kongter offers a whole line of products for meter test and calibration including portable power source, standard reference meter and meter test system. All products are accredited to the highest production standards with different options of measurement accuracy (class 0.05 and class 0.1).These enable them to cover different applications for test and calibration of different types of energy meters, electric transducers, indicating meters and so on.
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EMI EMC test Solutions for Immunity
Scientific Mes-Technik Private Ltd
EMI EMC test Solutions for Immunity
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Chloride Ion Test Kit for Surfaces
134S
Elcometer 134S test method: a latex sleeve is filled with a Chlor*Rid extract solution and stuck to the test surface where the solution is worked against the surface to extract the salts. The titration tube is inserted and the results can be recorded.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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LT-200A Aging-Life Test System For LEDs
Hangzhou Everfine Photo-E-Info Co., LTD
LT-200A is mainly used for normal aging, accelerated aging test, lumen maintenance characteristic test, life test and temperature characteristic test of single LED and LED module.The system can monitor the photoelectric parameters and base temperature of the LED sample in real time, process the data, draw the aging curve, and calculate the lifetime exploration of the LED sample.
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Test Adapter
Ramcheck 100
This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Test Hardware
Development of additional hardware components in-houseCreation of the layout of the developed circuit boards and subsequent production outside the companyAssembly of the printed circuit boardsCreation of additional circuits for test adapters
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Device Thermal Test Systems
Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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EN60350-2：2013 Cookware Test Pot Test Vesssel
CX-G08
Shenzhen Chuangxin Instruments Co., Ltd.
EN60350-2：2013 cookware test pot test vesssel
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Full-Featured Life Cycle Test System
LCV
Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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New Generation Vacuum Box for the 3070 Test Platform
Vortex Series
The Vortex Series is a new generation vacuum box for the 3070 test platform that will easily revolutionize in-circuit test. The simplified and streamlined design allows for maximizing the usable testable board size of the Vortex 100 Performance Grade fixture. The rugged all aluminum design maximizes the opening angle of 85° ideal for Cobot usage, while eliminating the top plate and associated hardware and retaining our classic quick plate guided probe technology.
