Parametric Test
determine whether a DUT's electrical characteristics meet specification.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
Probe Card
Indexer™
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The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.
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Product
LXI Reed Relay Matrix - Single 128x4 Plugin, No Direct Y Access, 6 Analog Buses
65-221-112
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
EXG X-Series RF Analog Signal Generator, 9 kHz to 6 GHz
N5171B
Signal Generator
Achieve faster throughput and greater uptime with the cost-effective performance optimized for manufacturing testPerform basic parametric testing of components and functional verification of receivers with industry-leading output powerThoroughly verify receiver performance by simulating complex analog modulation scenarios with multi-function generator capabilityMinimize downtime and expenses with self-maintenance solutions and low-cost repairs
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Product
DDR4 Parametric Test Reference Solution
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Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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Product
DWV/IR Test Systems
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When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Product
EXG Signal Generators
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The cost-effective EXG X-Series signal generators address critical speed and uptime needs for manufacturing test. With analog and vector models, the EXG provides the signals you will need for basic parametric testing of components and functional verification of receivers.
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Product
Probe Card
VC20E Series
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The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Product
256 Channel Power Supply
IDPS750
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Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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Product
Combination Board Tester
ATE QT2256-640 PXI
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Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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Product
LXI Reed Relay Matrix - Dual 128x4 Plugin, Direct Y Access, 12 Analog Buses
65-221-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
Test Fixtures
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Pneumatically actuated Kelvin connection to custom manufactured device inserts either to complement ART's wide range of precision parametric test equipment or for use with third party measurement hardware.
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Product
Test Contactor/Probe Head
Atlas
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QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
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Product
LXI Reed Relay Matrix - Single 32x32 Plugin, Direct Y Access, 1 Analog Bus
65-227-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
LXI Reed Relay Matrix - Dual 64x8 Plugin, Direct Y Access, 6 Analog Buses
65-223-001
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
Keithley Automated Characterization Suite Software
ACS
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Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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Product
LXI Reed Relay Matrix - Dual 128x4 Plugin, No Direct Y Access, 6 Analog Buses
65-221-111
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
Test Fixtures & Test Sets
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Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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Product
Cost-Effective ATE System
PRO RACK ATE
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Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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Product
LXI Reed Relay Matrix - Single 32x16 Plugin, No Direct Y Access, 3 Analog Buses
65-225-102
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
LXI Reed Relay Matrix - Single 128x4 Plugin, No Direct Y Access, 12 Analog Buses
65-221-102
Reed Relay
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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Product
High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
Source Measure Unit
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Product
Probe Cards
Ceramic Blades
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SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
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Product
Advanced Circuit Card Automated Test
ACCAT
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The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Product
RF Bias Burn-In System
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These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
