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CMM Styli
Q-Mark manufactures styli and accessories for the metrology and machine tool industries.
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Vision Measuring System
CNC Vision Measuring System. Supporting non-contact and contact hybridContact measurement of detailed shape is achieved by extra small stylus with minimum diameter of 15um
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Replacement Probes And Styli For Faro Arms
MetrologyWorks provides a complete product line of replacement probes, styli, and accessories for Faro Arm Portable CMMs at significant savings. OEM Replacement Faro Probe and Custom options for your Faro Arm probe. MetrologyWorks can provide substantial savings on your next Faro Arm probe.
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Stylus Profilometers
Tencor™
KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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Roughness Measurement
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Styli for Touch Probes
Our styli can be used on Renishaw's CMM, machine tool, scanning probes and Equator™ gauging systems, as well as for sensors from other manufacturers, to ensure maximum measurement accuracy.
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Spindle Analyzer
Hand-held, light-weight, wireless tactile probe with easy-hold grip stylus allows for inspection of intricate features & cavities for large, complex parts.
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Accessories, Styli & Probes
Pratt & Whitney Measurement Systems, Inc.
A Standard to Grow With
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Dial Indicators
1. Always select the dial test indicator that best fits the application.2. Care should be taken while using a dial test indicator, try not to jolt the indicator, should you be unfortunate and drop a dial test indicator, get it re-calibrated/repaired before reusing it.3. Replace worn contact points only with those of a similar length from the centre of the ball stylus to the abutment shoulder.4. Always clean dial test indicators after use with a lint free paper or cloth and store the indicator in its box or in a dust free area.5. When using a dial test indicator, always position the dial test indicator in a horizontal plane to the surface media.6. Always use a rigid stand for mounting the dial test indicator.7. When measuring a rotating object, either between centres or in a vee block, ensure that the object is rotating in the correct direction. Never rotate the workpiece towards the contact point.8. When measuring a sliding object, only take readings when the object is moving directly towards the contact point, never away from the contact point or in a sideways manner.9. Avoid parallax errors by reading the dial directly from the front and square on to the dial.10. Never oil a dial test indicator as this attracts contamination, should the movement become erratic then the dial test indicator should be submitted to a reputable repair agent.11. Try not to expose dial test indicators to direct sunlight or in a high humidity environment.12. Never use a dial test indicator that has not been calibrated, if in doubt consult an appropriate authority.
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Constant Distance SECM
VS-STYLUS
In collaboration with SENSàSION, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and co-workers of the Laboratory of Physical and Analytical Electrochemistry (LEPA) at the École Polytechnique Fédérale de Lausanne (EPFL) for constant distance SECM. The probe technology offers the following benefits:
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Roughness Measurement CMM Stylus
ZEISS ROTOS
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Optical Profilers
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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Magnet Tester
The Magnet Tester invented by JUNG locates magnetic fields and notify it with its integrated lamp: compact, simple and fast!Easily check switch conditions with zero set-up time and no need to halt operations. The magnetic field test stylus is an indispensable tool for countless companies and toolboxes. Its light-function also makes it as an ideal flashlight.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Renishaw Styli
Advanced Industrial Measurement Systems
Renishaw’s styli are some of the most accurate in the market. The balls on the end of the styli are bonded to the stems to ensure that there is no wiggle room – as compared to the traditional ball drilling method to fix the stem to the ball – which causes distortions, and thus measurement errors. Renishaw’s styli are a much more capable option for the CMM. These balls also perfectly spherical, are located at the optimum position on the stem, are threaded nicely and are extremely sturdy during measurement. Additionally, Revolution® CMM’s are supplied with Renishaw Grade 5 High Accuracy Styli.
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Renishaw Change Racks
Advanced Industrial Measurement Systems
The MRS modular rack system provides a platform for Renishaw probe and stylus changing racks. It consists of a rail (400 mm, 600 mm or 1000 mm long) that holds the probe or stylus changers, and interconnecting legs of selectable lengths that allow clearance for long styli and extension bars.
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DYNAMIC TRACKING
VXTRACK
The C-Track dual-camera sensor is a complete portable 3D measurement solution that offers probing inspection and dynamic measurement capabilities. It is fitted with high-quality optics and special lighting, enabling it to measure all reflectors within its operating space. The probing stylus is very useful for aligning parts with respect to a referential (calculated using a group of reflectors), which allows movement or deformation monitoring directly on the part's referential.
