Bare Board Test
SMT and PCB check prior to being populated with components.
See Also: Bare board, Bare Board Testers
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System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Test Package
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Shenzhen Bonad Instrument Co., Ltd.
We can provide a variety of different specifications of freezing load test packages, including AHAMHRF-1 2007/ SASO 2664-2007 Sawdust freezing test package, AS1731.4-2003 Australian frozen Load Test Package, AS72-2005 North American Commercial Refrigeration Load Simulation Test Package, IEC 62552 Test Package for Freezing Load Testing in Refrigerators. In addition, we can also provide customization according to test requirements. For more information, please contact us, BONAD will provide you with professional technical advice and high-quality testing equipment.
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2100Vdc Screw Terminal Connector Board | Cable & Harness Tester
CB29H
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CAMI Research Inc. (Acton, MA) announces another new board for its CableEye cable and harness testing systems. Populated with four 16-pole screw terminal blocks, the board addresses high voltage (HiPot) testing to 2100Vdc/1200Vac. Of particular interest to the harness testing market, the CB29H is also available as a transition board variant (CB29AH). The CB29H and CB29AH boards are high voltage versions of the CB29 with the high voltage traces running on inner layers to afford additional safety, and protection from contamination.
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Lightwave Test Systems
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Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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DC Insulation Testing
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Weshine Electric Manufacturing Co., Ltd
Cable harness tester is used for test and measure wire cable harness,wire harness, like as : auto cable, audio cable, power cable, network cable, telephone cable, USD cable, HDMI cable,video cable, etc. .
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Temperature & Humidity Sensor Breakout Board
Si7021
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Sensor for Silicon labs has ± 3% relative humidity measurements with a range of 0–80% RH, and ±0.4 °C temperature accuracy at a range of -10 to +85 °C. Great for all of your environmental sensing projects. It uses I2C for data transfer so it works with a wide range of microcontrollers.
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Automation Testing Services
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QACraft has been one of the leading companies in providing automated testing services for all types of software and applications inclusive of mobile as well as web apps. Our expert team designs the QA strategy to check the various parameters such as functionality, speed, performance, quality, loading time, and much more to give you a detailed report about the same.
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Ultrascale FPGA PCIe Board
SE100 – Solar Express
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Sundance Multiprocessor Technology Ltd.
SE100 is based on Xilinx’s Virtex Ultrascale FPGA XCVU190-2FLGC2104E, and is a powerful processing card with plenty of IO capabilities to meet the needs of modern compute-intensive applications such as Supercomputing, Data Centers and defense. The board can optionally be populated with 095, 125, and 160 devices in C2104 package for reduced cost. Host interface is via 8 lanes of PCIe Gen3 but the card can also be used as an embedded, standalone, hardware too. Multiple cards can be cascaded to provide a multi-FPGA system with cards connected together via the board’s fast IO channels to meet the needs of even more demanding applications like ASIC design and Stock Market fast trading systems.
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Material Testing Software
TRAPEZIUM X
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Windows 10 compatible TRAPEZIUM X can carry out various tests ranging from simple test control to complex custom-made patterns, using the industry's first data search and preview function, free layout reports, visual wizard settings, quick panel, and quick conditions lists.
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Color Test Charts
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Shenzhen ThreeNH Technology Co., Ltd.
3NH color test charts provide accurate color calibration and image consistency across devices. They are Ideal for cameras, printers, and scanners. These charts meet international standards, helping professionals achieve precise color reproduction in photography, printing, and display calibration workflows.
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Testing Maturity Assessment
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ZenQ helps companies improve the efficiency of their testing practices by 15 – 30% through its advisory and consulting services.
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Temperature Test
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Function and safety under extreme conditions. In the field of environmental simulation, ENGMATEC offers a wide range of efficient systems for quality assurance, development and production.
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Test & Development
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Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Data Acquisition I/O Boards
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General Standards Corporation is a leading supplier in data acquisition I/O boards, provides a complete family of data acquisition cards for sonar, industrial, and embedded applications on several form factors/busses, and for many operating systems. Functions available include analog I/O, serial I/O, and high speed parallel I/O.
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ATE & Test Systems
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Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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DAQ- Data Aquisition Boards
ETS Series
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The ETS Series products are designed to create a simple "Go, NoGo" test platform that executes quickly and requires minimal Operator interaction. Low-cost alternative to traditional PC-based test equipment. Test Electronics sources and stocks a large variety of data acquisition and sensor boards to make your hardware build quick and easy. Develop your own embedded test system or use the embedded test systems we have developed.
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Test Data Management
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Web-access to all tester records and analyticsUUT History/Event ReportRaw data support, including waveformsComplete Serial Number History ReportCharacterize and CorrelateStatistical Process Control (SPC)Failure Paretos
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Pulse Initialization Demo Board
TMR9112
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MultiDimension Technology Co.,Ltd.
The TMR9112 demo board was developed to support evalution of the TMR9112 single-axis sensor. The demo board comes with the fast bipolar current pulsing circuit needed for initialising the TMR9112 sensor, and it can be powered from a USB port or any external 5V power supply. For user convenience, the demo board has an optional on-board timer clock with four selectable frequency settings. The On-board timer clock and frequency output can be enabled using the jumper pins. This demo board is divisable along the dotted line so that the sensor board can be seperated from the pulsing circuit board.
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PCIe/104 OneBank I/O Board
EMC²-7K160
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Sundance Multiprocessor Technology Ltd.
The EMC²-7K160 is a PCIe/104 OneBank™ I/O Board with a Xilinx Kintex-7 SoM and a VITA57.1 FMC™ LPC I/O board. The PCIe/104 OneBank™ design enables the EMC²-Kintex-7 to be added to robust and rugged installations for various commercial, medial, industrial and military uses and to enable more versatility the EMC²-Kintex7T also incorporates a VITA57.1 FMC™ LPC connector opening up an range of extra possibilities and expansion options.
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Supercapacitor Test
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The CT3001A/C battery test systems are upgraded from CT2001A/C with higher precision and data logging rate. The tester can be used to run precision tests for coin cells, pouch cells, prismatic cells, and especially supercapacitors (ultra-capacitors). Each tester has 8 independent channel which can be programmed to run constant current charge/discharge, constant voltage charge, constant power discharge, constant resistant discharge, and direct current internal resistance (DCIR) tests.
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PC104 MIL1553A & MIL1553B Board
MS 1701
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*Bus Interface - Standard ISA Bus (PC104 Interface)*One Dual Redundant MIL-STD-1553 Channels, Enhanced Mini-ACE BC/RT/MT Architecture*A periodic message insertion, Real-time bus playback with RT edit mode*Highly Autonomous Bus Controller Architecture, Message Scheduling*Bulk Data Transfers, Data Block Double Buffering*Asynchronous Messages, Retries and Bus Switching*Transformer or Direct Coupled 1553B Channels
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Wafer Test
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Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level
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Pulse Generation Measurement Board
MS 1806
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*TTL Pulse measurement channels (Timers / Counters) 18 Channels*TTL Pulse Generation - 12 Channels*The Pulse Generation Frequency from 10Hz to 40MHz*The no. of pulses controlled from 1 to 255 pulses*All Channels are compatible with 5V TTL / CMOS*All the pulse input and the output signals driven through Pin Driver*Standard ISA Bus Interface*Driver interface for Windows2000/XP/VISTA and LINUX OS
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Test Sphere Probe
CX-500
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
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3U VPX Single Board Computer
VP32002
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LinkedHope Intelligent Technologies Co.,Ltd.
VP32002 is a high-performance 3U VPX single-board computer, compatible with PC architecture, especially it is a China Local-design, Local-assembling product. VP32002 is an all-in-one design, supporting the 3rd generation of Intel core processors and QM77 chipset; also supports up to 16 GB onboard DDR3 memory and up to 32GB Disk-On-Modules, these features ensure its stable operation in strong shock and vibration environments. VP32002 supports a XMC interface and various I/O interface such as two SATA600 channels, two Base-BX/T GbE, two UARTs and two USB interface.The board provides a flexible PCI-Express bus interface to the backplane. The interface can be configured as follows: 1 Port x8 PCIe, 2 Ports x4 PCIe, 4 Ports x2 PCIe. This feature makes it suitable for either distributed switching system or centralized switching system.For the user to quickly form application solutions, LinkedHope provide VP32002 a complete driver package including Windows, VxWorks, Linux and QNX.
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Test Solution
Novus, Novus-M, & Novus-R 100/25GE Load Modules
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Keysight Network Applications and Security
Novus, Novus-M, and Novus-R are Ixia’s next-generation architecture and test solutions that satisfy the test needs of both high-density, multi-rate switch/router makers and the organizations implementing the network equipment. Supporting eight native QSFP28 100GE ports and up to 32-ports for 25GE per load module, Novus load modules enable interoperability and functional testing, as well as high-port count performance testing.
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Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Test Contactor/Probe Head
Atlas
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QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
