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Test Systems

group of interoperable devices whose integration perform a common test purpose.

See Also: Systems, Equipment, System Integrators, System Test, System Integration


Showing results: 1096 - 1110 of 5277 items found.

  • Test Solutions

    Astronics Corporation

    Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.

  • EMC Testers

    Kikusui Electronics Corp.

    The KES7000 System is a conductive immunity test system that is fully compliant with ISO7637-2 and ISO7637-3, international standards for EMC testing required for automotive electronic components. This system consists of the KES7700 Series Transient Surge Tester, KES7400A Series Voltage variation simulator and KES7100 application software dedicated to the KES7000 system. This product configuration supports JASO standards and the special test requirements of car manufacturers with options or custom orders.

  • Test Automation Software for Laboratory Management

    STARS ENTERPRISE - HORIBA, Ltd.

    STARS ENTERPRISE is a completely new generation of software from HORIBA, consisting of innovative web and mobile apps in a cloud-based platform. It enables you to seamlessly and completely integrate all your measurement systems, test beds and specimens, as well as on-board systems in the laboratory or in mobile road tests. The numerous apps in the STARS Enterprise system offer you a universal, flexible and scalable software solution for accomplishing your entire test automation activities, today and into the future.

  • Test Software

    ATI - Automation Technology, Inc.

    The ATI Test System Software and its utilities are built on a core of mature, object-oriented software components that have been thoroughly field tested and refined over many years. All of ATI's systems share a common core functionality and an easy to use program interface. Our highly skilled software and engineering experts are able to integrate nearly any OEM test or embedded systems equipment into the test system's design whether it's standard or proprietary.

  • System Integration

    Eastern-Optx

    Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.

  • Detector Testing

    CI Systems Inc.

    CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.

  • High-Density PXI Large Matrix Modules up to 1 Amp

    BRIC - Pickering Interfaces Ltd.

    Pickering's high-density PXI large matrix BRICs offer current handling up to 1 Amp and select models are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.

  • Universal Diagnostic System

    BoardMaster External Case Solution - ABI Electronics Ltd

    The ABI BoardMaster External Case universal diagnostic system is a uniquely versatile and easy-to-use test system. It offers the most comprehensive set of test instruments for fault-finding on almost any kind of PCB. With the full range of instruments and a variety of test methods guaranteeing the best possible fault coverage, the BoardMaster External Case provides the ultimate in diagnostic tools.

  • LED Tester For Chip And Wafer

    WeiMin Industrial Co., Ltd.

    Electrical Testing: Forward:VF,DVF,VFDReverse:VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system

  • High-Density PXI Large Matrix Modules up to 1 Amp - BRIC

    Pickering Interfaces Ltd.

    Pickering's high-density PXI large matrix BRICs offer current handling up to 1 Amp and select models are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.

  • Battery Crush Test Equipment(Horizontal)

    Guangdong Bell Experiment Equipment Co.,Ltd

    Battery Crush Test Equipment(Horizontal)Application: Battery Module / Battery Pack / Battery System crush test, penetration test.Drive Mode: Electro-hydraulic ServoCrush Tool: Semi-cylinder, hemisphere (According to test standard)

  • Test & Test Development for Circuit Card Assembly

    Teledyne Defense Electronics

    Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW

  • Automated Test Equipment

    ATE - Frontier Electronic Systems Corp.

    The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.

  • Test Program Development

    Das Test Haus

    Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.

  • TestStation Multi-Site Inline

    Teradyne, Inc.

    TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.

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