Showing results: 46 - 60 of 1906 items found.
-
UniTest Inc.
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
-
ETC
Oscilloscopes with 2M of waveform memory.
-
-
PCI-5565PIORC -
Abaco Systems Inc
The PCI-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM
-
T5830 -
Advantest Corp.
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
-
PCIE-5565PIORC -
Abaco Systems Inc
The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
-
GG-170 -
Astrodesign Inc.
The successor to the popular GG-167-HD/4K, this is an uncompressed HD/4K video input and output compliant frame memory board.
-
VolatilityBot -
mkorman90
VolatilityBot is an automation tool for researchers cuts all the guesswork and manual tasks out of the binary extraction phase, or to help the investigator in the first steps of performing a memory analysis investigation. Not only does it automatically extract the executable (exe), but it also fetches all new processes created in memory, code injections, strings, IP addresses, etc.
-
PMC-5565PIORC -
Abaco Systems Inc
The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
-
UltraFLEX-M -
Teradyne, Inc.
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
-
GG-169 -
Astrodesign Inc.
GG-169 is a frame memory board that supports high-speed data transfer and can input and output uncompressed 8K video.With 12G-SDI × 4 lines (up to 8 lines with the use of an optional expansion board) equipped as standard, it achieves real-time output of 8K / 59.94p.
-
HDS-1022M -
KILTER ELECTRONIC CO.,LTD
2k/channel memory depth. 3-3/4 digit DMM with datalogger. Manual cursor measurement. Li-ion battery and AC adapter. Extra bright backlight display. Sample rate up to 100MSa/s, 20MHz bandwidth. RS-232, USB port for programming & data transferring
-
RAMCHECK LX -
INNOVENTIONS, Inc.
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
-
TOMSAD
AUTO300 is the newest programmer from weilei company. That programmer is dedicated to automotive electronics. The main advantages are : reliability, speed, and the ratio of quality to price, the software in ten languages and 3-year warranty
-
Magnum2 -
Teradyne, Inc.
Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.