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Product
Reflective Memory
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An innovative solution designed to provide highly deterministic data communications for your real time applications such as distributed simulation.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Memory Interface Chips
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Providing memory bandwidth and capacity to unleash the power of multicore processors
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Product
Shared Memory Network
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Avionics Interface Technologies
AIT's Shared Memory Network (SMN) interface modules provide host systems with an interface to a high speed (2.125 Gbps) optical data network which can be used to share data, in real-time, between multiple distributed systems.
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Product
Reflective Memory Analyzer
PEAZ-5565
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Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Product
Reflective Memory Node Card
PMC-5565PIORC
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The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
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Product
Memory Products
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The electronic systems we use today require some form of memory for data and software storage. As a leading supplier of high-quality memory products, we offer a broad portfolio of serial EEPROM, serial EERAM, parallel EEPROM, OTP EPROM, serial Flash, parallel Flash, serial SRAM, NVSRAM, and CryptoMemory® security ICs to meet your memory needs. We also offer the industry’s first commercially available serial memory controller for use in high-performance data center computing applications. Our extensive testing protocols have ensured industry-leading robustness and endurance along with best-in-class quality to provide you with reliable products, dependable technical support and a consistent supply of devices throughout your product’s lifecycle.
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Product
Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
Reflective Memory PCIE card
PCIE-5565PIORC
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The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
Reflective Memory Hub
ACC-5595
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The ACC-5595 is a managed hub designed to operate with our 5565 family of Reflective Memory real-time network products. The Reflective Memory hub can automatically bypass ports when it detects a loss of signal or the loss of valid synchronization patterns, allowing the other nodes in the network to remain operational.
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Product
Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
Shared Memory Network PCI Express Interface
PCIe-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodesNetwork interrupts supported - PCIe 2.0 (x4) CompliantSoftware Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
Avionics/Vehicles Bus, Serial I/O, Shared Memory, and More
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Curtiss-Wright Defense Solutions
Curtiss-Wright offers a wide range of solutions for high-speed, low latency communications and shared memory products. These products are offered in a variety of form-factors including PMC, XMC, PCIe and PC/104 cards designed to support popular communications standards including 1553, ARINC 429, CANbus and Serial FPDP.
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Product
Memory Analyzers
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Market drivers in the memory sector have changed. Gone are the days of simply pushing Moore’s Law to ever faster data rates. The memory designs of today and tomorrow must also be smarter than ever before. Today, handheld and wearable computers must draw from a limited battery reserve while serving up fast, responsive, and compelling mobile experiences. Meanwhile the cloud of data centers and server farms that feed us these compelling experiences must continuously grow while simultaneously reducing overhead and environmental impact. These two different markets have the same goals: smarter memory, smarter control systems, and lower power usage.
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Product
Single channel Memory Earth Resistivity and IP Meter
SuperSting R1 IP
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The SuperSting R1 IP is a state-of-the-art single-channel portable memory earth resistivity meter with memory storage of readings and user defined measure cycles. It provides the highest accuracy and lowest noise levels in the industry.This new instrument is based on technology developed for the famous SuperSting R8/IP multi-channel instrument.
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Product
Semiconductor Memory Tester
T5851
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Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Product
Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136E+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM
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Product
8k Frame memory Board
GG-169
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GG-169 is a frame memory board that supports high-speed data transfer and can input and output uncompressed 8K video.With 12G-SDI × 4 lines (up to 8 lines with the use of an optional expansion board) equipped as standard, it achieves real-time output of 8K / 59.94p.
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Product
Memory Tester
RAMCHECK LX DDR3
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Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Product
16-Bit PCIe Gen-2 Digitizer / Oszilloscope 4 Channel 25 MS/s Up To 8 GS Memory
Octave-16 Express / CompuScope 8442
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The GaGe Octave Express 84XX CompuScope PCIe digitizer card features 16-bit resolution with sampling rates up to 25 MS/s with true Effective Number of Bits (ENOB) of 12-bits with 10 MHz input. Onboard digitizer sample memory is expandable up to 8 GS (16 GB) and up to 8 Octave Express digitizers can be combined for up to 32 channels in a single system.
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Product
14 Bit Digitizer For PCIe With 8 Channels 125 MS/s Up To 8 GS Memory
Octopus-14 Express / CompuScope Express 8389
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The GaGe Octopus Express 83XX CompuScope PCIe digitizer board features 14-bit resolution with sampling rates up to 125 MS/s with true Effective Number of Bits (ENOB) of 11-bits with 10 MHz input.
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Product
14-Bit Digitizer For PCIe Gen-2, 4 Channels 125 MS/s Up To 8 GS Memory
Octave-14 Express / CompuScope 8349
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The GaGe Octave Express 83XX CompuScope PCIe digitizer card features 14-bit resolution with sampling rates up to 125 MS/s with true Effective Number of Bits (ENOB) of 11.1-bits with 10 MHz input. Onboard digitizer sample memory is expandable up to 8 GS (16 GB) and up to 8 Octave Express digitizers can be combined for up to 32 channels in a single system.
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Product
Dynamic Digital I/O (3U), 32 Channels Up To 100 MHz W/256MB On-Board Memory, W/LVDS
GX5282
Digital I/O
The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136B+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis
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Product
16 Bit Digitizer (oszilloscope) PCIe Gen-3 2 Channels 500 MS/s 4GS Memory
RazorMax / CompuScope Express 16504
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The new extremely fast and high-resolution Gage digitizers of the series RazorMax Express CompuScope offer with a 3/4" long Single slot PCI Express card a resolution of 16 bit and a sampling rate of 1 GS/s (per channel).
