Flash Memory
retains data absent of power. Also known as: Flash Device
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Product
Nand Flash Tester
NplusT
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NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Product
RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
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The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Product
Memory Diagnostic Utility
MemTest86
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MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Product
System Flash Meter
SF 105
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Computer controlled measurement equipment to measure the time response of illuminance or luminous intensity when illuminated with rapidly changing values, e.g. flashes.
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Product
Memory Interface Chips
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Providing memory bandwidth and capacity to unleash the power of multicore processors
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Product
Light/Laser Flash Analyzers
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Light or laser flash is a measurement technique used to determine the thermal diffusivity, thermal conductivity, and specific heat capacity of materials. Light flash measurements are essential for characterizing the heat transfer and storage properties of a variety of materials, whether the sample of interest is expected to insulate, conduct, or simply withstand temperature changes.
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Product
RightMark Memory Analyzer
RMMA
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Before this test packet was created there was no proper software for measuring vital system parameters such as CPU/Chipset/RAM providing steady and reliable (reproducible) test results and allowing for changing test parameters in a wide range. Vital low-level system characteristics include latency and real RAM bandwidth, average/minimal latency of different cache levels and its associativity, real L1-L2 cache bandwidth and TLB levels specs. Besides, these aspects are usually not paid sufficient attention in product technical documentation (CPU or chipset). Such test suite, which combines a good deal of subsets aimed at measuring objective system characteristics, is a must have for estimating crucial objective platform parameters.
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Product
8 channel Memory Earth Resistivity and IP Meter
SuperSting R8 IP
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The SuperSting R8 IP is a state-of-the-art multi-channel portable memory earth resistivity meter with memory storage of readings and user defined measure cycles. It provides the highest accuracy and lowest noise levels in the industry.This new instrument revolutionizes the field of resistivity imaging surveys by its capability to simultaneously measure up to 8 channels using a high power transmitter so that field data production can reach previously unheard of speeds
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Product
Utility Card: Flash Programming Applications
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This new feature enables the Keysight Medalist i3070 ICT to perform higher speed flash programming at the ICT station in the printed circuit board assembly manufacturing line. You can combine programming and testing into a single phase, to save time and money. This in-system programming (ISP) flash solution is tester-based and does not rely on fixtures, thus enabling greater flexibility and ease of debugging.
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
Shared Memory Network
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Avionics Interface Technologies
AIT's Shared Memory Network (SMN) interface modules provide host systems with an interface to a high speed (2.125 Gbps) optical data network which can be used to share data, in real-time, between multiple distributed systems.
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Product
MRAMs - Magnetoresistive Random Access Memory
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Teledyne e2v’s MRAMs type EV2A16A is an extended-reliability version of the MR2A16A from Everspin. It is the ideal memory solution for applications that must permanently store and retrieve critical data quickly. It perfectly suits the requirements of critical embedded applications such as avionic, aerospace and defence environments.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
High-Speed Memory Test Solution
UltraFLEX-M
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The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Product
Laser Flash Photolysis
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This system that makes complex electronics, cumbersome software and large optical benches a thing of the past. The LFP system incorporates everything needed except the excitation laser. This is a simple, yet powerful instrument, ready to perform a wide range of time resolved kinetic and spectroscopic measurements involving transient absorption or diffuse reflectance. The LFP system, including the monochromator and digitizer is completely computer controlled, making it easy to obtain
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Product
Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
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Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Product
Single Port RS232 Serial Communications Compact Flash Card
CF232
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The CF232 is a tiny Type I format Compact Flash (CF+) single RS232 asynchronous serial port for your PDA, laptop (with an optional adapter), or desktop (using one of Elan's Desktop PCMCIA adapters). The card automatically configures to become another COM port by using the built-in O.S. drivers that are tried and tested and are optimized to work in the Windows environment.
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Product
Flash Chromatography Columns & Cartridges
RediSep®
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A flash chromatography system, no matter the quality, needs superior columns to perform its best. That’s what you get with Teledyne LABS RediSep Flash Columns. Designed for high-capacity purification, RediSep columns are precision-packed for high resolution and reproducibility. They feature a one-piece design with no cumbersome or expensive adapters, valves, barrels, or other accessories. Luer end-fittings provide quick, easy connection to CombiFlash® systems You’ll enjoy fast, easy purification and scale-up from milligrams to tens of grams with RediSep Flash columns.
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Product
Single Port RS422/485 Serial Communications Compact Flash Card
CF428
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The CF428 is a tiny Type I format Compact Flash (CF+) single RS422/485 asynchronous serial port for your PDA, laptop (with an optional adapter), or desktop (using one of Elan's Desktop PCMCIA adapters).. The card automatically configures to become another COM port by using the built-in O.S. drivers that are tried and tested and are optimized to work in the Windows environment.
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Reflective Memory Analyzer
PEAZ-5565
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Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Product
Flash Point Tester
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A flash point tester is an instrument that determines the flash point of a sample.To find the flash point, heat the liquid in a container and then introduce a small flame just above the liquid surface.the temperature recorded as the flashpoint.
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Product
Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136B+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis
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Product
Automatic Tag Closed Flash Point Tester
LD-LACF-A10
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Automatic Tag Closed Flash Point TesterLD-LACF-A10is a highly automated machine with -50°C lowest flash point and simple operations. Used to determine flash point of liquids with viscosity below 5.5 cSt (mm2/s) at 40°C (104°F) or below 9.5 cSt (mm2/s) at 25°C (77°F) and flash point below 93°C (200°F) . Test method is complied with ASTM D56 international standard.
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Product
Flash Solar Simulators
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Sciencetech manufactures a range of flash solar simulatorsSee the Flash Solar Simulator Overview to compare products across different product lines.
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Product
Closed Cup Flash Point Testers
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Labodam closed-cup flash point testers are compact, stand-alone solutions which determine the low temperature operability in diesel fuel, biodiesel, blends and gas oils. They are designed as per Test Methods for Flash Point of Petroleum Products (Pensky-Martens Closed Cup Methods).
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Product
Flash In Disk-IDE
FID Series
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Axiomtek's FID (Flash in Disk-ATA) series is a high performance 2.5 flash disk and fully compatible with IDE standard which make it an ideal replacement for conventional IDE HDD without any driver or system modification. This 2.5 IDE flash disk is provided with huge capacities up to 256GB to meet diverse needs of data storage. With the features of high capacity storage, data integrity, anti-vibration and low power consumption, the FID series is surely a solid solution for expanding an industrial computers memory.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Memory Tester
RAMCHECK LX DDR3
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Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
