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Product
Sensors
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Contact and Non-Contact Sensors for CMM, Optical High Speed Scanning and Computed Tomogrpahy Systems
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Product
RF Device Tester
RF ITS
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Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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Product
Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Product
Scanning Probe Workstations
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BioLogic has over 25 years of experience producing scanning probe electrochemistry instruments. Initially this included a number of single technique instruments, with the first modular scanning electrochemical workstation, the M370, introduced in 2006, under the Uniscan name.Scanning probe electrochemistry has found use in academic and commercial research settings. It is applicable in any field in which bulk electrochemical measurements have been used. Scanning probe electrochemistry has found widespread use in: Corrosion and coatings, Biology, including biosensors and biotechnology, Batteries, fuel cells and photovoltaics, Materials, Catalysis
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Product
Handy Scan 3D
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The truly portable metrology-grade 3D scanners delivering highly accurate measurements.Truly portable and faster than everMetrology-grade accuracy and resolutionUser-friendly and easy to use
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Product
kSA Scanning Pyro
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For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
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Product
Software Composition Analysis
SCA
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*Test Immediately in Your Development EnvironmentLaunch scans right from the command line for fast feedback in the pipeline and IDE. See and fix code errors earlier in the Software Development Life Cycle.*Reduce Fix Time From Hours to MinutesAuto-remediation capabilities prescribe intelligent fixes, generate auto-pull requests, and minimize disruption for higher accuracy and faster fix rates. *Automate Open-Source Policy and GovernanceEasily manage your open-source usage with continuous monitoring, extensive analytics, and flexible policies.
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Product
Boundary Scan Test (BST)
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In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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Product
DARWin SP Data Acquisition Software
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Every SPECTRAL EVOLUTION Spectrometer and Spectroradiometer is supplied with the exclusive DARWin SP Data Acquisition software – a full-featured, menu-driven program for easy data manipulation and analysis of multiple UV/VIS/NIR spectra. The DARWin SP module features one-touch operation and easy, intuitive menus for fast, effortless operation. DARWin saves your scans as ASCII files for use with third-party software, including chemometric software, without pre-processing.
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Product
Framework for Soft-Error Protection
RobustScan™
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RobustScan™ provides a platform for users to pick patented Configurable Soft-Error Resilience (CSER) cells or their preferred SER mitigation cells. First, Soft-Error Rate (SER) analysis is performed. Then it performs automatic robust-scan-cell and hardenedcombinational- cell selection and synthesis. Finally it generates verification testbenches for the final design. RobustScan™ can be used with scan chains inserted using third-party tools; it can be linked to third-party�s SER analysis programs and is fully compatible with SynTest�s existing DFT tools for test, debug, and diagnosis.
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Product
Scanning Probes
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3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.
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Product
16-bit, 200KHz, 8SE/4DIFF Isolated AI, 4 12-bit AO, 8 Optically Isolated Dig. I/O, 24V, 24 TTL I/O
APCI-3116-8
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The APCI-3116 is a 16-bit multifunction board for 3.3 V and 5 V PCI systems, with optical isolation up to 1000 V and a high throughput rate of 200 kHz. The PCI board has additional types of conversion: Sequence RAM, Auto Refresh, scan, timer or external event.Furthermore, the board has a PCI DMA, 2 watchdogs, 4 digital inputs and 4 digital outputs. Sensors, which allow to supply current signals instead of voltage signals, also can be acquired with the APCI-3116, as this board offers up to 16 current inputs. The board is protected against overvoltage and input filter and it is protected against high frequency emmission. With the free calibration tool you can do the fine adjustment on-site.
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Product
TeleScan PE Software
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The powerful display allows users to group the devices in a simple device tree, Device/Port/Type, or Bus/Device/Function numbers. All register field descriptions are displayed by selecting the individual fields. Each register value in a single PCIe component's register can be read and if writable can be modified. The user can decode and change each bit value of any register on the fly using the built-in the PCIe specification display referenced for all registers. The extended register for M-PCIe is also decoded and displayed for devices supporting that specification. The PCIe/NVMe configuration space info on one system can be saved and later compared to a different system by loading a saved configuration onto a second system. Searching is available for locating PCIe devices. Other features include Auto Scan, Configuration Space View, Specification decoding for standard registers. The utility supports scanning on host machines using Microsoft Windows 7, 8, 10 and on Linux systems.
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Product
Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Product
Semi-automated Metrology System
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Full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness
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Product
Smart Analog to Digital
618/619
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Supports thermocouples, RTD's, strain gauges, voltage in, 4-20mA, thermistors, and resistorsUp to 16 differential input channels plus sensor excitationEach channel is software programmable for sensor type, gain, low-pass filtering, scan rateAuto-calibration eliminates trimpotsLow power consumption
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Product
NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Product
Portable Bar Code Verifier
Inspector Model D4000 CR2 Scanner
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The Model D4000 CR2 Scanner provide a Point-and-Shoot Traditional Method that also includes the ISO 15416 and ANSI X3.182 Decodability parameter grade. This unique portable bar code verifier can interface with either the patented RJS Auto-Optic scan head or a CR2 scanner (either in a single piece or connected with a cable). Store and print capability, multiple scan averaging and subsymbology choices are easily accessed through a simple four-button user interface. The scanners are easily installed by the user, which makes the unit quickly adaptable to practically any verification requirement.
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Product
4-Sensor R-G-B (Prism) Color Line Scan Cameras
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In addition to 3-sensor prism line scan cameras, JAI's Sweep+ Series includes a set of 4-sensor multispectral line scan cameras designed to simultaneously capture R-G-B image data in the visible light spectrum and image data in the near infrared (NIR) light spectrum.
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Product
Fully Portable Stand-Alone OTDRs
LOR-200
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The LOR-200 is a family of fully portable stand-alone OTDRs. The instrument is integrated in a Windows XP based PC-platform with touchscreen interface.The LOR-200 is based on Luciol's novel scanning photon-counting technology (US patent #7,593,098). It achieves a superior dynamic range, and allows high resolution fiber characterization up to a total distance range of 160 km.
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Product
Universal Cable/Harness Tester
LX-680
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Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface·Starting up conducts self-diagnosis and self-correction·The system can scan and direct automatically.·The system provides advanced instant open-circuit, short-circuit, continuity test, can test the wire break·It can function as unilateral, standard, multi-segment and spot test of wire·The maximum test voltage is AC1000V / DC1500V·The maximum test spot is 256.
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Product
Low-noise High-voltage Amplifier For Tube-scanners -
HV200/5
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The HV200/5 is a high-precision HV-amplifier designed for the control of tube scanners. It takes three input voltages In X, In Y and In Z (-10 V to + 10 V), amplifies them separately (input gain switches: x1, x2, x5, x10, x20) and adds an offset voltage between -10 V and +10 V. In a 2nd stage, the signal is amplified by a factor of 20. This enables its use as HV amplifier in scanning image acquisition applications, such as STM or AFM, with the capability to shift the scan range in high resolution imaging.
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Product
Microscopy
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Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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Product
Create Topographic Profiles from SPM Images
TopoStitch
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topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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Product
Line Scan Camera
Linea
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Introducing Linea, a CMOS line scan camera that can help you improve your imaging and lower your costs. Linea starts with an advanced CMOS sensor with high quantum efficiency and low noise for better images. Linea is also packed with advanced features to make your machine vision job almost effortless.
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Product
Easy3DMatch
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Align a scanned 3D object with another scan or with a reference meshCompute the local distances between 3D scans and a golden sample or reference meshDetect anomalies such as misplaced features, geometric distortions, gaps, bumps,...Compatible with all 3D sensors that produce point clouds, depth maps or height maps
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Product
Optical Scanning Systems
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that feature high scanning speed and accuracy. Our non-contact 3D scanners are ideal for 3D digitization of physical models, quality control and reverse engineering.
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Product
Area Scan Camera
Genie Nano-5GigE
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Engineered for imaging applications that require high-speed data transfer, the all new Genie Nano 5GigE is an easy replacement for gigabit ethernet cameras built into current vision systems that rely on the existing GigE Vision interface standard. The new Genie Nano 5GigE models feature the brand new 5Gbps (5GBASE-T) link speed.
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Product
Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
