Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Semi-Rigid Replacement Flexible Cables
StormFlex® 034, 047, 086, & 141
Ruggedness and durability combined with ultra-small 0.038" diameter, very low weight, and extreme flexibility make Storm Flex® 034 cable assemblies the perfect fit for applications including gimbal, digital test and high density.With 0.055" and 0.096" diameters, durable construction, and low profiles in SMA SP configuration, Storm Flex® miniature cables offer superior electrical performance in a trouble-free, compact assembly.Combining flexibility and durability with a larger 0.160" diameter, Storm Flex® 141 maintains excellent electrical characteristics through multiple flexures.
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Normalised Site Attenuation
NSA
Normalised Site Attenuation (NSA) is measured in accordance with CISPR 16-1-4 and ANSI C63.4 in semi and fully anechoic environment.
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Semi-Rigid Cable Set, 3.5 Mm (Test Port) To 3.5 Mm
85131D
The Keysight 85131D is an 53 cm (21 in) long1 semi-rigid cable set composed of a 3.5 mm female2 to PSC-3.5 mm female connector and a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt(f) + 0.2 dB, where f is frequency in GHz, for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is specified with a 90 degree bend using a 4 to 3 inch radius. Stability1 of the Keysight 85131D is less than 0.06 dB and phase is 0.16 * f + 0.5, where f is frequency in GHz.
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PXI Semi-Dynamic Digital I/O Module, 48-Channel
40-419-002
The 40-419-002 is a 48-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Semi-Rigid Test Probes Up to 6 GHz
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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Front & Backside, Semi-Automatic Mask Aligner
Model 800E
The OAI Model 800E front and backside, semi-automatic mask aligner system offers advanced features and specifications found most often in costly automated production mask aligners. With the development of this mask aligner, OAI meets the growing challenge of the dynamic semiconductor and MEMS market with a new class of mask aligners that are engineered for R&D and low volume production.
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PXI/PXIe Semi-Dynamic Digital I/O Module, 64-Channel
The 40-419-001 (PXI) and 42-419-001 (PXIe) are a 64-channel digital I/O modules suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. They can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Sapphire 3D Microscope
WDI-2000
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Semi-automatic 150mm Probe Station
CM460
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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600W to 1056W - Single Output
SWS-L Series
*Low Cost*Active Power Factor Correction*Input Transient Protected IEC61000-4*Universal Input (85 - 265VAC)*SEMI F47 Compliant (208VAC)*Medical Approvals (SWS1000L)
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Battery Pack ATS
8700
Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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Semi-automatic tensile testing machine
The controller of this testing machine automatically applies an appropriate load and puts the extensometer between the gauge lines, etc. after the sample is set. It provides measurement with high repeatability.
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PXI Semi-Dynamic Digital I/O Module, 64-Channel
40-419-001
The 40-419-001 is a 64-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Ultrasonic Clamp-On Flow Sensor
SEMIFLOW CO.65
SEMIFLOW CO.65 non-contact clamp-on flow sensors are ideal to measure abrasive, adherent, corrosive, and ultra-pure liquids on rigid plastic tubes and pipes used in the semiconductor industry. Equipped with an integrated electronic unit, they function as a complete flow meter in the size of a small transducer without an external board or transmitter.
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Semi-Automatic Tablet Tester
P-Series
The versatile P-series laboratory testers offer you the latest technology, a space-saving design, and maximum flexibility. Adapt the basic units (P3-P5) to your requirements at any time.The P5 version tests all five measured variables automatically. The VibrALIGN and Roto system make it easy to position tablets precisely.The intuitive touch display enables quick and easy operation. The measurements results are shown directly on the clearly arranged display, and can be printed out or exported as PDF reports.The LAB.line design also offers many practical advantages: the generous radii, rounded corners and smooth surfaces allow easy and hygienic cleaning. The sturdy hood provides protection against environmental influences during measurements.
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MOSFETs, MESFETs, and Schottky Diodes
Semiconductor Module
The Semiconductor Module allows for detailed analysis of semiconductor device operation at the fundamental physics level. The module is based on the drift-diffusion equations, using isothermal or nonisothermal transport models. It is useful for simulating a range of practical devices including bipolar, metal semiconductor field-effect transistors (MESFETs), metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, thyristors, and P-N junctions.
