Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Semi-automated Metrology System
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Full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness
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Brake Test Systems
Giant 8000 Series
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Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Semi-automatic Single Phase Close Link kWh Meter Test Bench
SY8120
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Hong Kong Songyang Industrial Ltd.
The SY8120 new series semi-automatic single phase energy meter test board, designed according to International Standard, is newly developed ideal measuring equipment for energy meters. The equipment can be operated easily through test board button to preset directly all data of meter under test and test process.
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RF Semi-Rigid Cable Assemblies
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The Semi-Rigid cables are available with a copper or aluminum jacket and available with a selection of different platings and 4 different diameters (.047", .085", .141" & .250"). The Conformable®, or Hand-Formable (BJ - Braided Jacket), has a tin filled braid with a metal foil underlay and is also available in the same diameters as the Semi-Rigid type . The Flexible version, our Mini-Flex, has an FEP jacket, round braid and inner spiral shields and is available in 2 diameters, .105" &.165". All 3 types (Semi-Rigid, Conformable & Mini-Flex) are manufactured using the same type dielectric core and have virtually the same electrical performance. The decision of which cable to use should be primarily based upon your application.
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Semi-Automatic Kjeldahl Analyzer
LD-LKA-A20
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LKA-A20 is a semi-automatic Kjeldahl analyzer having intelligent design. It is equipped with 4.3" LCD screen, automatic fault detection system and intelligent audible and visual alarm system. With features such as automatic alkali liquid quantification and filling, automatic boric solution quantification and filling, intelligent cooling water control system and emergency stop operation, it is a safe and reliable instrument.
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Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
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*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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Semi-Automatic Probe Station
P300A
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The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.
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600W to 1056W - Single Output
SWS-L Series
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*Low Cost*Active Power Factor Correction*Input Transient Protected IEC61000-4*Universal Input (85 - 265VAC)*SEMI F47 Compliant (208VAC)*Medical Approvals (SWS1000L)
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Semi- or Fully-Automatic Laser Repair System
LCD 6400
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The Korima Model 6400-L offers an exceptional laser cutting system that exceeds the requirements for flat panel display, large photomask, and color filter repair. Fully automatic and remote controlled, the 6400-L comes with single, dual, or triple wavelength to achieve optimum results in the removal of aluminum, chromium, ITO, and polymide on panels before or after assembly.
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Flexible Current Sensor Probe
CTA
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The CTA current sensors convert ac current to an isolated 0-5A current with available ranges from 100A to 10,000A. Because the current sensors are flexible split core, installation is possible without shutting down the LV electrical supply, avoiding expensive down-time costs. Typical applications are retrospective energy monitoring in factories, offices buildings, process control data logging systems, where power, energy and current monitoring is important. Typical applications are factories, offices buildings, ac/dc VFD drives, welding, power conversion and power distribution. For all CTA current sensor models, a NIST/NPL (UKAS) traceable calibration certificate and certificate of conformance is supplied. All CTA sensors use UL94V0 or CSA approved materials. The CTA flexible current sensors are suited to permanent or semi permanent installation. The coil sensor is durable, lightweight, flexible and will easily clip-around a power cable. The 5A output from the CTA current sensor connects direct to installed metering, rotary metering or current transducers.
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Product
PXI Semi-Dynamic Digital I/O Module, 64-Channel
40-419-001
Digital I/O Module
The 40-419-001 is a 64-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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32G SO-DDR4-3200 2GX8 1.2V SAM -20~85℃
AQD-SD4U32GN32-SB2
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Sapphire 3D Microscope
WDI-2000
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The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Battery Pack ATS
8700
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Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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Product
PXI Semi-Dynamic Digital I/O Module, 48-Channel
40-419-002
Digital I/O Module
The 40-419-002 is a 48-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
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CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Optical Transceiver
RJ-11
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The next generation of optical transceiver has arrived with the introduction of GCI's RJ-11 Optical Transceiver. This fully SEMI compliant and Hokuyo compatible unit is the choice of leading 300mm FABs and equipment manufacturers throughout the world to simplify installation and maintenance of their E84 communications.
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PI/O Optical Transceiver
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GCI's sensors are the preferred solution for E84 optical communications. GCI's full line of PI/O transceivers are fully compliant and are compatible with other manufacturers' sensors that conform to the SEMI Standard E84. Leading 300mm FABs, OEMs, and EFEM manufacturers choose the GCI sensor for its superior reliability and stability.
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6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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PXIe Semi-Dynamic Digital I/O Module, 64-Channel
42-419-001
Digital I/O Module
The 40-419-001 (PXI) and 42-419-001 (PXIe) are a 64-channel digital I/O modules suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. They can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
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Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Front & Backside, Semi-Automatic Mask Aligner
Model 800E
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The OAI Model 800E front and backside, semi-automatic mask aligner system offers advanced features and specifications found most often in costly automated production mask aligners. With the development of this mask aligner, OAI meets the growing challenge of the dynamic semiconductor and MEMS market with a new class of mask aligners that are engineered for R&D and low volume production.
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Semi-Automatic Tablet Tester
P-Series
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The versatile P-series laboratory testers offer you the latest technology, a space-saving design, and maximum flexibility. Adapt the basic units (P3-P5) to your requirements at any time.The P5 version tests all five measured variables automatically. The VibrALIGN and Roto system make it easy to position tablets precisely.The intuitive touch display enables quick and easy operation. The measurements results are shown directly on the clearly arranged display, and can be printed out or exported as PDF reports.The LAB.line design also offers many practical advantages: the generous radii, rounded corners and smooth surfaces allow easy and hygienic cleaning. The sturdy hood provides protection against environmental influences during measurements.
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10W to 100W - Single Output
DRL Series
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*High Efficiency, up to 90%*Low Profile for Building Automation*Class II Double Insulation*ErP Compliant Design*Low No Load Power Consumption*UL 1310 Class 2 Compliant*SEMI F47 Compliant
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Product
4G DDR3-1600 512X8 1.35V&1.5V SAM -20~85℃
AQD-D3L4GN16-SGH
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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MOSFETs, MESFETs, and Schottky Diodes
Semiconductor Module
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The Semiconductor Module allows for detailed analysis of semiconductor device operation at the fundamental physics level. The module is based on the drift-diffusion equations, using isothermal or nonisothermal transport models. It is useful for simulating a range of practical devices including bipolar, metal semiconductor field-effect transistors (MESFETs), metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, thyristors, and P-N junctions.
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
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The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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500W to 1500W - Single Output
LZSA Series
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*Five year warranty*-40°C to +71°C Operation*MIL-STD-810E Vibration / Shock*Input transient protected*UL508, SEMI F47, Factory Mutual (Cl 1, Div 2)*Rugged design with conformal coating*Superior thermal design
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Product
Electric Burn-in Board Carts
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Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
