Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
-
Product
Host emulator
E84
-
Precision Development Consulting Inc
A USB controlled and self-powered emulator for functional testing SEMI E84 implementations. (E84-1000) This was developed because there was nothing like it in the marketplace, and it was clearly needed. This product enables a factory automation engineer to perform E84 functional testing anywhere in the world. Weighing less than 5oz, it is neither a burden, nor a power hog. You will never need to look for an additional power receptacle in the fab. The emulator gives the user full control over the sequence so that any test can be performed. Existing products were large and unwieldy, and provided canned tests that could not be modified to meet the requirements that Fab managers impose on their suppliers.
-
Product
PXIe Semi-Dynamic Digital I/O Module, 64-Channel
42-419-001
Digital I/O
The 40-419-001 (PXI) and 42-419-001 (PXIe) are a 64-channel digital I/O modules suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. They can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
-
Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
-
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
-
Product
PXI/PXIe Semi-Dynamic Digital I/O Module, 64-Channel
Digital I/O
The 40-419-001 (PXI) and 42-419-001 (PXIe) are a 64-channel digital I/O modules suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. They can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
-
Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
-
Product
PXIe Semi-Dynamic Digital I/O Module, 32-Channel
42-419-003
Digital I/O
The 40-419-003 (PXI) and 42-419-003 (PXIe) are a 32-channel digital I/O modules suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. They can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
-
Product
Semi-Rigid Cable Set, 3.5 Mm (Test Port) To 3.5 Mm
85131D
-
The Keysight 85131D is an 53 cm (21 in) long1 semi-rigid cable set composed of a 3.5 mm female2 to PSC-3.5 mm female connector and a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt(f) + 0.2 dB, where f is frequency in GHz, for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is specified with a 90 degree bend using a 4 to 3 inch radius. Stability1 of the Keysight 85131D is less than 0.06 dB and phase is 0.16 * f + 0.5, where f is frequency in GHz.
-
Product
Control & Automation Solutions
-
Produce a consistently high-quality product with a control system that’s easy to integrate into any process, simple or complex. Probat control systems feature clearly designed user interfaces and the ability to store and export production data as needed. Available as both semi- and fully automatic systems, our control systems enhance the performance of our commercial coffee roasters and grinders to yield superior results.
-
Product
Semi-automatic Semiconductor Probe Assembly Equipment
-
The components of the incoming parts are pre-assembled and preloaded to two packages. We use a high-speed four-axis robot equipped with high-precision multi-sensor grips to grab these pre-assembled subcomponents. Under CCD visual guidance, a set of rotary grab devices is equipped to capture top plunger. The device uses a multi-set CCD visual module to ensure accuracy, and the positioning accuracy of each motion link is controlled within 15um.
-
Product
Semi-Portable Gas And Leak Detectors
-
Semi Portable Gas Detectors and Leak Detectors meet the diverse requirements for gas detection industries throughout the world. Our range offers an ideal solution where a temporary detection or contractual detection is required for a specific project or incident.
-
Product
Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
-
*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
-
Product
Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
-
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
-
Product
Semi-automatic Three-phase kWh Meter Test Bench
SY8310
-
Hong Kong Songyang Industrial Ltd.
The new SY8310 series semi-automatic three phase energy meter test board, designed according to International Standard, is a newly developed ideal measuring equipment for energy meters. The equipment can be operated easily through test board button to preset directly all data of meter under test and test process.
-
Product
Create Topographic Profiles from SPM Images
TopoStitch
-
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
-
Product
PI/O Optical Transceiver
-
GCI's sensors are the preferred solution for E84 optical communications. GCI's full line of PI/O transceivers are fully compliant and are compatible with other manufacturers' sensors that conform to the SEMI Standard E84. Leading 300mm FABs, OEMs, and EFEM manufacturers choose the GCI sensor for its superior reliability and stability.
-
Product
Semi-Automatic LCD Probe Station/Laser Repair System
LCD 2424
-
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
-
Product
PXI Semi-Dynamic Digital I/O Module, 64-Channel
40-419-001
Digital I/O
The 40-419-001 is a 64-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
-
Product
Semi-automatic 150mm Probe Station
CM460
-
CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
-
Product
Semiconductor Package Wind Tunnel
WT-100
-
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
-
Product
Emulator
GCI E84
-
The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
-
Product
Semi-Rigid Test Probes Up to 6 GHz
-
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
-
Product
Customization & Automation
-
For production and test bench applications, the operation of the measurement needs to be either semi or fully automated. On top of its turnkey solutions, Oros offers a large number of tools to open the programming access. This can be addressed based on all levels of programming expertise achieved by OROS users themselves, local partners or OROS teams.
-
Product
Semi-Preparative SFC System Configurations
SFC-4000 Series
-
The semi-prep SFC has capacity for larger scale purification, but can still be used for analytical scale method development. The system is optimized for 10mm and 20mm ID columns. The open-bed fraction collector can be triggered on time, threshold or slope based on signals from up to 4 different detectors signals including UV, PDA, fluorescence, CD and/or MS. The macro cyclone separators provide simple gas-liquid separation for excellent fraction recoveries typically greater than 95%. Fractions can be collected using an open bed fraction collector or an 8-way valve.
-
Product
PXI Semi-Dynamic Digital I/O Module, 16-Channel
40-419-004
Digital I/O
The 40-419-004 is a 16-channel digital I/O module suitable for operating external devices, such as power, RF and high voltage relays, solenoids and lamps. It can also be used for interfacing with external logic such as a programmable instrument with a BCD interface depending upon the module’s driving capabilities.
-
Product
Wafer/Chip/Package Semi-automated ESD Tester
400SW
-
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
-
Product
EasyMatrixCode
-
Automatic detection of the code in the imageDecodes ECC200, ECC000, ECC050, ECC080, ECC100 and ECC140 codesComputes quality indicators as per ANSI/AIM, ISO/IEC 15415, ISO/IEC TR 29158 and SEMI T10-0701 standardsVery fast operationImpressive robustness to noise, blur and distortionSupport of GS1 Data Matrix codesEfficient reading of codes in grid layoutMultiple codes reading
-
Product
Brake Test Systems
Giant 8000 Series
-
Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
-
Product
Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
-
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
-
Product
Metrology Solutions for Semiconductors
-
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
-
Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
