Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Product
Hand-Held, Battery-Operated Multi-Frequency Eddy Current Instrument
US-454A
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United Western Technologies Corp
The US-454A is a portable, hand-held, battery-operated multi-frequency eddy current instrument that can be connected to a laptop, PC and motion controllers for use in semi- or fully automatic data collection applications. Two encoder inputs enable position stamping of data. Pulse-on position input is ideal for motion control applications. Ethernet and USB capabilities allow instrument control along with time- and position-stamped data transfer to the client computer. Built from the rugged US-454 architecture, the US-454A offers single- and multi-frequency inspection, frequency mixing capabilities, enhanced signal-to-noise ratio, USB, Ethernet and data storage capability, and unprecedented digital strip chart data collection.
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Product
Ultrasonic Clamp-On Flow Sensor
SEMIFLOW CO.65
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SEMIFLOW CO.65 non-contact clamp-on flow sensors are ideal to measure abrasive, adherent, corrosive, and ultra-pure liquids on rigid plastic tubes and pipes used in the semiconductor industry. Equipped with an integrated electronic unit, they function as a complete flow meter in the size of a small transducer without an external board or transmitter.
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Product
8G DDR3-1600 512X8 1.35V&1.5V SAM -20~85℃
AQD-D3L8GN16-SGH
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SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger, Anti-sulfuration, Semi Wide-temp Support -20~85℃.
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Product
Semi-Automatic LCD Probe Station/Laser Repair System
LCD 2424
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The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
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Product
Semi-automatic 150mm Probe Station
CM460
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CM460 Semi-automatic 150mm probe station step & repeat, point & shoot, color mapping, and complete software control.
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Product
Wafer/Chip/Package Semi-automated ESD Tester
400SW
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Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
