Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Product
Conductivity Type Tester
HS-HCTT
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It is strictly designed according to the requirements of the hot-probe thermal EMF conductivity type test in standard ASTM F42: Standard Test Methods for Conductivity Type of Extrinsic Semiconductor Materials. A temperature controlling heating element is installed inside the hot probe so that the hot probe is heated automatically and its temperature is maintained in the range 40-60℃.
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Product
Datapaq Reflow Tracker System
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Monitor the temperatures for every soldering application – including wave, reflow, vapor phase, selective and rework stations – in real-time with the Datapaq Reflow Tracker Systems. Ideal for the electronics manufacturing and semiconductor applications.
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Product
Semiconductor
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Engineered ceramics are used in the semiconductor industry because of their excellent material properties. Ultra-pure ceramics are often used in the whole cycle of semiconductor manufacturing including Semiconductor Wafer & Wafer Processing, Semiconductor Fabrication (Front End), and Semiconductor Packaging (Back End).
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Product
Non-Linear Junction Detector
ORION® 2.4 HX
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The ORION 2.4 HX Non-Linear Junction Detector (NLJD) detects electronic semi-conductor components in walls, floors, ceilings, fixtures, furniture, containers, or other surfaces. The ORION 2.4 HX NLJD is made to detect and locate hidden cameras, microphones, and other electronic devices regardless of whether the surveillance device is radiating, hard wired, or turned off.
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Product
Semiconductor Products
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International Testware Corporation
International Testware supports all major ATE models for today's semiconductor products.CredenceAdvantestCaesarHewlett-PackardLTXIMSSchlumbergerAndo...and MANY moreTeradyneMosaidOur Solutions offer:Mixed-SignalEMI ReductionR/FCustom TailoredLow NoiseReliable PerformancePrecise Length MatchingSuperior Impedance ControlCrosstalk "Immunity"Minimal Inductance
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Product
Pulsed IV Systems
AM3200-Series
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AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
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Product
Mixed Signal Test Systems
MTS1000i
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The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Product
Package Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
3U CompactPCI-Serial
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Advantech offers 3U CPCI-Serial CPU blades, I/O blades and AC/DC power modules to build up solutions in railway, semiconductor, healthcare markets.
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Product
FluorOptic Fiber Optic Temperature Sensors
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Advanced Energy’s Luxtron® Fiber Optic Temperature Sensors enable customer innovation in complex applications for a wide range of industries including semiconductor equipment, industrial, manufacturing, telecommunications, data center computing, and medical. Based on Fluoroptic® technology, each individual product can be configured for specific applications.
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Product
Semiconductor
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With state-of-the-art manufacturing facilities in the U.S., Europe and Asia, local sales offices throughout the world, and on-site applications support, FUJIFILM Electronic Materials is your global partner.
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
Surface Photovoltage
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The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes.
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
Baratron® Isolation Systems
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These Isolation Systems are designed to automatically maintain a heated Baratron® capacitance manometer at vacuum throughout a process cycle. Maintaining a heated Baratron® capacitance manometer at vacuum is one of the most important ways to optimize its accuracy and repeatability in production systems, making this product especially well-suited for fast-cycling industrial and semiconductor manufacturing processes.
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Product
Test System
Series 4x
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The 4x is the next generation test system for discrete semiconductors. Designed with high volume production in mind, the system is also ideal for incoming or general purpose test applications.
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Product
Defect Inspection Systems
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Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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Product
Semiconductor Device Testers
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are particularly suitable for certain semiconductor test requirements, but other models may also be of interest. Our knowledgeable application engineers can guide you to the most suitable model.
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Product
Probe Card Solutions
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Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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Product
Moisture Analyzer
5800
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The 5800 is ideal for high-purity gas production, semiconductor gases, and the production, storage and transmission of olefins. It is suitable for use in industries including hydrocarbon processing, industrial gas and semiconductors.
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Product
Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Product
Wide Temperature Range HDR USB3.1 Gen1 Camera Board (Color)
See3CAM_CU20
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See3CAM_CU20 is a 2.0 MP HDR USB camera board with ultra-Lowlight performance. It has an ability to stream seamlessly at wide temperature range (-40°C to 85°C). This Full HD USB3.1 Gen1(5Gb/Sec.) camera is based on 1/2.7" AR0230AT CMOS digital image sensor with a pixel size of 3.0 μm x 3.0 μm from ON Semiconductor™. It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement. It is a Plug-and-Play camera (UVC compliant) for Windows, Linux. This HDR camera is also backward compatible with USB 2.0 host ports.
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Product
Power Amplifiers
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In this product category you find highly linear power amplifiers for digital and analog data transmission, power amplifiers for CW applications and for laboratory use, which stand out due to its liability, robustness and long-term availability and which are based on the semiconductor technologies which are actually available on the market.
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Product
PXI 16x SPST High Voltage Reed Relays
40-310-101
Reed Relay
The 40-310/320 Range of High Voltage Switching Modules will hot switch up to 750V peak and cold switch up to 1000V peak in either general purpose relay (40-310) or multiplexer (40-320) configurations. These modules contain high-quality reed relays with switching ratings comfortably higher than the 40-310/320 specification. Applications for the 40-310/320 series modules include; circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
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Product
Pattern Region of Interest Analysis System
PRIAS
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PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Parts Screening And Testing
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DPA Components International performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability Commercial, Industrial, Space, and U.S. Military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications.
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Product
Radiation Detectors
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High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
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Product
MBE Technologies
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When you’re creating thin films of exotic compound semiconductor materials one crystal at a time, you need a molecular beam epitaxy system that is configurable for different applications.
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Product
Noise Suppression Products / EMI Suppression Filters / TVS Diodes (ESD Protection Devices)
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Murata noise suppression products include compact EMI suppression filters that efficiently eliminate noise, L Cancel Transformers (LCTs) that greatly suppress noise in high-frequency bands by reducing the ESL generated inside capacitors and in boards, and TVS Diodes that guard semiconductor devices against electrostatic discharge from external sources. Murata supplies products that support a variety of approaches to suppressing noise.
