Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Light Microscopes
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Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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ELECTRONIC MEGOHMMETER
MI-1050e
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The MI-1050e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 1 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 2.000.000 MΩ with four test voltages: 100 V, 250 V, 500 V and 1.000 V.
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Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Electronics Consulting
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Our approach to consulting is unique. We encourage you to participate in every phase of the study. We provide you with all the information and knowledge that you need to repeat the study and perform future studies independently. Our reports are detailed and comprehensive. A consulting project may get over in a set time period but we expect our relation to continue. Our mission is to empower you through our products and services.
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Laser Scanning Microscopes
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A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
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Microscope Cameras
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High-performance USB microscope cameras with the latest SONY global and rolling-shutter sensors and advanced feature sets such as external trigger and readout functions.
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Electronic Kits & Modules
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This kit contains everything you need to build, the microcontroller will be programmed with the latest firmware before shipping.
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Electronic Line Stretchers
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Simplify VCO measurements with controlled phase shifts from 180 to 1300 MHzOver 360° phase shift of the reflected signalNormalized and stable magnitude of the reflected signalVoltage controlled for automated applications
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STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
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Benchtop Fiber Microscope
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BL-C series X/Y Axial Adjustment benchtop fiber microscope is used to inspect the polished surface or cleaved ends of fiber optic connectors. With a critical view of fine scratches, the BL-C series benchtop fiber optic microscope is an ideal choice for factory post-polish, component assembly, QC inspection of fiber connectors.
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Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Electron Probe Microanalyzer
EPMA-1720
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Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Electronic Ballast Tester
WT5000
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WT5000 is the updated version of WT3000 with a super LCD for displaying waveforms and parameters directly, and it includes all the functions and technical parameters of WT3000. Reports can be printed if printer is connected. It also meets the latest requirements for electronic ballasts in international standards IEC 60929, IEC 60969, IEC 61000-3-2, GB/T15144-2005, GB/T17263-1998 and so on.
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Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Electronic Components Test
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Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.
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AC Electronic Load
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The electronic AC loads cover a wide variety of different voltage, current and power ranges. All the AC loads are programmed with 11 different sine, square and DC waves. With 5 crest factor variations of each, a total of 55 waveforms are available. An external input is also provided to enable the user to amplify signals from a waveform generator.AC Loads allow real world operating conditions to be simulated. Typical applications include circuit breaker, transformer & UPS output testing along with general laboratory and research work.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Electronic Loads
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PeakTech Prüf- und Messtechnik GmbH
Can be used for important test procedures in quality assurance as well as e.g. testing of power supplies and control units, batteries, fuel and solar cells. For precise load control for various purposes, this device offers load control according to constant voltage (CV), constant current (CC), constant load resistance (CR) or constant power (CP) with a highly precise resolution of 1mW, 1mV, 1mΩ and 1mA. The device also offers additional test modes, e.g. the battery test or the dynamic test. The PC interface and software offer the option of implementing freely programmable test sequences with data evaluation.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Electronic Testing
1148675
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The Electronic Testing probes by FEINMETALL represent the pinnacle of precision technology, tailored for a wide variety of applications in the electronic components sector. With over 60 years of expertise, these sophisticated probes are designed for rigorous tasks including board tests and wire harness validations. They excel in both low and high-current applications, providing reliability and efficiency in demanding environments. The probes are engineered for precision, ensuring effective electrical contact in tightly packed configurations, making them suitable for modern electronic testing needs.
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Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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3D Measuring Laser Microscope
LEXT OLS5000
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The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Electronic Moisture Analyzer
MOC-120H
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The moisture content of a variety of samples can be measured using an array of drying modes. The drying status can be seen at-a-glance with the fluctuation range display. Active in a variety of fields (cereals, starch, flour, noodles, brewed products, sea foods and marine products, meat products, spices, sweets, dairy products, dried foods, vegetable oils and other food articles; pharmaceuticals; ores; cokes; glass materials; cement; chemical fertilizers; pulp and paper; cotton; various fabrics and other industrial goods); enabling measurement of samples (cereals, foods, and chemical products) under various conditions (powder, particles, paste, and liquid).
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Digital Video Microscope
BVM-20102
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; easy operation, reducing user's fatigue and injury.
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Electronic Crockmeter
TF411
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TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
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ELECTRONIC MEGOHMMETER
MI-5500e
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The MI-5500e general purposes megohmmeter is a truly portable equipment suitable to measure insulation resistances using test voltages up to 5 kV. It employs high-reliable, state-of-the-art technology for accurate measurements of ultra high insulation resistances up to 10.000.000 MΩ
