Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Product
RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 4.3-10, 2 Port
85094D
Electronic Calibration Module
The Keysight 85094D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
High Power DC Electronic Load
3350G Series（4KW~6KW）
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Each 3350G Series module has its own control and display panel, CC / CR / CV / CP /Dynamic modes, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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Product
Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Digital Electronic Scale
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A type of electronic weighing machine, which is used to measure many readings
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Product
Microscope Platforms
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Product
Widefield Microscopes
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Widefield microscopes are available in different versions. Choose an upright microscope if your task is to analyze zebrafish embryos, stained tissue selections or brain slices. For tissue culture and quick assessments in routine research, the inverted microscope might be the better choice.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Digital Microscope Camera
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Providing you the best range of digi eye 510 microscope camera, digital microscope camera, digi eye 510c microscope camera, digi eye 210 digital microscope camera, digi eye 510c digital tablet and digi 4k microscope camera with effective & timely delivery.
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Product
Electronic Component Counter
ZE 300
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REINHARDT System- und Messelectronic GmbH
Instead of the widely used photoelectric barrier technology a new measuring technology is used in the new electronic component counter ZE 300: The laser technology offers a measuring beam with higher energy density and therefore more precise counting and faster counting speed. The ZE 300 component counter is microprocessor-controlled.
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Product
Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Electronic Testing Services
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Printed Circuit Board Testing and Repair Services CM Wings Board Testing Inc. was founded in 1983. Its founding was a direct response to theneed for a truly customer service oriented facility for printed circuit board test and repair.
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Product
PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
Load Module
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Electronic Instruments
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The ORTEC range of modular electronics includes instruments in NIM formats as well as other modular instruments, such as photomultiplier bases, preamplifiers and other accessories. ORTEC also offers modular instruments for pulse height spectroscopy, fast timing, counting, high voltage power supplies and other special functions.
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Product
TOC-L For Monitoring A Microscopic Algae Biomass
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Biomass is considered a prospective new energy source. The dry weight method has been typically used to determine the amount of microscopic algae in biomass. However, Shimadzu proposes a new method, one that is rapid, easy, and accurate, utilizing the TOC-L total organic carbon analyzer.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Product
Programable Power Supply & Programable Electronic Load
EL-820P
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*Digital button control and easy operation*High resolution(20mV, 10mA, 0.1W, 0.1Ω)*Overload prevention function*9 sets programmable memory*4 sets real time display*Voltage range: 1V~63V*Current range: 10mA~15A*Maximum power: 200W*Operation mode: CV, CC, CP and CR*Built in USB interface
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Electronic AC Potential Standard
PMT25010
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Power Measurement Technologies Inc.
Provides the electronic equivalent of a standard potential transformer as typically required for instrumentation potential transformer accuracy testing.
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Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Microscopic Probes
M12PP
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CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
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Other Power Electronic Capacitors
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AC/DC Power Film Capacitors, DC Pulse Current Capacitors, DC Filter Capacitors, Pulse Grade Capacitors, Motor Run Capacitors, Feed-Thru Capacitors and other Customized Capacitors
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Product
Electronic Pressure Comparator
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Huaxin Instrument (Beijing) Co., Ltd
When it comes to simultaneous pressure calibration for several pressure measuring instruments, electronic pressure comparator is always a great choice for most of people. The comparison calibrator features 5 pressure ports which allow simultaneous connection of 4 pressure gauges under test, making calibration more efficient and time saving. It also comes with an external air source for easy and precise pressure generation and servo valve for stable pressure control.
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Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Metallographic Microscope
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Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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Electronic Circular Temperature Chart Recorder
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The Circular Temperature Chart Recorder’s external stainless steel probe allows you to measure the temperature of air, gas, liquids and semi-solids. The temperature chart recorder has a quartz clock movement, motorized chart advance and temperature accuracy of ±2°F (±1°C). The chart recorder comes in °F or °C models and runs on 120V or 220V AC, 50/60 Hz. A rear compartment houses 8 AA alkaline batteries, providing up to 48 hours of continuous recording in the event of a temporary power loss.
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Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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4kW Electronic Load
PT04-48
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For Telecom Rectifier and Power Supply testing. This model has been developed to accommodate testing of both 48V and 24V telecommunications power systems or Power Supplies. It is also useful as a general-purpose variable Load. Its founding principle is simplicity – ease of use, enhanced reliability, greater value for money and wider applicability.
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Portable Video Microscope
Cl-1000
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Video microscope system ideal for installation site. Enables the user to inspect mounted connector endface from the other side of adapter.
