Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Electronic Light Table
ELT®/Series
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The ELT/Series software provides powerful imagery and geospatial exploitation tools for a wide range of applications, including intelligence, mission planning and disaster management.
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Electronic Calibration Module (ECal), 18 GHz, Type-N, 50 Ohm, 2-port
N4690D
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The Keysight N4690D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4690D is a precision 2-port ECal module that supports 50-ohm type-N connectors up to 18 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4690D is included for securing your ECal module and accessories.
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Stereo Zoom Microscopes
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Our product range includes a wide range of gemstar stereo zoom binocular microscope, gemstar stereomaster binocular stereo zoom microscopes, zoomstar iii trinocular stereo zoom microscopes, zoomstar ii trinocular stereo zoom microscopes, zoomstar vi trinocular stereo zoom microscopes and zoomstar v trinocular stereo zoom microscopes.
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LED DC Electronic Load Simulator
3340G Series（150W~300W）
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Each 3340G Series module has its own control and display panel, LED/CC/CR/CV/CP/ Dynamic modes, plug in 3300F with 150 sets Store/Recall memory which provides load set-up more efficiently，also can be controlled intranet via RS232、Ethernet、USB and GPIB interface.
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Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Raman Spectrometer - Confocal Raman Microscope
XploRA™ PLUS
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Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.
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Digital Electronic Tensile Test Machine
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Shenzhen Chuangxin Instruments Co., Ltd.
The Tensile Testing Machine is widely applied to test the tensile, tear, peel, and bend of all kinds of materials, such as metal, cable and etc, it’s used to test the tensile, tear, peel, compressive strength and bending of the material. It conforms to the standard of GB, ISO7500/1, JJG475-88, ASTME4, DIN5122, JISB7721/B7733, EN1002-2, BS1610, and CNS9471/9470.
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Electronic Transformer Test System
UI2000-ET
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• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Electronic Compass Kit with Serial Cable & Revolution PC Software
E-value-ation Kit
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All of our electronic compasses are available à la carte or combined with software and cables. We offer an E-value-ation Kit which includes a housed compass module, a serial cable, Revolution PC software, and a user’s guide. For these kits, you will need a PC or laptop that has a nine-pin serial or USB connection.
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Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Control Electronics
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Data acquisition and control electronics for optical radiation sources and measurement systems including precision current and voltage supplies for LEDs and tungsten halogen lamps.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Workshop Equipment for Electronics
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PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
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600W Bench Electronic Load, Dual Input 150V, 60A, 300W
EL34243A
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Keysight’s EL30000 Series bench electronic loads consist of three models, all with a built-in data logger. The EL33133A basic performance electronic load offers an economical price, a limited range, and a single 40 A, 150 V, and 250 W input. Two performance models offer additional ranges, the EL34143A single input 60 A, 150 V, 350 W, and EL34243A dual input 60A, 150V, 600 W.
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4kW Electronic Load
PT04-48
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For Telecom Rectifier and Power Supply testing. This model has been developed to accommodate testing of both 48V and 24V telecommunications power systems or Power Supplies. It is also useful as a general-purpose variable Load. Its founding principle is simplicity – ease of use, enhanced reliability, greater value for money and wider applicability.
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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SQUID Electronics
SEL-1
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SEL-1 is a robust and proven SQUID electronics for high-Tc and low-Tc SQUIDs and magnetometers.
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Product
Scanning Acoustic Microscope
Echo
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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3D Measuring Laser Microscope
LEXT OLS5000
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The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Electronic Loads
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Flexible electronic DC loads for general purpose applications. Voltage up to 80V, current up to 80A and power up to 600 watts. CI, CR, CG, CV and CP modes, built-in transient generators. Models with USB, RS232, GPIB and LXI compliant LAN interfaces.
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4kW Electronic Load
PT04-110
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For Telecom Rectifier and Power Supply testing. This model has been developed to accommodate testing of both 110V and 48V telecommunications power systems or Power Supplies. It is also useful as a general-purpose variable Load. Its founding principle is simplicity – ease of use, enhanced reliability, greater value for money and wider applicability.
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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High Speed-Large Current DC Electronic Load (CC/CV/CR/CP)
PLZ-4WL Series
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While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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Power Electronics Test Bench
OP1300
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The multi-purpose and ready-to-use Power Electronics Test Bench combines a state-of-the-art Hardware-in-the-Loop (HIL) simulator from OPAL-RT with Imperix’s Rapid Control Prototyping (RCP) system and real power hardware. It enables rapid development of power electronics, drives and smart-grid applications across industry and academia.
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AC & DC Electronic Loads
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The Adaptive Power Systems Electronic Loads cover a wide range of power levels, voltage and current profiles and feature sets.Supported voltages range up to 1250Vdc or 350Vrms AC. From bench to system and DC or AC requirements, we can more than likely offer you the optimal programmable load to meet your needs.
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Electronically Tunable Filters
ETF
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Radar. Communications. EW/SIGINT. Frequency agile channelization. Frequency agile noise rejection filter. Local oscillator tracking filter. Controlled bandwidth and center frequency noise source.
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600~1500W DC Electronic Loads
JT632 series
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Nanjing Jartul Electronic Co., Ltd
JT632 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT632 series load very suitable for testing power supply when produced in large quantity. Besides, JT632 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT632 series load satisfing most of R&D requirements.
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High Resolution Microscope for Multi-fiber Connector
D SCOPE MT
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The new D SCOPE MT microscope for MTP/MPO connectors is the fastest on the market. In the same measurement cycle, D Scope MT checks every optical fiber surface condition, and allows the operator to control the cleanliness of the connector endface and guideholes.
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Product
Microscopes
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A scientific instrument designed to produce magnified, high-resolution images of objects.
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Product
DC Electronic Loads
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Keysight DC electronic loads provide you with the flexibility to test a wide range of applications from power-supply test to simulation of high-intensity discharge (HID) headlamps. The 16-bit voltage, current and power-measurement system provides both accuracy and convenience, and eliminates the need for a DMM, external shunts and wiring.
