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Environmental Test Systems
Manufactured products can be exposed to both thermal and mechanical stresses.These should not be considered separately, as the effects may be linked.IMV can supply vibration-test systems combined with climatic chambers to provide complete vibration, temperature and humidity environmental testing.These systems can be custom-designed to meet your application.
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Speed Switch Sensor & System Testing Device
The SpeedMaster with Pulse Pilot provides independent, real time, and complete verification of an entire speed monitoring system to ensure that alarms and shutdowns are working as expected.
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Ferrite Devices
Ducommun's products include very broad ferrite device selections to cover 100 MHz to 110 GHz operation frequency range. These devices include narrow band drop-in (FID and FCD), connectorized (FIC and FCC), junction (FIW and FCW) isolators and circulators and iso-adapters (FII and FCI). The broad bandwidth versions are offered as full band junction isolators and circulators (FIF and FCF) and Faraday isolators (FFF). These devices feature low insertion loss, high isolation and wide operating temperature range. Low cost and volume production versions of these ferrite devices are available per customers’ request.
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Crypto Devices
Confidential communications are essential to armed forces and government authorities. The Rohde & Schwarz crypto devices provide secure end-to-end encryption for the secure transmission of sensitive information over public communications networks or radio transmissions. Rohde & Schwarz crypto devices are interoperable with HF/VHF/UHF radios, satellite communications and line transmission equipment. They can encrypt and decrypt voice and data communications at the highest security levels. The crypto devices are ideal for stationary and mobile platforms in rugged terrain and in naval and airborne environments.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Impulse Current Test Systems
Fivestar HV Testing Equipment Co., Ltd.
Impulse current test systems are mainly used for testing transmission and distribution systems against the effects of direct or indirect lightning strokes or against electromagnetic interference effects. Primary application of impulse current test systems is the testing of surge arresters, nowadays mainly of the metal-oxide type (MOA) and surge protection devices (SPD). Now they are also widely used to test vehicles, aircrafts, and military applications.
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Automatic Hysteresis Graph Test System
DX-4DMT
X-4DMT automatic hysteresigraph system accords with the standard permanent magnet test system, GB3217-92, used to measure the major and minor hysteresis loops, demagnetization curves, recoil hysteresis loops and initial magnetization curves in different temperature of ferrite, AlNiCo, SmCo, NdFeB and quenched material, and gives the magnetic parameter, Br, Hcb, Hcj, (BH)max, Hk and so on, and could meet different requirements on test function, precision, power capability, reliability, efficiency, price, local environment from laboratory to enterprise's production line.
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Vibration Test Systems
L.A.B.’s Vibration Test Systems help you design high quality, cost-effective products and shipping containers by accurately measuring sensitivity to vibration.
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68-Pin SCSI Micro-D Male Discrete Wire
40-962-068-M
This connector is designed to allow users to directly terminate with IDC connections to the 68-Pin SCSI Style Micro D connector. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Visible / Infrared / Imaging Test System
System 1808
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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SAS Protocol Test System
M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Universal Test System
LS6601A
LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Smart Network Emulation for All Mobile Device Tests
CMWcards
Use R&S®CMWcards to prepare the tests you always wanted, but never found the time to set up. Create wireless signaling and application tests on the R&S®CMW500 wideband radio communication tester just by setting up a hand of cards – no programming required. Revolutionary card wizards and unique game rules guide you through setting up test sequences that fully comply with test specifications. Thanks to the R&S®CMW500 tester’s unrivaled multi-technology capability, R&S®CMWcards can be used to rapidly reproduce signaling scenarios for various wireless communications standards.
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Transformer Test System
Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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(1000kN) Fatigue Testing Systems
8805
The 8805 is a 4-column, 1000 kN servohydraulic fatigue testing machine. It features a high-stiffness and precision-aligned load frame, with hydraulic lifts and locks, and an actuator in the upper crosshead.
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Automatic Transformer Test System
TH2829LX
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Low Resistance Test System
9100-2
Palico Instrument Laboratories
The Model 9100-2 measures the resistance of single or multiple battery separators quickly and accurately when used with our Model 9000-9100 Electrolyte Test Bath. This system uses a 4-terminal measurement technique which cancels the effects of electrode/electrolyte potentials.
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Wireless Device Test Sets & Wireless Solutions
Keysight products provide mobile phone designers and manufacturers with increased measurement speeds, improved accuracy, and exceptional flexibility for testing mobile devices. Our one box test sets cover all the major technology formats: LTE-Advanced, LTE (FDD and TDD), GSM/GPRS/EGPRS/E-EDGE, W-CDMA/HSPA/HSPA+/DC-HSDPA, cdma2000®/1xEV-DO/eHRPD, TD-SCDMA/TD-HSDPA/TD-HSUPA, IS-95, TIA/EIA-136, AMPS, Bluetooth®, Bluetooth Enhanced Data Rate (EDR), Bluetooth Low Energy, ZigBee™, Wireless LAN (WLAN), 802.11a/b/g, 802.11n, NFC/EMV, MIMO, and WiMAX™.
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Test Case Management System
Kiwi TCMS
The leading open source test case management system. *Efficiently manage test cases, plans and runs*Improve testing productivity & reporting*Integrates with popular issue trackers*External API interface*GPL 2 licensed
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Medical Devices
As more medical devices become wireless, manufacturers will be looking for compact and affordable testing solutions for wireless components. Copper Mountain Technologies’ USB vector network analyzers provide portable, cost-effective network analysis solutions for medical wireless device applications.
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Optomechanical Devices
Optomechanical devices include an optical chopper, scanning galvo mirrors, adaptive optics, a motorized pinhole wheel, a piezo objective scanner, a motorized flip mount, motorized filter wheels, and optical beam shutters.
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GSM RF Interference Test System
Guangzhou Jumho Electric Co., Ltd.
Cell phones and other wireless devices radiate powerful electromagnetic fields that can cause interference and noise in microphone signals. The interference and noise is called RF interference, which is an unwanted “signal” that occurs at the same time and frequency as a data signal. The RF interference disrupts the flow of data and degrades quality-of-service. Jumho Electric provides a cost-effective RF interference test system for GSM interference level measurement of wireless microphone.
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DC High-Voltage Test Device
PGK 25
BAUR Prüf- und Messtechnik GmbH
Cable testing with the BAUR PGK 25. Cables must be tested in compliance with the national and international standards. This applies before the commissioning of new cable networks. The portable BAUR PGK 25 cable test device is used for DC voltage testing in low- and medium-voltage cables. It is characterised by its low weight of only 16.5 kg, by the easy operation and solid construction for onsite use.* Compact device for DC voltage testing with negative polarity* Continuously adjustable output voltage* Perfect for mobile use
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Battery Charge And Discharge Test System
9841
*Easy user interface*Measure Voltage, Current, Power, KWH, AH, Temperature, Reference Voltage*Accuracy Measure Time*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery. *The test result will be stored to ACCESS data
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Battery Cycle Test Systems
Chroma Systems Solutions, Inc.
High precision, integrated battery charge / discharge cycle test systems designed for lithium ion and other chemistries and applications including EV batteries and energy storage systems. Chroma’s battery test equipment provides advanced features including regenerative discharge systems that recycles energy from the battery back into the channels in the system or to the grid. Systems are configurable and flexible with multiple channel capabilities that can be upgraded as testing requirements change.
