Advanced Probe Card / V type
VC Series - Japan Electronic Materials Corp. (JEM)
*Vertical contact Probe Card
*No limitation by Pad layout
*Large probe area (Suitable for 200mm wafer 1-shot)
*Small scrub mark
*Suitable for High/Low Temperature Test
VC Series - Japan Electronic Materials Corp. (JEM)
*Vertical contact Probe Card
*No limitation by Pad layout
*Large probe area (Suitable for 200mm wafer 1-shot)
*Small scrub mark
*Suitable for High/Low Temperature Test
