JEDEC
semiconductor test methods and standards setting organization, Joint Electron Device Engineering Council.
See Also: UFS
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Product
ESD Testers
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Hanwa Electronic Ind. Co.,Ltd.
◆Adaptable to the following international standard waveform;JEDEC, ESDA, AEC, and JEITA◆This system’s uniquely short discharge circuit is made possible by its original mechanical design.◆The short circuit minimizes the influence of inductance and capacitance on the data.◆The use of a single circuit ensures data stability for each device pin tested.
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Product
Warpage Metrology System
TableTop Shadow Moiré (TTSM)
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Measure warpage of substrates up to 300mm x 310 mm (a 300mm wafer or two JEDEC trays) with the entire measurement taking less than two seconds. Whether individual parts or a JEDEC tray of multiple parts, the TTSM provides an ultra-fast and highly accurate measurement at room temperature that is suited for tabletop use.
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Product
DDR4 Parametric Test Reference Solution
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Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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Product
High Performance Chipscale Test Sockets
SC
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Ardent Concepts Test Sockets for ATE test deploy patented SC Contact Sets. This technology is capable of over 2 Million mechanical insertions in production environments and uses easy to replace pins with no complicated assembly procedure. It is designed to be drop-in compatible with 1mm offset and straight through footprints to ease implementation, and RC SC’s simple and robust design is extremely cost effective when compared with existing “roll” type test contactors and sockets. Designed specifically for JEDEC QFN and MLF applications, SC High Performance Test Sockets are available for most handler set-ups and offer exceptional AC performance.
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Product
Analyzer Probes
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The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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Product
Post Wire and Die Bond Inspection Machine
IV-T3300
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IV-T3300 is a post wire and die bond inspection machine with Dual JEDEC Tray Feeder System. It features a large inspection area of 600x500mm and a quick trays change of 5-7 seconds.
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Product
Flash SATA Disk/mSATA Mini SATA 3 SLC, MLC
FSA 301 Series
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*SATA III (6.0Gb/s) interface*Capacity: SLC 1 GB to 32 GB, MLC 4 GB to 64 GB*iSMART disk health monitoring*Intelligent error recovery system*Write protection security*Anti-vibration mechanical design*Excellent data transfer speed*Zero mechanical interference*JEDEC standard MO300B dimension
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Product
Detective Logic Analyzer
LPDDR5
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Provides logic analyzer like deep transaction Listing and Waveform capture. Can store up to 512M of captured States at up to 6400+ MT/sContinuous, real time analysis, not post-processing 2D (voltage & time) Eye Detector guarantees valid data acquisition on each signalExtensive Triggering and Storage Qualification allows precise insightIndustry Leading Protocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specifications, NOT post processing. No other tool can provide this!Mode Register Listing provided
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Product
Sideband Bus Protocol Analyzer
FS2700 DDR5
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The FS27xx DDR5 Sideband Bus Protocol Analyzer is the latest DDR5 tool from FuturePlus Systems. FuturePlus has taken the complexity of 8 different JEDEC specifications and ported them into this very useful tool. DDR5 Validation Engineers and system integrators will not have to comb through complex specifications defining thousands of bits and register addresses. The tool takes care of this. Please request our data sheet for more information.
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Product
Detective Logic Analyzer
LPDDR3
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Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured States at 1600MT/sContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsMode Register Listing providedSupports Auto-Clock rate detect and clock stoppageConnects to the target under test with Flying Lead, BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools
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Product
ESD, Latch-up testing / design service
ESDdoctor
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ESDdoctor consulting service can identify, diagnose, and solve any ESD/EOS problem quickly and definitively, at a surprisingly low entry cost. You can choose testing and diagnosis only, or add ESD design services to the consulting package. ESD, Latch-up testing: HBM (ANSI/ESDA and JEDEC) on packaged dies. MM (ANSI/ESDA and JEDEC) on packaged dies. Latch-up JEDEC on packaged dies TLP on packaged and bare dies.VF-TLP on bare dies.
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Product
NAND Controller IP
ONFI
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Arasan is the leading supplier of mobile storage IP and its products are used by most first tier memory suppliers. Arasan's deep experience with NAND flash memory interfaces and mobile storage standards began in 2001 when it joined the SD Association and shipped industry first SD card IP in 2003. Arasan is a current member of ONFI and JEDEC.
