HV Test
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Antenna Test Chamber
Comtest provides Antenna test ranges fully covered with microwave absorbers for both near-field and far-field measurements. Because we always strive for new solutions, our R&D department developed our ‘Javelin Tip’ polystyrene absorbers. The enhanced material composition and altered shape, lead to improved performance and cleaner working space, enabling you to make high precision antenna testing fast, reliable, and worry-free.
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Selenium Testing
If you want a tool that can automate all your testing requirements, is robust, fit for any language, useful for projects of any size, and is free of cost, choose Selenium.
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Dust Test Chamber
CX-S56B
Shenzhen Chuangxin Instruments Co., Ltd.
Sand and Dust Test Chamber Sand and dust test chamber is designed and manufactured in accordance with the standard requirement of IEC60529.
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Instrument Transformer Testing
HAOMAI Electric Test Equipment Co., Ltd.
Testing for current and voltage/potential transformers to ensure reliable and accurate operation and avoid outages.
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Test Blocks & Plugs
PK-2
Type PK-2 test blocks are essentially 4-pole and 6-pole jacks, provided with molded Textolite covers that have internal plug contacts, which make a through connection when the cover is in place. The contacts in the blocks are of the line-pressure type and provide positive contact with minimum contact resistance.
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Meter Test Benches
TST 3/5 UNIVERSAL
*A Three-Phase Voltage Generator EE-500 V for voltages up to 500Vac;*Five identical Modules EE-120A, each comprising three-phase current generators from 1 mA to 120A each) and Energy Standard Class 0.04;*Meter Suspension Rack with 5 positions for hanging the meter, Scanning Heads, Electronic Readers, Tariffs, Panic Button, Lamp;*PC with EE Software for control, memorizing, search and print of Reports.
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Cable Assembly, 9-Pin D-Type Female to Unterminated With Cut Ends, 2m, HV
A009DF4-C-HA200
A range of 9-Pin D-Type High Voltage cable assemblies with unterminated connections on one end, constructed from PTFE Type C insulated wire. The unterminated connections are coded to match the connector pin designation.
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ICT: In-Circuit Testing
XILS In-Line Handling Solutions
Designed to cover a large number of test points, with long panels for future expansion, the XILS series of Handlers, PCB test systems in the line of EIIT - Innovative Engineering Solutions, is ready for the most demanding applications.
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Vibration Test Systems
G-0 Series
The G-0 Series Vibration Test Systems consist of all-round, rugged, high quality vibration generators energy-efficient solid-state PWM power amplifiers, ideally suited to any vibration tests requiring high reliability such as MIL, IEC and JIS standardized tests for aircraft, automobiles, electronic components, electric apparatus and aerospace equipment.
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Interconnect Test Leads
142-1
This 64 inch pair of test leads connects with many different testing accessories and probes. Especially those found in typical test lead kits and assortments. The ends terminate in universal size 4mm banana plugs.
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Measuring And Testing Devices
Delphin develops, produces and sells measuring, testing and automation devices for applications in the fields of measurement, test stand and monitoring. Various series of devices, for different tasks enable our customers to find the right solution for your task quickly and efficiently.
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Cloud Security Testing
RedWolf is the premium cloud-DDoS testing provider globally. We offer an easy-to-use testing system that is either self-serve or guided by RedWolf experts with years of experience helping secure the worlds largest and most complex enterprise networks.
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Fiber Optic Test
Growing fiber-to-the-home (FTTH) and fiber-to-the-premise (FTTP) implementation has raised demand for specialized test equipment such as Wilcom power meters, light sources, OTDRs, loss test sets, and unique products such as identifiers for optical fiber installation and maintenance. Network service providers, carriers and optical fiber cable and systems installers know that Wilcom provides the diversity of products they need to keep up with an ever-changing industry.
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LED Probes for testing
Advanced Probing Systems, Inc.
Probe Needles are used for the fabrication of most probe cards, however there exist applications for which these materials may not be appropriate, e.g., hubrid device and gold pad probing.
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Function Test Systems
These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Uniaxial Testing Machines
CBR testing machine for performing CBR tests in the laboratory. Two-column version with electric drive and adjustable feed speed. and additional overdrive.
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Test Compliance
CTS Series 3.2
AMETEK Programmable Power, Inc.
The CTS Series is a complete, turn-key compliance test system for EN IEC 1000-3-2 (Harmonics) Including A14, EN IEC 1000-3-3 (Flicker) and various EN IEC 1000-4 AC immunity tests. Consisting of an AC power source, a power analysis conditioning system (PACS) and a PC based data acquisition system, the CTS provides a complete turn-key solution for IEC testing. The Windows™ based CTS software performs the IEC tests and generates detailed test reports. Comprehensive data files are stored on disk to allow post test analysis.
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Non-functional Testing Services
Good software has both- efficient functionality and excellent performance. While functional testing pays attention to improve the functioning of the software, our non-functional testing solutions aids in enhancing software performance under various conditions. QACraft has helped several enterprises all over the globe to boost performance by evaluating the software when it comes to software and eradicating the lacking factors from it. Carrying out non-functional testing for the software helps in checking the software’s accessibility, scalability, and responsiveness.
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Power Electronics Test
Aiming at the problem of PI, Shengbo Technology carefully studied the root cause of the problem. Through the loop analysis and noise analysis of power supply and automatic control, it provided targeted solutions for frequency response analyzer and power supply rejection ratio (PSRR) analysis . In addition, we also have a professional technical application support team in the field of power electronics testing. We can customize and develop the corresponding system software for customers so that it can be applied to PC / Servo / Telecom power supplies, adapters and chargers, and backlights. Inverter, LED drivers, ballasts for energy-saving lamps (Ballast), and even UPS, PV Inverter, electric vehicle chargers, AC and DC motors, etc.
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Cable Assembly, 9-Pin D-Type Female to Unterminated With Tinned Ends, 2m, HV
A009DF4-T-HA200
A range of 9-Pin D-Type High Voltage cable assemblies with unterminated connections on one end, constructed from PTFE Type C insulated wire. The unterminated connections are coded to match the connector pin designation.
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Battery Test Software
Landt Battery Test Systems use different programs for data acquiring and data process. The acquiring software comes with a very user-friendly interface, which allows new users to operate with minimal training. Data process software shows different kinds of plots (Voltage vs. Capacity, Capacity vs. Cycle Number, Efficiency, etc.), which can be easily exported.
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Multi-Analyte Testing Solutions
Aflatoxins, Fumonisins, Vomitoxin (DON), Ochratoxin A, Zearalenone, Nivalenol, T-2 and HT-2 are the primary targets for mycotoxin analysis for food and agricultural analytical testing laboratories. Global awareness, prevention based initiatives and strict regulatory limits require a deeper understanding of both the occurrence and contamination levels present in our raw materials, processes and finished product value streams. Simultaneous sample prep enables more efficient use of laboratory resources while reducing time to result for up to 13 mycotoxins in a single LC or LC/MS/MS analysis.
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Test Equipment
Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Test Equipment, including handheld electrostatic fieldmeter, periodic verification system, charged plate monitor, contact voltmeter, and others.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Telecom Test Systems
4301 Series
The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Test Solutions Services
Spinnaker Contract Manufacturing, Inc.
As standard practice, all of our SMT assemblies are washed and tested through our Automated Optical Inspection and pass through our stringent internal QA/QC policies. In Cables and Wire Harnesses, pretests, such as pull tests and crimp type tests, are performed on all builds before being tested for continuity, hi-pot, shorts and mis-wires, to name a few. Our electromechanical assemblies are capable of receiving full functional testing through custom test fixtures and RF test. Some RF tests include Gain/Loss, Frequency Response, VSWR (Voltage Standing Wave Ratio), Inter-Modulation Distortion and Output Power.
